Method Of Wire Bond Encapsulation Profiling - Patent 8025204

Document Sample
Method Of Wire Bond Encapsulation Profiling - Patent 8025204 Powered By Docstoc
					


United States Patent: 8025204


































 
( 1 of 1 )



	United States Patent 
	8,025,204



   Chung-Long-Shan
,   et al.

 
September 27, 2011




Method of wire bond encapsulation profiling



Abstract

 A method for profiling a bead of encapsulant extending along an edge of a
     die mounted to a supporting structure, by depositing a bead of
     encapsulant onto wire bonds along the edge of the die, positioning a
     profiling surface over the die at a predetermined spacing from the die,
     moving the profiling surface across the bead before the bead of
     encapsulant has cured to reshape the bead profile and, curing the bead of
     encapsulant. The invention has found that the encapsulant can be
     effectively shaped by a profiling surface without stripping the
     encapsulant from the wire bonds. The normally convex-shaped upper surface
     of the encapsulant bead can be pushed to one side of the bead with the
     profiling surface. With a lower encapsulant bead, the active surface can
     be brought into closer proximity with another surface without making
     contact. For example, the nozzle array on a printhead IC can be 300
     microns to 400 microns from the paper path. By collapsing or flattening
     the wire bond arcs before applying and profiling a bead of encapsulant,
     the nozzle array on the printhead IC can be less than 100 microns from
     the paper path.


 
Inventors: 
 Chung-Long-Shan; Laval (Balmain, AU), Tankongchumruskul; Kiangkai (Balmain, AU), Silverbrook; Kia (Balmain, AU) 
 Assignee:


Silverbrook Research Pty Ltd
 (Balmain, New South Wales, 
AU)





Appl. No.:
                    
11/860,538
  
Filed:
                      
  September 25, 2007





  
Current U.S. Class:
  228/155  ; 438/15
  
Current International Class: 
  B21D 39/00&nbsp(20060101); H01L 21/66&nbsp(20060101)

References Cited  [Referenced By]
U.S. Patent Documents
 
 
 
4595938
June 1986
Conta et al.

5008736
April 1991
Davies et al.

5468999
November 1995
Lin et al.

5577319
November 1996
Knecht

5863488
January 1999
Moriya

6022583
February 2000
Falcone et al.

6071427
June 2000
Raulinaitis

6143588
November 2000
Glenn

6291884
September 2001
Glenn et al.

6326240
December 2001
Liaw

6414849
July 2002
Chiu

6644782
November 2003
Ward et al.

6709893
March 2004
Moden et al.

6790473
September 2004
Papathomas et al.

6805541
October 2004
Hashimoto

6836962
January 2005
Khandros et al.

6885093
April 2005
Lo et al.

7669751
March 2010
Silverbrook et al.

7802715
September 2010
Silverbrook et al.

2001/0014486
August 2001
Glenn

2003/0160311
August 2003
Ismail et al.

2004/0241906
December 2004
Chan

2005/0242159
November 2005
Yajima

2007/0045872
March 2007
Fee

2007/0105280
May 2007
Li

2008/0099895
May 2008
Kwak

2008/0158298
July 2008
Serbicki et al.

2008/0237887
October 2008
Takiar et al.

2009/0032926
February 2009
Sharifi



 Foreign Patent Documents
 
 
 
WO 03/006230
Jan., 2003
WO



   Primary Examiner: Ward; Jessica L


  Assistant Examiner: Ha; Steven



Claims  

The invention claimed is:

 1.  A method for profiling a bead of encapsulant extending along an edge of a die mounted to a supporting structure, the die having an active surface that has functional
elements, the method comprising the steps of: providing wire bonds extending in an arc from respective contact pads on the die to corresponding conductors on the support structure, the contact pads being formed along an edge of the active surface; 
pushing on each wire bond at a point on the wire bond beyond an edge of the die, using a wire pusher, to plastically deform the wire bonds;  depositing a bead of encapsulant onto the wire bonds along the edge of the die;  providing a profiling surface
for engaging the bead of encapsulant;  positioning the profiling surface at least partially between the contact pads and the functional elements, and above the active surface at a predetermined spacing from the die;  moving the profiling surface away
from the functional elements and across the bead before the bead of encapsulant has cured to push some of the encapsulant material away from the functional elements such that the functional elements remain exposed;  and, curing the bead of encapsulant.


 2.  A method according to claim 1 wherein the wire bond has a diameter less than 40 microns and the arc extends more than 100 microns above the active surface of the die.


 3.  A method according to claim 2 wherein the wire bond is plastically deformed such that it extends less than 50 microns above the active surface of the die.


 4.  A method according to claim 1 wherein the wire bond is pushed by engagement with a blade having a rounded edge section for contacting the wire bond.


 5.  A method according to claim 1 wherein the bead of encapsulant having a profiled surface that is flat, parallel to and spaced less than 100 microns from the active surface.


