Patent International Class: G01J 3/447
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Optical device and optical system
Inventor: Murooka, et al. | Patent Number: 8080777
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Measuring Forster resonance energy transfer with polarized and depolarized light
Inventor: Piston, et al. | Patent Number: 8031338
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Arrangement for an optical system for polarization-dependent, time-resolved optical spectroscopy, optical measurement systems and method for the polarization-dependent spectroscopic analysis of measurement light
Inventor: Ernsting | Patent Number: 7920259
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Spectroscopic determination of enantiomeric purity
Inventor: Busch, et al. | Patent Number: 7911608
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Two-photon-absorption dispersion spectrometer
Inventor: Vance | Patent Number: 7884944
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Automatic polarizer for CCTV applications
Inventor: Van Schaik, et al. | Patent Number: 7872666
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Laser diode array downhole spectrometer
Inventor: DiFoggio, et al. | Patent Number: 7782460
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Method for manufacturing optical element, method for manufacturing projector, optical element and projector
Inventor: Yanai, et al. | Patent Number: 7551280
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Method and apparatus for the separation of fluoroscence and elastic scattering produced by broadband illumination using polarization discrimination techniques
Inventor: Ahmed, et al. | Patent Number: 7532325
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Vibrational circular dichroism spectrometer using reflective optics
Inventor: Jiang, et al. | Patent Number: 7456956
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Apparatus for ascertaining the light power level of a light beam, and scanning microscope
Inventor: Boehm, et al. | Patent Number: 7428043
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Spectroscope and microspectroscope equipped therewith
Inventor: Osawa, et al. | Patent Number: 7256890
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Optical spectrometer
Inventor: Puppels | Patent Number: 6970242
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Method and apparatus for polarization measurements
Inventor: Moeller, et al. | Patent Number: 6941081
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Parametric profiling using optical spectroscopic systems
Inventor: Shchegrov, et al. | Patent Number: 6900892
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Spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system
Inventor: Johs, et al. | Patent Number: 6822738
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Polarization analysis unit, calibration method and optimization therefor
Inventor: Patel, et al. | Patent Number: 6816261
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Optical spectral power monitors employing polarization deversity scheme
Inventor: Garrett, et al. | Patent Number: 6804428
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Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry
Inventor: Johs, et al. | Patent Number: 6804004
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System for analyzing surface characteristics with self-calibrating capability
Inventor: Wang, et al. | Patent Number: 6804003
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Spectroscopic ellipsometer without rotating components
Inventor: Norton, et al. | Patent Number: 6753961
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System for analyzing surface characteristics with self-calibrating capability
Inventor: Wang, et al. | Patent Number: 6734968
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Method and device for the spectral analysis of light
Inventor: Vecer, et al. | Patent Number: 6721050
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Simultaneous imaging and spectroscopy apparatus
Inventor: Treado, et al. | Patent Number: 6717668
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Ratiometric background correction for fluorescence polarization assays
Inventor: Hoyt | Patent Number: 6674527
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Alignment of a rotatable polarizer with a sample
Inventor: Yarussi, et al. | Patent Number: 6665070
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Method and device for the spectral analysis of light
Inventor: Herman, et al. | Patent Number: 6646743
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Optical spectrum analyzer
Inventor: He, et al. | Patent Number: 6636306
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Optical spectrum analyzer
Inventor: He, et al. | Patent Number: 6636306
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Cascaded filter employing an AOTF and narrowband birefringent filters
Inventor: Li | Patent Number: 6624889
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Technique for combined spectral, power, and polarization monitoring
Inventor: Dries, et al. | Patent Number: 6618129
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System for measuring polarimetric spectrum and other properties of a sample
Inventor: Lee, et al. | Patent Number: 6611330
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Spectroscopic measurement system using an off-axis spherical mirror and refractive elements
Inventor: Norton | Patent Number: 6583877
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Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipsometry and polarimetry systems
Inventor: Johs, et al. | Patent Number: 6549282
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Multi-wavelength polarization monitor for use in fibre optic networks
Inventor: Barwicz, et al. | Patent Number: 6510257
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Method and apparatus for servo-based spectral array alignment in optical systems
Inventor: Polynkin, et al. | Patent Number: 6507685
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Spectral power monitors with active alignment compensation
Inventor: Polynkin, et al. | Patent Number: 6504976
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Polarimetric spectral intensity modulation spectropolarimeter
Inventor: Kebabian | Patent Number: 6490043
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Beam splitting analyzer means in rotating compensator ellipsometer
Inventor: Johs, et al. | Patent Number: 6483586
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Dual circular polarization modulation spectrometer
Inventor: Nafie | Patent Number: 6480277
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Rotating compensator ellipsometer system with spatial filter
Inventor: Liphardt, et al. | Patent Number: 6456376
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Birefringent interferometer
Inventor: Miller | Patent Number: 6421131
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Parallel detecting, spectroscopic ellipsometers/polarimeters
Inventor: Furtak | Patent Number: 6384916
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Method and device for the spectral analysis of light
Inventor: Herman, et al. | Patent Number: 6373569
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Regression calibrated spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system
Inventor: Johs, et al. | Patent Number: 6353477
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Spectroscopic measurement system using curved mirror
Inventor: Norton | Patent Number: 6323946
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Combined polychromatic electromagnetic beam source system with application to ellipsometers, spectrophotometers and polarimeters
Inventor: Johs | Patent Number: 6268917
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Method and apparatus for measuring polarization mode dispersion of optical devices
