Patent International Class: G01B 11/255
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Simple inspection device for wheel alignment
Inventor: Chou | Patent Number: 7152333
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Method for self-calibrated sub-aperture stitching for surface figure measurement
Inventor: Golini, et al. | Patent Number: 6956657
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Method and apparatus for measuring the geometrical structure of an optical component in transmission
Inventor: Devie, et al. | Patent Number: 6909498
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Interferometric system for automated radius of curvature measurements
Inventor: Deck | Patent Number: 6894788
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Methods and apparatus for interferometric dimensional metrology
Inventor: Evans | Patent Number: 6801323
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Apparatus and method for measuring aspherical optical surfaces and wavefronts
Inventor: Zanoni | Patent Number: 6771375
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Rapid in situ mastering of an aspheric Fizeau with residual error compensation
Inventor: Evans, et al. | Patent Number: 6734979
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Rapid in-situ mastering of an aspheric fizeau
Inventor: Evans, et al. | Patent Number: 6714308
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Method for determining and designing optical elements
Inventor: Rubinstein, et al. | Patent Number: 6661523
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Surface profile measurement apparatus
Inventor: Nakamura, et al. | Patent Number: 6646748
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Interferometer
Inventor: Klaver | Patent Number: 6577400
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Inspection of ophthalmic lenses using absorption
Inventor: Ross, III, et al. | Patent Number: 6577387
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Method for temporary suppression of reflection for optical measurement
Inventor: Wilk | Patent Number: 6480268
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Method of corneal analysis using a checkered placido apparatus
Inventor: D'Souza, et al. | Patent Number: 6450641
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Profiling of aspheric surfaces using liquid crystal compensatory interferometry
Inventor: Lam, et al. | Patent Number: 6449049
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Three-dimensional shape measurement method and apparatus and computer program product
Inventor: Ishiyama | Patent Number: 6421629
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Three-dimensional shape measurement method and apparatus and computer program product
Inventor: Ishiyama | Patent Number: 6421629
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Topographer for real time ablation feedback having synthetic wavelength generators
Inventor: MacPherson, et al. | Patent Number: 6396069
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Method and apparatus for measuring the profile of reflective surfaces
Inventor: Pingel, et al. | Patent Number: 6392754
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Method and devices for checking container glass
Inventor: Olschewski | Patent Number: 6369889
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Light projecting method, surface inspection method, and apparatus used to implement these methods
Inventor: Haga, et al. | Patent Number: 6356399
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Interferometric apparatus and methods for measuring surface topography of a test surface
Inventor: Gemma, et al. | Patent Number: 6344898
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Method and apparatus for recording three-dimensional distribution of light backscattering potential in transparent and semi-transparent structures
Inventor: Hitzenberger, et al. | Patent Number: 6307634
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Method and apparatus for recording three-dimensional distribution of light backscattering potential in transparent and semi-transparent structures
Inventor: Hitzenberger, et al. | Patent Number: 6288784
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Wetcell device for inspection
Inventor: Russell, et al. | Patent Number: 6259518
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Method for determining and designing optical elements
Inventor: Rubinstein, et al. | Patent Number: 6256098
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Method of corneal analysis using a checkered placido apparatus
Inventor: D'Souza, et al. | Patent Number: 6213605
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Four-mirror extreme ultraviolet (EUV) lithography projection system
Inventor: Cohen, et al. | Patent Number: 6142641
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Method and apparatus for recording three-dimensional distribution of light backscattering potential in transparent and semi-transparent structures
Inventor: Hitzenberger, et al. | Patent Number: 6137585
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Method for determining mechanical property of resin discs and optical discs
Inventor: Kuribayashi, et al. | Patent Number: 6091503
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Apparatus for measuring curvature of magnetic read/write head sliders
Inventor: Crawforth, et al. | Patent Number: 6075604
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Optical testing method and apparatus employing a distortion verification grid
Inventor: Hayden | Patent Number: 6057922
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Interferometric method of measuring toric surfaces at grazing incidence with phase shifting
