Patent International Class: G01N 21/86
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Apparatus and method for on-line detecting welding part of strip
Inventor: Lim, et al. | Patent Number: 8149409
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Method and apparatus for inspecting defects of patterns formed on a hard disk medium
Inventor: Hirose, et al. | Patent Number: 8148705
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Printing plate registration using a camera
Inventor: Cummings, et al. | Patent Number: 8148704
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Method and apparatus for on-line web property measurement
Inventor: Sturm, et al. | Patent Number: 8148690
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Surface sensing device with optical sensor
Inventor: McFarland, et al. | Patent Number: 8144340
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System and method for performing optical navigation using scattered light
Inventor: Grot | Patent Number: 8138488
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Intraoral imaging system and method based on conoscopic holography
Inventor: Sirat | Patent Number: 8129703
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Multi-color biosensor for detecting luminescence sites on a substrate having a refractive optical element for adjusting and focusing at least two incident irradiation beams of different wavelengths
Inventor: Van Dijk, et al. | Patent Number: 8120002
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Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
Inventor: Den Boef, et al. | Patent Number: 8120001
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Measuring apparatus having a movable measuring device in a press
Inventor: Engler, et al. | Patent Number: 8120000
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Apparatus for characterizing fibrous materials using stokes parameters
Inventor: Jez, et al. | Patent Number: 8114253
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Defect review apparatus and method of reviewing defects
Inventor: Hirai, et al. | Patent Number: 8108172
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Apparatus and method for transferring two or more wafers whereby the positions of the wafers can be measured
Inventor: De Ridder, et al. | Patent Number: 8099190
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Method for establishing a wafer testing recipe
Inventor: Regensburger | Patent Number: 8089058
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Trolley wire wear measuring device using binary operated images
Inventor: Watabe, et al. | Patent Number: 8071967
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Interaction interface for controlling an application
Inventor: Hildreth | Patent Number: 8068641
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Method and apparatus for determining sheet position using information from two distinct light beams each at a different position and a different angle
Inventor: Chen, et al. | Patent Number: 8058634
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Machine for inspecting glass containers at an inspection station using an addition of a plurality of illuminations of reflected light
Inventor: Diehr, et al. | Patent Number: 8058607
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Image sensor module, camera module including the same and electronic device including the camera module
Inventor: Kong | Patent Number: 8053714
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Method and test structure for estimating focus settings in a lithography process based on CD measurements
Inventor: Werner, et al. | Patent Number: 8040497
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Apparatus and methods for measuring at least one physical characteristic of a threaded object
Inventor: Johnson, et al. | Patent Number: 8039827
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Inspecting an imprinted substrate on a printing press
Inventor: Pearson, et al. | Patent Number: 8039826
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Installation for exposing a cinematographic film from digital images
Inventor: Lavergne, et al. | Patent Number: 8039825
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Methods for measuring at least one physical characteristic of a component
Inventor: Johnson, et al. | Patent Number: 8035094
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Movable media tray with position reference marks
Inventor: Brumbaugh, et al. | Patent Number: 8035093
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Substrate transfer apparatus, substrate transfer method, and storage medium
Inventor: Abe, et al. | Patent Number: 8029224
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Method of removing or deposting material on a surface including material selected to decorate a particle on the surface for imaging
Inventor: Williamson, et al. | Patent Number: 8026501
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Paper carrying device, document scanning apparatus, and printing apparatus that detects error of sensor output signal
Inventor: Morimoto | Patent Number: 8026500
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Laser irradiation method in which a distance between an irradiation object and an optical system is controlled by an autofocusing mechanism and method for manufacturing semiconductor device using the same
Inventor: Tanaka, et al. | Patent Number: 8022380
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Pattern shape evaluation method and pattern shape evaluation apparatus utilizing the same
Inventor: Abe, et al. | Patent Number: 8019149
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Apparatus, system, and method for print quality measurements using multiple adjustable sensors
