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    Scanning Probe Microscope And A Method To Measure Relative-position Between Probes - Patent 8141168

    Scanning Probe Microscope And A Method To Measure Relative-position Between Probes - Patent 8141168

    pgs. 12
    FIELD OF THE ART This invention relates to a scanning probe microscope (SPM), more specifically, a measurement and control of a relative position... ... 
     ...  More »
    Tags: Scanning probe microscope and a metho..., Nakayama, et al., Tomonobu Nakayama, Seiji Higuchi, Application number 12 374-775, Scanning-Probe Techniques Or Apparatu..., Measuring And Testing
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 23 views Language: English
    Apparatus And Method For The Detection Of Forces In The Sub-micronewton Range - Patent 8132268

    Apparatus And Method For The Detection Of Forces In The Sub-micronewton Range - Patent 8132268

    pgs. 12
    The invention relates to an apparatus for the detection of forces in the sub-micronewton range with a measuring head with which a relative movement... ... 
     ...  More »
    Tags: Apparatus and method for the detectio..., Hugel, et al., Thorsten Hugel, Michael Geisler, Application number 12 497-364, Scanning-Probe Techniques Or Apparatu...
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 21 views Language: 
    Optical Scanning Probe - Patent 8117668

    Optical Scanning Probe - Patent 8117668

    pgs. 25
    The present invention concerns non-contact optical scanning.BACKGROUND TO THE INVENTIONScanning Probes Scanning probes are non-contact optical probes  ... 
     ...  More »
    Tags: Optical scanning probe, Crampton, et al., Stephen James Crampton, Peter Champ, Application number 12 298-688, Scanning-Probe Techniques Or Apparatu...
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 22 views Language: English
    Method And System For Near-field Spectroscopy Using Targeted Deposition Of Nanoparticles - Patent 8108943

    Method And System For Near-field Spectroscopy Using Targeted Deposition Of Nanoparticles - Patent 8108943

    pgs. 13
    a. Field of the Invention The invention relates to a method and system for near-field spectroscopy using targeted deposition of nanoparticles. In... ... 
     ...  More »
    Tags: Method and system for near-field spec..., Anderson, Mark S. Anderson, Application number 12 324-693, Scanning-Probe Techniques Or Apparatu...
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 23 views Language: English
    Probe Microscope - Patent 8108942

    Probe Microscope - Patent 8108942

    pgs. 14
    1. Field of the Invention The present invention relates to a probe microscope and, more specifically, to a probe microscope having an observation... ... 
     ...  More »
    Tags: Probe microscope, Suzuki, et al., Yoshimasa Suzuki, Kazuhiko Kawasaki, Satoshi Koga, Application number 12 699-321, Scanning-Probe Techniques Or Apparatu..., Radiant Energy, Optics: Measuring And Testing, Measuring And Testing
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 22 views Language: 
    Magnetic Sensor And Scanning Microscope - Patent 8104093

    Magnetic Sensor And Scanning Microscope - Patent 8104093

    pgs. 14
    S The present application is a U.S. national stage application claiming the benefit of International Application No. PCT/JP2008/056058, filed on... ... 
     ...  More »
    Tags: Magnetic sensor and scanning microscope, Sandhu, Adarsh Sandhu, Application number 12 665-613, Scanning-Probe Techniques Or Apparatu...
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 25 views Language: 
    Scanning Probe Microscope With Automatic Probe Replacement Function - Patent 8099793

    Scanning Probe Microscope With Automatic Probe Replacement Function - Patent 8099793

    pgs. 23
    1. Field of the Invention The present invention relates to a scanning probe microscope, a probe of which can be automatically replaced, and more... ... 
     ...  More »
    Tags: Scanning probe microscope with automa..., Jo, et al., Hyeong Chan Jo, Hong Jae Lim, Seung Jun Shin, Joon Hui Kim, Yong Seok Kim, Sang-il Park, Application number 12 569-680, Scanning-Probe Techniques Or Apparatu...
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 20 views Language: English
    Atomic Force Microscopy Probe - Patent 8091143