Inventor: Bruning | Patent Number: 6043886
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Non-spherical surface shape measuring device
Inventor: Ichikawa, et al. | Patent Number: 6032377
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Apparatus and methods for detecting and correcting distortion of interference fringes
Inventor: Ishii, et al. | Patent Number: 6008904
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Shape measuring heterodyne interferometer with multiplexed photodetector aaray or inclined probe head
Inventor: Ohtsuka | Patent Number: 6008901
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Phase contrast aberroscope
Inventor: Rozema, et al. | Patent Number: 6002484
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Interferometric method of measuring toric surfaces at grazing incidence
Inventor: Bruning | Patent Number: 5991035
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Shape measurement method and high-precision lens manufacturing process
Inventor: Nakayama, et al. | Patent Number: 5986760
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Device for the topographical measurement of a surface of a human eye
Inventor: Koest | Patent Number: 5975700
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Method of and apparatus for measuring shape
Inventor: Shimizu, et al. | Patent Number: 5960379
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Multi-camera corneal analysis system
Inventor: Sarver, et al. | Patent Number: 5953100
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Compact interferometric test system for ellipses
Inventor: Stenton, et al. | Patent Number: 5929992
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Measurement of the curvature of a surface using parallel light beams
Inventor: Chason, et al. | Patent Number: 5912738
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Method for determining absolute spatial coordinates of at least one point on a reflecting surface
Inventor: Wallfeld, et al. | Patent Number: 5900924
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Interferometric measurement of toric surfaces at grazing incidence
Inventor: Bruning | Patent Number: 5889591
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Method of evaluating an optical transmission path
Inventor: Honmou | Patent Number: 5877853
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Holder for holographic testing of aspherical lenses with spherical and flat reflective surfaces
Inventor: Stenton | Patent Number: 5864402
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Topographical cornea mapping for corneal vision correction
Inventor: Gordon | Patent Number: 5861955
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Methods and apparatus for measuring and mapping opthalmic elements
Inventor: Abitbol, et al. | Patent Number: 5855074
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Multi-camera corneal analysis system
Inventor: Sarver, et al. | Patent Number: 5847804
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Method of and systems for measuring eccentricity of an aspherical lens surface
Inventor: Morita, et al. | Patent Number: 5844670
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Method of corneal analysis using a checkered placido apparatus
Inventor: D'Souza, et al. | Patent Number: 5841511
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Apparatus to measure wedge and centering error in optical elements
Inventor: Hollmann, et al. | Patent Number: 5835208
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Ophthalmologic curvature measuring device and method to conjointly measure a central and peripheral portion of a curved surface
Inventor: Miyake | Patent Number: 5835190
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Optical heterodyne interferometer for measurement of ocular displacement
Inventor: Gust | Patent Number: 5828454
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Apparatus for mapping optical elements
Inventor: Abitol, et al. | Patent Number: 5825476
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Point diffraction interferometer and pin mirror for use therewith
Inventor: Jeong, et al. | Patent Number: 5822066
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Processing of keratoscopic images employing local spatial phase
Inventor: Mammone | Patent Number: 5796859
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Distance measuring confocal microscope
Inventor: Kuhn, et al. | Patent Number: 5785651
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Device and method for measuring a characteristic of an optical element
Inventor: Sonoda, et al. | Patent Number: 5768150
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Optical apparatus for controlling angle of divergence of ring beam
Inventor: Iga, et al. | Patent Number: 5764828
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Apparatus for the measurement of curvature of a surface
Inventor: Manning | Patent Number: 5760889
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Interferometer with catadioptric imaging system having expanded range of numerical aperture
Inventor: VanKerkhove | Patent Number: 5757493
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Apparatus for measuring refractive power and radius of curvature of a lens
Inventor: Ueno | Patent Number: 5742381
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System and method for interferometric measurement of aspheric surfaces utilizing test plate provided with computer-generated hologram
Inventor: Burge, et al. | Patent Number: 5737079
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Method and apparatus for forming an optical surface by optical etching