Inventor: Shakespeare, et al. | Patent Number: 8017927
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Method and system to segment depth images and to detect shapes in three-dimensionally acquired data
Inventor: Rafii, et al. | Patent Number: 8009871
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Method for compensating a millimeter wave imaging array
Inventor: Lynch | Patent Number: 8003928
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MEMS devices and related scanned beam devices
Inventor: Davis, et al. | Patent Number: 7999244
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Apparatus and method for determining a dimensional characteristic of an installed weld fastener
Inventor: Rosinski | Patent Number: 7999243
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High resolution linear image sensing using multi-row low resolution image sensor
Inventor: Hosier, et al. | Patent Number: 7990528
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Determining position of a media page using a slot in the imaging drum
Inventor: Hawes, et al. | Patent Number: 7989788
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Detecting system and method for cutting tools
Inventor: Chiu | Patent Number: 7986416
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Optical displacement detection mechanism and surface information measurement device using the same
Inventor: Iyoki, et al. | Patent Number: 7973942
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Substrate positioning device and substrate positioning method
Inventor: Takahashi, et al. | Patent Number: 7973300
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Device for inspecting a surface
Inventor: Stober | Patent Number: 7969565
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System and method for measurement of degree of moisture stratification in a paper or board
Inventor: Haran | Patent Number: 7968860
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Wafer edge defect inspection using captured image analysis
Inventor: Young, et al. | Patent Number: 7968859
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Method and apparatus for measuring color of a moving web
Inventor: Shakespeare, et al. | Patent Number: 7961319
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Scanning method and system for a multiple light beam system
Inventor: Carnicelli, et al. | Patent Number: 7960681
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Scanned beam overlay projection
Inventor: Sprague | Patent Number: 7954953
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Authenticity determination method, apparatus, and program
Inventor: Shimizu, et al. | Patent Number: 7936914
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Methods and systems for in situ calibration of imaging in biological analysis
Inventor: Kinney, et al. | Patent Number: 7928354
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Surface shape metric and method to quantify the surface shape of electronic packages
Inventor: Vacar, et al. | Patent Number: 7920986
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Detecting printing plate edge alignment
Inventor: Dror | Patent Number: 7893416
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Analysis of optical data with the aid of histograms
Inventor: Petrich, et al. | Patent Number: 7889329
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Pattern transfer apparatus, imprint apparatus, and pattern transfer method
Inventor: Suehira, et al. | Patent Number: 7884935
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System and method for z-structure measurements using simultaneous multi-band tomography
Inventor: Shakespeare | Patent Number: 7880156
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Substrate alignment apparatus comprising a controller to measure alignment during transport
Inventor: Krupyshev, et al. | Patent Number: 7880155
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Recording medium type identification device with optical sensors
Inventor: Maruyama | Patent Number: 7875870
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Defect review apparatus and method of reviewing defects
Inventor: Hirai, et al. | Patent Number: 7869969
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Input device
Inventor: Ueshima | Patent Number: 7866834
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Alignment structures for an optical assembly
Inventor: Lee | Patent Number: 7855377
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Lighting system and method for illuminating and detecting object
Inventor: Cantin, et al. | Patent Number: 7855376
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Surface sensing device with optical sensor
Inventor: McFarland, et al. | Patent Number: 7847955
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Evaluation system and method of a search operation that detects a detection subject on an object
Inventor: Okita | Patent Number: 7838858
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Method for the identification of color measuring strips
Inventor: Huber, et al. | Patent Number: 7830549
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Edge inspection
Inventor: Watkins, et al. | Patent Number: 7822260
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System to test electronic part and method of controlling the same
Inventor: Kim, et al. | Patent Number: 7820994
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Machine for inspecting glass containers at an inspection station using an addition of a plurality of illuminations of reflected light
Inventor: Diehr, et al. | Patent Number: 7816639
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Device for optically measuring the shapes of objects and surfaces
Inventor: Wagner | Patent Number: 7808644
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Optical sensor for a printer