    Atomic Force Microscopy Probe - Patent 8091143

    pgs. 8
    The invention relates to aprobe for atomic force microscopy, to an atomic force microscope including such a probe, and to a method of atomic force... ... 
     ...  More »
    Tags: Atomic force microscopy probe, Faucher, et al., Marc Faucher, Lionel Buchaillot, Jean-Pierre Aime, Bernard Louis Amand Legrand, Gerard Couturier, Application number 12 598-490, Scanning-Probe Techniques Or Apparatu..., Measuring And Testing
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 27 views Language: English
    Atomic Force Microscopy Devices, Arrangements And Systems - Patent 8082593

    Atomic Force Microscopy Devices, Arrangements And Systems - Patent 8082593

    pgs. 21
    The present invention relates generally to microscopy, and more particularly to devices, arrangements and systems for atomic force microscopy... ... 
     ...  More »
    Tags: Atomic force microscopy devices, arrangements and systems, Sarioglu, et al., Ali Fatih Sarioglu, Olav Solgaard, Application number 12 392-811, Scanning-Probe Techniques Or Apparatu...
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 25 views Language: English
    Dual Tip Atomic Force Microscopy Probe And Method For Producing Such A Probe - Patent 8079093

    Dual Tip Atomic Force Microscopy Probe And Method For Producing Such A Probe - Patent 8079093

    pgs. 9
    1. Field of the Invention The present invention is related to a dual tip atomic force miscroscopy (AFM) probe with two mutually isolated conductive... ... 
     ...  More »
    Tags: Dual tip atomic force microscopy prob..., Fouchier, Marc Fouchier, Application number 12 367-463, Scanning-Probe Techniques Or Apparatu...
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 62 views Language: 
    Harmonic Correcting Controller For A Scanning Probe Microscope - Patent 8074291

    Harmonic Correcting Controller For A Scanning Probe Microscope - Patent 8074291

    pgs. 9
    Scanning probe microscopes are a class of imaging techniques in which a tip that interacts locally with a sample is scanned over the surface of the... ... 
     ...  More »
    Tags: Harmonic correcting controller for a ..., Abramovitch, Daniel Yves Abramovitch, Application number 12 697-183, Scanning-Probe Techniques Or Apparatu..., Radiant Energy, Measuring And Testing
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 28 views Language: 
    High Resolution Wide Angle Tomographic Probe - Patent 8074292

    High Resolution Wide Angle Tomographic Probe - Patent 8074292

    pgs. 13
    CROSS-REFERENCE TO RELATEDAPPLICATIONS This application is a National Stage of International patent application PCT/EP2008/063462, filed on Oct. 8,... ... 
     ...  More »
    Tags: High resolution wide angle tomographi..., Bostel, et al., Alain Bostel, Mikhail Yavor, Ludovic Renaud, Bernard Deconihout, Application number 12 682-700, Scanning-Probe Techniques Or Apparatu..., Radiant Energy
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 30 views Language: English
    Atomic Force Microscope Apparatus - Patent 8069493

    Atomic Force Microscope Apparatus - Patent 8069493

    pgs. 127
    The present invention relates to an atomic force microscope apparatus.BACKGROUND ART An atomic force microscope (AFM) is an apparatus using a probe... ... 
     ...  More »
    Tags: Atomic force microscope apparatus, Fujimoto, et al., Hiroshi Fujimoto, Takashi Ooshima, Application number 12 529-903, Scanning-Probe Techniques Or Apparatu...
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 25 views Language: 
    Probe Testing Structure - Patent 8069491

    Probe Testing Structure - Patent 8069491

    pgs. 26
    The present invention relates to calibration structures for probing devices, and more particularly to improved calibration structures for suppressing  ... 
     ...  More »
    Tags: Probe testing structure, Lesher, Timothy E. Lesher, Application number 11 820-877, Scanning-Probe Techniques Or Apparatu...
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 30 views Language: English
    Carbon Nanotube Oscillator Surface Profiling Device And Method Of Use - Patent 8060943