 6.  A method according to claim 1 wherein the encapsulant being an epoxy material has a viscosity greater than 700 cp when uncured.


 7.  A method according to claim 1 wherein the encapsulant being an epoxy material that is thixotropic when uncured.


 8.  A method according to claim 1 further comprising the steps of: applying the bead of encapsulant onto the contact pads such that one side of the bead contacts the profiling surface and a portion of the bead extends between the profiling
surface and the die and onto the active surface.


 9.  A method according to claim 8 wherein the die is an inkjet printhead IC and the functional elements are nozzles through which ink is ejected.


 10.  A method according to claim 9 wherein the printhead IC is mounted in a printer such that during use the nozzles are less than 100 microns from the paper path.


 11.  A method according to claim 1 wherein the support structure has a chip mounting area and a conductor mounting area, the die is supported on the chip mounting area, and a plurality of electrical conductors at least partially supported on the
conductor mounting area wherein, the chip mounting area is raised relative to the conductor mounting area.


 12.  A method according to claim 11 wherein the chip mounting area is raised more than 100 microns relative to the conductor mounting area.


 13.  A method according to claim 12 wherein the support structure has a step between the chip mounting area and the conductor mounting area.


 14.  A method according to claim 12 wherein the plurality of conductors are incorporated into a flexible printed circuit board (flex PCB) with a line of bond pads along an edge closest the die, the bond pads being more than 2 mm from the
contacts pads on the die.


 15.  A method according to claim 14 wherein the support structure is a liquid crystal polymer (LCP) molding.  Description  

CO-PENDING APPLICATIONS


 The following applications have been filed by the Applicant simultaneously with the present application:


 TABLE-US-00001 11/860,539 11/860,540 11/860,541 11/860,542


 The disclosure of these co-pending applications are incorporated herein by reference.


CROSS REFERENCES TO RELATED APPLICATIONS


 Various methods, systems and apparatus relating to the present invention are disclosed in the following U.S.  patents/patent applications filed by the applicant or assignee of the present invention:


 TABLE-US-00002 6,405,055 6,628,430 7,136,186 10/920,372 7,145,689 7,130,075 7,081,974 7,177,055 7,209,257 7,161,715 7,154,632 7,158,258 7,148,993 7,075,684 7,158,809 11/225,172 11/474,280 11/635,482 11/635,526 11/650,545 11/653,24- 1 11/653,240
11,758,648 7,241,005 7,108,437 6,915,140 6,999,206 7,136,198 7,092,130 7,249,108 6,566,858 6,331,946 6,246,970 6,442,525 09/517,384 09/505,951 6,374,354 7,246,098 6,816,968 6,757,832 6,334,190 6,745,331 7,249,109 10/203,559 7,197,642 7,093,139 10/636,263
10/636,283 10/866,608 7,210,038 10/902,833 10/940,653 10/942,858 11/706,329 11/757,385 11/758,64- 2 7,170,652 6,967,750 6,995,876 7,099,051 11/107,942 7,193,734 11/209,711 11/599,336 7,095,533 6,914,686 7,161,709 7,099,033 11/003,786 7,258,417 11/003,418
11/003,334 11/003,600 11/003,404 11/003,419 11/003,700 7,255,41- 9 11/003,618 7,229,148 7,258,416 11/003,698 11/003,420 6,984,017 11/003,699 11/071,473 11,748,482 11/778,563 11/779,851 11/778,574 11/853,816 11/853,8- 14 11/853,786 11/856,694 11/003,463
11/003,701 11/003,683 11/003,614 11/003,7- 02 11/003,684 7,246,875 11/003,617 11/764,760 11,853,777 11/293,800 11/293,80- 2 11/293,801 11/293,808 11/293,809 11/482,975 11/482,970 11/482,968 11/482,9- 72 11/482,971 11/482,969 11/097,266 11/097,267
11/685,084 11/685,086 11/685,0- 90 11/740,925 11/763,444 11/763,443 11/518,238 11/518,280 11/518,244 11/518,2- 43 11/518,242 11/084,237 11/084,240 11/084,238 11/357,296 11/357,298 11/357,2- 97 11/246,676 11/246,677 11/246,678 11/246,679 11/246,680
11/246,681 11/246,7- 14 11/246,713 11/246,689 11/246,671 11/246,670 11/246,669 11/246,704 11/246,7-  10 11/246,688 11/246,716 11/246,715 11/246,707 11/246,706 11/246,705 11/246,7- 08 11/246,693 11/246,692 11/246,696 11/246,695 11/246,694 11/482,958
11/482,9- 55 11/482,962 11/482,963 11/482,956 11/482,954 11/482,974 11/482,957 11/482,9- 87 11/482,959 11/482,960 11/482,961 11/482,964 11/482,965 11/482,976 11/482,9- 73 11/495,815 11/495,816 11/495,817 6,227,652 6,213,588 6,213,589 6,231,163 6,247,795
6,394,581 6,244,691 6,257,704 6,416,168 6,220,694 6,257,705 6,247,794 6,234,610 6,247,793 6,264,306 6,241,342 6,247,792 6,264,307 6,254,220 6,234,611 6,302,528 6,283,582 6,239,821 6,338,547 6,247,796 6,557,977 6,390,603 6,362,843 6,293,653 6,312,107
6,227,653 6,234,609 6,238,040 6,188,415 6,227,654 6,209,989 6,247,791 6,336,710 6,217,153 6,416,167 6,243,113 6,283,581 6,247,790 6,260,953 6,267,469 6,588,882 6,742,873 6,918,655 6,547,371 6,938,989 6,598,964 6,923,526 6,273,544 6,309,048 6,420,196
6,443,558 6,439,689 6,378,989 6,848,181 6,634,735 6,299,289 6,299,290 6,425,654 6,902,255 6,623,101 6,406,129 6,505,916 6,457,809 6,550,895 6,457,812 7,152,962 6,428,133 7,216,956 7,080,895 11/144,844 7,182,437 11/599,341 11/635,533 11/607,976 11/607,975
11/607,99- 9 11/607,980 11/607,979 11/607,978 11/735,961 11/685,074 11/696,126 11/696,1- 44 11/696,650 11/763,446 10/407,212 7,252,366 10/683,064 10/683,041 11,766,71- 3 11/841,647 11/482,980 11/563,684 11/482,967 11/482,966 11/482,988 11/482,9- 89
11/293,832 11/293,838 11/293,825 11/293,841 11/293,799 11/293,796 11/293,7- 97 11/293,798 11/124,158 11/124,196 11/124,199 11/124,162 11/124,202 11/124,1- 97 11/124,154 11/124,198 11/124,153 11/124,151 11/124,160 11/124,192 11/124,1- 75 11/124,163
11/124,149 11/124,152 11/124,173 11/124,155 7,236,271 11/124,17-  4 11/124,194 11/124,164 11/124,200 11/124,195 11/124,166 11/124,150 11/124,1- 72 11/124,165 11/124,186 11/124,185 11/124,184 11/124,182 11/124,201 11/124,1- 71 11/124,181 11/124,161
11/124,156 11/124,191 11/124,159 11/124,176 11/124,1- 88 11/124,170 11/124,187 11/124,189 11/124,190 11/124,180 11/124,193 11/124,1- 83 11/124,178 11/124,177 11/124,148 11/124,168 11/124,167 11/124,179 11/124,1- 69 11/187,976 11/188,011 11/188,014
11/482,979 11/735,490 11/853,018 11/228,5- 40 11/228,500 11/228,501 11/228,530 11/228,490 11/228,531 11/228,504 11/228,5- 33 11/228,502 11/228,507 11/228,482 11/228,505 11/228,497 11/228,487 11/228,5- 29 11/228,484 11/228,489 11/228,518 11/228,536
11/228,496 11/228,488 11/228,5- 06 11/228,516 11/228,526 11/228,539 11/228,538 11/228,524 11/228,523 11/228,5- 19 11/228,528 11/228,527 11/228,525 11/228,520 11/228,498 11/228,511 11/228,5- 22 111/228,515 11/228,537 11/228,534 11/228,491 11/228,499