Inventor: Jitsuno, et al. | Patent Number: 5729344
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Lens parameter measurement using optical sectioning
Inventor: Ross, III | Patent Number: 5719669
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Lens-meter for measuring optical characteristics of optical lens
Inventor: Oana, et al. | Patent Number: 5719668
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Lens bearer and lensometer incorporating the same
Inventor: Ikezawa, et al. | Patent Number: 5708501
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Method and apparatus for measuring surface topography
Inventor: Cheng | Patent Number: 5708279
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System for measuring surface aberrations of concave cylindrical surfaces
Inventor: LaFleur | Patent Number: 5706086
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Method and apparatus for measuring the curvature of wafers with beams of different wavelengths
Inventor: Cheng | Patent Number: 5696383
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Process and device for determining the topography of a reflecting surface
Inventor: Jean, et al. | Patent Number: 5640962
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Surface curvature measurement
Inventor: Manning | Patent Number: 5633718
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Interferometric method for optically testing an object with an aspherical surface
Inventor: Huang, et al. | Patent Number: 5625454
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Device and method for mapping objects
Inventor: Kuhn, et al. | Patent Number: 5592246
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Apparatus for measuring the curvature of a surface using moveable reflecting and focusing elements
Inventor: Hollmann | Patent Number: 5589940
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Phase shifting diffraction interferometer
Inventor: Sommargren | Patent Number: 5548403
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Method and apparatus for mapping the edge and other characteristics of a workpiece
Inventor: Cheng | Patent Number: 5546179
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Beam spot position detector having a detector moving mechanism
Inventor: Cheng | Patent Number: 5532499
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Method and apparatus for measuring the curvature of wafers with a laser source selecting device
Inventor: Cheng | Patent Number: 5523582
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Process for measuring the inclination of boundary areas in an optical system using interferometry to extract reflections from disturbance-generating boundary areas
Inventor: Gaechter, et al. | Patent Number: 5519491
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Apparatus and method for measuring the error of an apparatus which measure a cylindrical shape using an interferometer
Inventor: Ohtsuka | Patent Number: 5485275
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Digital image system and method for determining surface reflective and refractive characteristics of objects
Inventor: Stone, et al. | Patent Number: 5477332
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Device and method for mapping objects
Inventor: Kuhn, et al. | Patent Number: 5475452
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Improvements in or relating to surface curvature measurement
Inventor: Manning | Patent Number: 5467192
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Examination apparatus for examining an object having a spheroidal reflective surface
Inventor: Isogai, et al. | Patent Number: 5463430
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Phase detection deflectometer-type optical device having a large measuring range
Inventor: Bacchus, et al. | Patent Number: 5440383
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Phase conjugate interferometer for testing paraboloidal mirror surfaces
Inventor: Tenjinbayashi | Patent Number: 5438412
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Method and apparatus for non-contact digitazation of frames and lenses
Inventor: Albert-Garcia | Patent Number: 5428448
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Real time interferometric comparator
Inventor: Haddock, et al. | Patent Number: 5428444
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Method of testing aspherical optical surfaces with an interferometer
Inventor: Tronolone, et al. | Patent Number: 5416586
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Automated optical measurement apparatus
Inventor: Fantone | Patent Number: 5416574
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Object-surface-shape measuring apparatus
Inventor: Yamada | Patent Number: 5416538
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Optical arrangement for performing null testing of aspheric surfaces including reflective/diffractive optics
Inventor: Evans, et al. | Patent Number: 5410408
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Large aperture mirror testing apparatus and method
Inventor: Zielinski, et al. | Patent Number: 5410407
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Interferometer for measuring a surface configuration of a test object by an interference pattern using gratings to generate wave fronts
Inventor: Ishida, et al. | Patent Number: 5387975
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Method and apparatus for measuring stress in a film applied to surface of a workpiece
Inventor: Cheng | Patent Number: 5369286
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Method and apparatus for measuring a lens
Inventor: Nakatsue | Patent Number: 5351119