Patent Inventor: Leping Li

«1Next »

N-aryl pyrazole compounds, compositions, and methods for their use
Inventor: Ogawa, et al. | Patent Number: 8022061

Substituted benzofused heterocycles
Inventor: Chen, et al. | Patent Number: 7572783

Fused heterocyclic compounds
Inventor: Chen, et al. | Patent Number: 7253179

Antibacterial agents
Inventor: Li, et al. | Patent Number: 7148259

Fused heterocyclic compounds
Inventor: Chen, et al. | Patent Number: 7125885

Antibacterial agents
Inventor: Li, et al. | Patent Number: 7053234

Piperidine derivatives
Inventor: Chen, et al. | Patent Number: 7045527

Enhanced endpoint detection for wet etch process control
Inventor: Li, et al. | Patent Number: 6989683

LXR modulators
Inventor: Li, et al. | Patent Number: 6906069

Apparatus for detecting CMP endpoint in acidic slurries
Inventor: Li, et al. | Patent Number: 6899784

Method for detecting CMP endpoint in acidic slurries
Inventor: Li, et al. | Patent Number: 6878629

Fused heterocyclic compounds
Inventor: Chen, et al. | Patent Number: 6858619

Enhanced endpoint detection for wet etch process control
Inventor: Li, et al. | Patent Number: 6843880

Endpoint detection in chemical-mechanical polishing of patterned wafers having a low pattern density
Inventor: Wang, et al. | Patent Number: 6835117

Fused heterocyclic compounds
Inventor: Chen, et al. | Patent Number: 6809104

Antibacterial agents
Inventor: Li, et al. | Patent Number: 6780858

Technique for noise reduction in a torque-based chemical-mechanical polishing endpoint detection system
Inventor: Wang, et al. | Patent Number: 6741913

Pyrazole antimicrobial agents
Inventor: Li, et al. | Patent Number: 6673923

Modulators of SREBP processing
Inventor: Jaen, et al. | Patent Number: 6649593

Chemiluminescence detection apparatus
Inventor: Li, et al. | Patent Number: 6506341

Indirect endpoint detection by chemical reaction and chemiluminescence
Inventor: Li, et al. | Patent Number: 6440263

Endpoint detection by chemical reaction
Inventor: Li, et al. | Patent Number: 6419785

LXR modulators
Inventor: Li, et al. | Patent Number: 6316503

Endpoint detection in chemical-mechanical polishing of cloisonne structures
Inventor: Li, et al. | Patent Number: 6291351

Chemical mechanical polishing endpoint process control
Inventor: Li, et al. | Patent Number: 6276987

Optimization of CMP process by detecting of oxide/nitride interface using IR system
Inventor: Li, et al. | Patent Number: 6261851

Optimization of chemical mechanical process by detection of oxide/nitride interface using CLD system
Inventor: Li, et al. | Patent Number: 6254453

Real-time control of chemical-mechanical polishing processing by monitoring ionization current
Inventor: Li, et al. | Patent Number: 6251784

Endpoint detection by chemical reaction and photoionization
Inventor: Li, et al. | Patent Number: 6228769

Endpoint detection by chemical reaction and reagent
Inventor: Li, et al. | Patent Number: 6228280

Real-time control of chemical-mechanical polishing processes using a shaft distortion measurement
Inventor: Li, et al. | Patent Number: 6213846

Endpoint detection by chemical reaction and light scattering
Inventor: Li, et al. | Patent Number: 6194230

Endpoint detection by chemical reaction
Inventor: Li, et al. | Patent Number: 6180422

Accumulator for slurry sampling
Inventor: Li, et al. | Patent Number: 6176765

Indirect endpoint detection by chemical reaction and chemiluminescence
Inventor: Li, et al. | Patent Number: 6126848

6-O-substituted erythromycin compounds and method for making same
Inventor: Or, et al. | Patent Number: 6075011

In-situ monitoring and control of conductive films by detecting changes in induced eddy currents
Inventor: Li, et al. | Patent Number: 6072313

Indirect endpoint detection by chemical reaction
Inventor: Li, et al. | Patent Number: 6066564

6,11-bridged erythromycin derivatives
Inventor: Or, et al. | Patent Number: 6046171

Probe for slurry gas sampling
Inventor: Li, et al. | Patent Number: 6021679

Real time measurement of etch rate during a chemical etching process
Inventor: Barbee, et al. | Patent Number: 5788801

Rotary signal coupling for chemical mechanical polishing endpoint detection with a strasbaugh tool
Inventor: Li, et al. | Patent Number: 5770948

In-situ monitoring of the change in thickness of films
Inventor: Li, et al. | Patent Number: 5731697

Amino-lipopetide antifungal agents
Inventor: Lartey, et al. | Patent Number: 5696084

Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool
Inventor: Li, et al. | Patent Number: 5663637

In-situ monitoring of conductive films on semiconductor wafers
Inventor: Li, et al. | Patent Number: 5660672

Chemical mechanical polishing endpoint process control
Inventor: Li, et al. | Patent Number: 5659492

Endpoint detection for chemical mechanical polishing using frequency or amplitude mode
Inventor: Li, et al. | Patent Number: 5644221

Process for making 9-deoxotaxane compounds
Inventor: Klein, et al. | Patent Number: 5616740

Real time measurement of etch rate during a chemical etching process
Inventor: Barbee, et al. | Patent Number: 5582746

Chemical etch monitor for measuring film etching uniformity during a chemical etching process
Inventor: Barbee, et al. | Patent Number: 5573624

Apparatus for contactless real-time in-situ monitoring of a chemical etching process
Inventor: Barbee, et al. | Patent Number: 5573623

Antitumor compounds
Inventor: Lee, et al. | Patent Number: 5571822

In-situ monitoring of the change in thickness of films
Inventor: Li, et al. | Patent Number: 5559428

Contactless real-time in-situ monitoring of a chemical etching
Inventor: Balconi-Lamica, et al. | Patent Number: 5516399

Minimizing overetch during a chemical etching process
Inventor: Barbee, et al. | Patent Number: 5501766

Real time measurement of etch rate during a chemical etching process
Inventor: Barbee, et al. | Patent Number: 5500073

Measuring film etching uniformity during a chemical etching process
Inventor: Barbee, et al. | Patent Number: 5489361

Method for contactless real-time in-situ monitoring of a chemical etching process
Inventor: Barbee, et al. | Patent Number: 5480511

Method and apparatus for contactless real-time in-situ monitoring of a chemical etching process
Inventor: Barbee, et al. | Patent Number: 5456788

Fixture for in-situ noncontact monitoring of wet chemical etching with passive wafer restraint
Inventor: Barbee, et al. | Patent Number: 5451289

Method and apparatus for contactless real-time in-situ monitoring of a chemical etching process
Inventor: Barbee, et al. | Patent Number: 5445705

9-deoxotaxane compounds
Inventor: Klein, et al. | Patent Number: 5440056

Method and apparatus for real-time, in-situ endpoint detection and closed loop etch process control
Inventor: Barbee, et al. | Patent Number: 5392124

In situ, non-destructive CVD surface monitor
Inventor: Barbee, et al. | Patent Number: 5386121

Method and apparatus for real-time film surface detection for large area wafers
Inventor: Barbee, et al. | Patent Number: 5381234

Contactless real-time in-situ monitoring of a chemical etching process
Inventor: Barbee, et al. | Patent Number: 5338390

Interferometer for in situ measurement of thin film thickness changes
Inventor: Barbee, et al. | Patent Number: 5220405

«1Next »