    Carbon Nanotube Oscillator Surface Profiling Device And Method Of Use - Patent 8060943

    pgs. 17
    Carbon nanotubes (CNT) are quasi-one dimensional structures which are obtained by rolling up graphene sheets into cylinders. There are single wall... ... 
     ...  More »
    Tags: Carbon nanotube oscillator surface pr..., Popescu, et al., Adrian Popescu, Lilia M. Woods, Igor V. Bondarev, Application number 12 548-070, Scanning-Probe Techniques Or Apparatu..., Measuring And Testing
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 28 views Language: 
    Probe Microscopy And Probe Position Monitoring Apparatus - Patent 8051493

    Probe Microscopy And Probe Position Monitoring Apparatus - Patent 8051493

    pgs. 21
    The present invention relates to probe position monitoringapparatus and to a method thereof which is suitable for use in near field probe microscopy... ... 
     ...  More »
    Tags: Probe microscopy and probe position m..., Ulcinas, et al., Arturas Ulcinas, John D. Engledew, Michael L. Picco, John M. Miles, Massimo Antognozzi, Application number 12 595-504, Scanning-Probe Techniques Or Apparatu..., Radiant Energy, Measuring And Testing
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 30 views Language: English
    Scanning Probe Microscope With Independent Force Control And Displacement Measurements - Patent 8028343

    Scanning Probe Microscope With Independent Force Control And Displacement Measurements - Patent 8028343

    pgs. 6
    Scanning probe microscopes such as atomic force microscopes are widely used for imaging the surface of samples at the atomic level; however, these... ... 
     ...  More »
    Tags: Scanning probe microscope with indepe..., Oliver, et al., Warren C. Oliver, John Swindernan, Jennifer Hay, Karmit Parks, Application number 12 362-359, Scanning-Probe Techniques Or Apparatu..., Optics: Measuring And Testing
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 35 views Language: English
    Approach Method For Probe And Sample In Scanning Probe Microscope - Patent 8024816

    Approach Method For Probe And Sample In Scanning Probe Microscope - Patent 8024816

    pgs. 22
    This application claims priority under 35 U.S.C. .sctn.119 to Japanese Patent Application Nos. 2009-028747 filed on Feb. 10, 2009 and 2009-267578... ... 
     ...  More »
    Tags: Approach method for probe and sample ..., Iyoki, et al., Masato Iyoki, Yoshiteru Shikakura, Masafumi Watanabe, Application number 12 700-236, Scanning-Probe Techniques Or Apparatu..., Radiant Energy, Electricity: Measuring And Testing
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 28 views Language: English
    Tapered Probe Structures And Fabrication - Patent 8020216

    Tapered Probe Structures And Fabrication - Patent 8020216

    pgs. 25
    RELATED PATENT APPLICATION This application is a national stage application of and claims the benefit of PCT/US2006/018151 filed on May 10, 2006,... ... 
     ...  More »
    Tags: Tapered probe structures and fabrication, Jin, Sungho Jin, Application number 11 914-108, Scanning-Probe Techniques Or Apparatu..., Chemistry: Electrical And Wave Energy, Coating Processes, Nanotechnology
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 26 views Language: English
    SPM Probe With Shortened Cantilever - Patent 8011016

    SPM Probe With Shortened Cantilever - Patent 8011016

    pgs. 12
    The present application claims priority under 35 USC .sctn.119 to European Patent Application No. 08 005 248.3, filed on Mar. 20, 2008, the entire... ... 
     ...  More »
    Tags: SPM probe with shortened cantilever, Sulzbach, et al., Thomas Sulzbach, Christoph Richter, Application number 12 402-576, Scanning-Probe Techniques Or Apparatu..., Radiant Energy, Measuring And Testing
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 25 views Language: English
    Preamplifying Cantilever And Applications Thereof - Patent 7979916

    Preamplifying Cantilever And Applications Thereof - Patent 7979916

    pgs. 23
    The invention relates generally to scanning probe microscopy and related applications, such as data storage, and, more particularly, to scanning... ... 
     ...  More »
    Tags: Preamplifying cantilever and applicat..., Pittenger, et al., Bede Pittenger, Kumar Virwani, Benedikt Zeyen, Application number 12 472-183, Scanning-Probe Techniques Or Apparatu...
     ...  More »
    Categories:Legal › Patents › Scanning Probes › 
    3188435 11 views Language: English
    1234...20Next »