Patent Examiner: Cady; Albert De
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Semiconductor memory capable of relieving a defective memory cell by exchanging addresses
Inventor: Nose | Patent Number: 6202180
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Message encoding with irregular graphing
Inventor: Luby, et al. | Patent Number: 6163870
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Method for cost-effective production testing of input voltage levels of the forwarded clock interface of high performance integrated circuits
Inventor: Bhavsar, et al. | Patent Number: 6163864
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Cell control method and apparatus
Inventor: Rosenthal, et al. | Patent Number: 6161054
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Pattern generating apparatus
Inventor: Tsutsui | Patent Number: 6148424
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Method and apparatus for performing arithmetic operations on Galois fields and their extensions
Inventor: Cox, et al. | Patent Number: 6141786
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System and method for transmitting data
Inventor: Mowbray, et al. | Patent Number: 6119263
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Method for selecting operation cycles of a semiconductor IC for performing an IDDQ test by using a logical simulation and a fault simulation
Inventor: Takahashi | Patent Number: 6098187
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Method for generating a Shmoo plot contour for integrated circuit tester
Inventor: Huston, et al. | Patent Number: 6079038
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Soft errors handling in EEPROM devices
Inventor: Auclair, et al. | Patent Number: 6049899
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Method of analyzing logic circuit test points, apparatus for analyzing logic circuit test points and semiconductor integrated circuit with test points
Inventor: Nakao, et al. | Patent Number: 6038691
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Multilevel semiconductor memory, write/read method thereto/therefrom and storage medium storing write/read program
Inventor: Hazama | Patent Number: 6023781
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Convolutional interleaving/de-interleaving method using pointer incrementing across predetermined distances and apparatus for data transmission
Inventor: Lachish, et al. | Patent Number: 6014761