Inventor: Cyr | Patent Number: 6204924
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System for measuring polarimetric spectrum and other properties of a sample
Inventor: Lee, et al. | Patent Number: 6184984
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Low insertion loss optical monochromator
Inventor: Braun, et al. | Patent Number: 6177992
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Low insertion loss optical monochromator
Inventor: Braun, et al. | Patent Number: 6177992
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Fractional phase measurement by polarization-dependent spectroscopy
Inventor: Bertness | Patent Number: 6121051
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Fractional phase measurement by polarization-dependent spectroscopy
Inventor: Bertness | Patent Number: 6121051
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Optical spectrum analyzer having tunable interference filter
Inventor: Braun, et al. | Patent Number: 6075647
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Spectro-polarimetric imager
Inventor: Gottlieb, et al. | Patent Number: 6064510
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Polarization characteristic measuring method and apparatus
Inventor: Toyonaga, et al. | Patent Number: 6025917
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Digital signal processing (DSP) techniques for FT-IR multiple modulation measurements using a photoelastic modulator
Inventor: Curbelo | Patent Number: 6025913
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Beam folding optics system and method of use with application in ellipsometry and polarimetry
Inventor: Johs, et al. | Patent Number: 5969818
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Total internal reflection electromagnetic radiation beam entry to, and exit from, ellipsometer, polarimeter, reflectometer and the like systems
Inventor: He, et al. | Patent Number: 5963327
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Broad band imaging spectroradiometer
Inventor: Gerhart, et al. | Patent Number: 5949480
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Apparatus and method for determining the optical retardation of a material
Inventor: Elman | Patent Number: 5936735
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System and method for directing electromagnetic beams
Inventor: Johs | Patent Number: 5929995
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Spectroscopic measurement system using an off-axis spherical mirror and refractive elements
Inventor: Norton | Patent Number: 5917594
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Optical quadrature interferometry utilizing polarization to obtain in-phase and quadrature information
Inventor: DiMarzio, et al. | Patent Number: 5883717
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Regression calibrated spectroscopic rotating compensator ellipsometer system with photo array detector
Inventor: Johs, et al. | Patent Number: 5872630
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Apparatus for detecting a polarization altering substance on a surface
Inventor: Schoeffler, et al. | Patent Number: 5850284
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Apparatus for detecting a polarization altering substance on a surface
Inventor: Schoeffler, et al. | Patent Number: 5841538
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Wide field of view coherent light detector and locator
Inventor: Satorius, et al. | Patent Number: 5838441
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System, and mathematical regression-based method utilizing optical data, for identifying optical axis orientation in material systems such as optical compensators and retarders
Inventor: Herzinger | Patent Number: 5835222
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Fourier transform spectrometer utilizing a birefringent optical component
Inventor: Padgett, et al. | Patent Number: 5781293
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System and method for improving data acquisition capability in spectroscopic ellipsometers
Inventor: Green, et al. | Patent Number: 5757494
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Measurement and control of linewidths in periodic structures using spectroscopic ellipsometry
Inventor: Blayo, et al. | Patent Number: 5739909
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Polarization mode dispersion measuring instrument and method
Inventor: Ozeki, et al. | Patent Number: 5717489
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Infrared ellipsometer/polarimeter system, method of calibration, and use thereof
Inventor: Thompson, et al. | Patent Number: 5706212
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Spectroscopic systems for the analysis of small and very small quantities of substances
Inventor: Machler | Patent Number: 5680209
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Multiple order dispersive optics system and method of use
Inventor: Johs, et al. | Patent Number: 5666201
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Earth monitoring satellite system with combined infrared interferometry and photopolarimetry for chemical and biological sensing
Inventor: Carrieri | Patent Number: 5659391
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Spectrum measuring device eliminating polarization dependency
Inventor: Nishina | Patent Number: 5657121
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Modified intrinsic state spectral analysis apparatus and method
Inventor: Hirsh | Patent Number: 5612783
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Ellipsometer/polarimeter based process monitor and control system suitable for simultaneous retrofit on molecular beam epitaxy system RHEED/LEED interface system, and method of use
Inventor: Woollam, et al. | Patent Number: 5582646
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System and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer system
Inventor: Green, et al. | Patent Number: 5521706
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System and method for compensating polarization-dependent sensitivity of dispersive optics in a rotating analyzer ellipsometer system
Inventor: Johs, et al. | Patent Number: 5504582
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Time-resolved Fourier-transform optical spectroscopy utilizing in-phase and quadrature cyclic perturbation data values
Inventor: Turner | Patent Number: 5450196
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Ellipsometer
Inventor: Woollam, et al. | Patent Number: 5373359
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Ellipsometer
Inventor: Woollam, et al. | Patent Number: 5373359
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Acousto-optic spectrometer/polarimeter
Inventor: Schaff | Patent Number: 5131742
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Acousto-optic spectrometer/polarimeter
Inventor: Schaff | Patent Number: 5131742
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Infrared spectropolarimeter
Inventor: Goldstein, et al. | Patent Number: 5045701
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Infrared spectropolarimeter
Inventor: Goldstein, et al. | Patent Number: 5045701
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Optical spectrum analyzer with high performance measurement function
Inventor: Sonobe, et al. | Patent Number: 4995724
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Method and apparatus for simultaneously measuring a plurality of spectral wavelengths present in electromagnetic radiation
Inventor: Buican, et al. | Patent Number: 4905169
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Apparatus for measuring spectral power of a light beam
Inventor: Sonobe, et al. | Patent Number: 4758086
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Frequency modulation-polarization spectroscopy method and device for detecting spectral features
Inventor: Bjorklund, et al. | Patent Number: 4523847