Inventor: Burke, et al. | Patent Number: 7800089
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Suspension system and scanning method
Inventor: James, et al. | Patent Number: 7800061
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Lithographic apparatus and device manufacturing method
Inventor: Lof, et al. | Patent Number: 7795603
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Electron induced chemical etching/deposition for enhanced detection of surface defects
Inventor: Williamson, et al. | Patent Number: 7791055
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Substantially transparent object detection system and method
Inventor: Taylor | Patent Number: 7777211
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Laser irradiation method in which a distance between an irradiation object and an optical system is controlled by an autofocusing mechanism and method for manufacturing semiconductor device using the same
Inventor: Tanaka, et al. | Patent Number: 7777210
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Product inspection system and a method for implementing same
Inventor: Johnson, et al. | Patent Number: 7777209
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Process and device for monitoring the security of a passageway using an optical grid to monitor movement of objects on a carrier
Inventor: Pirkl | Patent Number: 7767954
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Apparatus and method for measuring suspension and head assemblies in a stack
Inventor: Girard, et al. | Patent Number: 7764387
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Gloss and differential gloss measuring system
Inventor: Banton, et al. | Patent Number: 7763876
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System and method for sensing position utilizing an uncalibrated surface
Inventor: Romanov, et al. | Patent Number: 7763875
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Sensor device for generating ambient light information
Inventor: Kikuchi, et al. | Patent Number: 7759626
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Image data generating device and light receiving device
Inventor: Tachino, et al. | Patent Number: 7759624
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Three-dimensional video scanner
Inventor: Kimmel | Patent Number: 7756323
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System and method for three-dimensional location of inclusions in a gemstone
Inventor: Porat | Patent Number: 7755072
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Backside defect detector and method that determines whether unwanted materials are present on the backside of a semiconductor wafer
Inventor: Yegnashankaran | Patent Number: 7754502
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Device and method for identifying recording medium and image forming apparatus
Inventor: Murata | Patent Number: 7750330
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Pixel positioning systems and methods
Inventor: Howe | Patent Number: 7747065
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Area image acquiring method for image reading apparatus
Inventor: Chen | Patent Number: 7746518
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Product inspection system and a method for implementing same that incorporates a correction factor
Inventor: Johnson, et al. | Patent Number: 7745805
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Apparatus for analysing surface properties with indirect illumination
Inventor: Schwarz, et al. | Patent Number: 7741629
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Substrate positioning device and substrate positioning method for a substrate having a transparent layer and a nontransparent layer
Inventor: Takahashi, et al. | Patent Number: 7737426
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Detection device and method for detecting objects subject to cyclic or repetitive motion
Inventor: Stimpson, et al. | Patent Number: 7732797
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Inspection system for inspecting an imprinted substrate on a printing press
Inventor: Pearson, et al. | Patent Number: 7732796
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Automated wafer defect inspection system and a process of performing such inspection
Inventor: O'Dell, et al. | Patent Number: 7729528
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Integrated proximity sensor and light sensor
Inventor: Fadell, et al. | Patent Number: 7728316
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System and method including a prealigner
Inventor: Campidell, et al. | Patent Number: 7723710
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Substrate holding apparatus, and inspection or processing apparatus
Inventor: Zama, et al. | Patent Number: 7723709
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Input device
Inventor: Ueshima | Patent Number: 7719741
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Light sensing element having two functions
Inventor: Wei, et al. | Patent Number: 7719732
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Compact multiple diameters wafer handling system with on-chuck wafer calibration and integrated cassette-chuck transfer
Inventor: Aho, et al. | Patent Number: 7717661
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Pupil improvement of incoherent imaging systems for enhanced CD linearity
Inventor: Sandstrom, et al. | Patent Number: 7705963
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Sensor and recording apparatus using the same
Inventor: Miyahara, et al. | Patent Number: 7705293
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Optical lens system of mobile camera including optical lens and pair of image sensors
Inventor: Lee, et al. | Patent Number: 7700933