Patent Inventor: Vilmos Kertesz

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Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor
Inventor: Van Berkel, et al. | Patent Number: 8117929

Pulsed voltage electrospray ion source and method for preventing analyte electrolysis
Inventor: Kertesz, et al. | Patent Number: 8084735

Electrospray ion source with reduced analyte electrochemistry
Inventor: Kertesz, et al. | Patent Number: 8003937

Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis
Inventor: Van Berkel, et al. | Patent Number: 7995216

Automated position control of a surface array relative to a liquid microjunction surface sampler
Inventor: Van Berkel, et al. | Patent Number: 7295026

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