11/228,509 11/228,- 492 11/228,493 11/228,510 11/228,508 11/228,512 11/228,514 11/228,494 11/228,4- 95 11/228,486 11/228,481 11/228,477 11/228,485 11/228,483 11/228,521 11/228,5- 17 11/228,532 11/228,513 11/228,503 11/228,480 11/228,535 11/228,478
11/228,4- 79 6,087,638 6,340,222 6,041,600 6,299,300 6,067,797 6,286,935 6,044,646 6,382,769 10/868,866 6,787,051 6,938,990 11/242,916 11/242,917 11/144,799 11/198,235 11/766,052 7,152,972 11/592,996 6,746,105 11/763,440  11/763,442- 11/246,687
11/246,718 11/246,685 11/246,686 11/246,703 11/246,691 11/246,7- 11 11/246,690 11/246,712 11/246,717 11/246,709 11/246,700 11/246,701 11/246,7- 02 11/246,668 11/246,697 11/246,698 11/246,699 11/246,675 11/246,674 11/246,6- 67 11/829,957 11/829,960
11/829,961 11/829,962 11/829,963 11/829,966 11/829,9- 67 11/829,968 11/829,969 7,156,508 7,159,972 7,083,271 7,165,834 7,080,894 7,201,469 7,090,336 7,156,489 10/760,233 10/760,246 7,083,257 7,258,422 7,255,423 7,219,980 10/760,253 10/760,255 10/760,209
7,118,192 10/760,194 10/760,238 7,077,505 7,198,354 7,077,504 10/760,189 7,198,355 10/760,232 10/760,231 7,152,959 7,213,906 7,178,901 7,222,938 7,108,353 7,104,629 11/446,227 11/454,904 11/472,345 11/474,273 7,261,401 11/474,279 11/482,93- 9 11/482,950
11/499,709 11/592,984 11/601,668 11/603,824 11/601,756 11/601,6- 72 11/650,546 11/653,253 11/706,328 11/706,299 11/706,965 11/737,080 11/737,0- 41 11/778,062 11/778,566 11,782,593 11/246,684 11/246,672 11/246,673 11/246,6- 83 11/246,682 60/939,086
7,246,886 7,128,400 7,108,355 6,991,322 10/728,790 7,118,197 10/728,784 10/728,783 7,077,493 6,962,402 10/728,803 7,147,308 10/728,779 7,118,198 7,168,790 7,172,270 7,229,155 6,830,318 7,195,342 7,175,261 10/773,183 7,108,356 7,118,202 10/773,186
7,134,744 10/773,185 7,134,743 7,182,439 7,210,768 10/773,187 7,134,745 7,156,484 7,118,201 7,111,926 10/773,184 7,018,021 11/060,751 11/060,805 11/188,017 7,128,402 11/298,774 11/329,157 11/490,041 11/501,767 11/499,736 7,246,885 7,229,156- 11/505,846
11/505,857 11/505,856 11/524,908 11/524,938 7,258,427 11/524,91- 2 11/592,999 11/592,995 11/603,825  11/649,773 11/650,549 11/653,237 11/706,3- 78 11/706,962 11,749,118 11/754,937 11,749,120 11/744,885 11/779,850 11/765,4- 39 11,842,950 11/839,539
11/097,308 11/097,309 7,246,876 11/097,299 11/097,31- 0 11/097,213 11/210,687 11/097,212 7,147,306 7,261,394 11/764,806 11/782,595- 11/482,953 11/482,977 11/544,778 11/544,779 11/764,808 09/575,197 7,079,71- 2 6,825,945 09/575,165 6,813,039 6,987,506
7,038,797 6,980,318 6,816,274 7,102,772 09/575,186 6,681,045 6,728,000 7,173,722 7,088,459 09/575,181 7,068,382 7,062,651 6,789,194 6,789,191 6,644,642 6,502,614 6,622,999 6,669,385 6,549,935 6,987,573 6,727,996 6,591,884 6,439,706 6,760,119 09/575,198
6,290,349 6,428,155 6,785,016 6,870,966 6,822,639 6,737,591 7,055,739 7,233,320 6,830,196 6,832,717 6,957,768 09/575,172 7,170,499 7,106,888 7,123,239 11/066,161 11/066,160 11/066,159 11/066,158 11/066,165- 10/727,181 10/727,162 10/727,163 10/727,245
7,121,639 7,165,824 7,152,942 10/727,157 7,181,572 7,096,137 10/727,257 10/727,238 7,188,282 10/727,159 10/727,180 10/727,179 10/727,192 10/727,274 10/727,164 10/727,161 10/727,1- 98 10/727,158 10/754,536 10/754,938 10/727,227 10/727,160 10/934,720
7,171,32- 3 11/272,491 11/474,278 11/488,853 11/488,841 11,749,750 11,749,749 10/296,5- 22 6,795,215 7,070,098 7,154,638 6,805,419 6,859,289 6,977,751 6,398,332 6,394,573 6,622,923 6,747,760 6,921,144 10/884,881 7,092,112 7,192,106 11/039,866 7,173,739
6,986,560 7,008,033 11/148,237 7,222,780 11/248,426 11/478,599 11/499,749 11/738,518 11/482,981 11/743,661 11/743,659 11/752,9- 00 7,195,328 7,182,422 11/650,537 11/712,540 10/854,521 10/854,522 10/854,488- 10/854,487 10/854,503 10/854,504 10/854,509
7,188,928 7,093,989 10/854,497- 10/854,495 10/854,498 10/854,511  10/854,512 10/854,525 10/854,526 10/854,5- 16 10/854,508 7,252,353 10/854,515 10/854,506 10/854,505 10/854,493 10/854,49- 4 10/854,489 10/854,490 10/854,492 10/854,491 10/854,528
10/854,523 10/854,5- 27 10/854,524 10/854,520 10/854,514 10/854,519 10/854,513 10/854,499 10/854,5- 01 7,266,661 7,243,193 10/854,518 10/854,517 10/934,628 7,163,345 11/499,803 11/601,757 11/706,295 11/735,881 11,748,483 11,749,123 11/766,061 11,775,1-
35 11,772,235 11/778,569 11/829,942 11/014,731 11/544,764 11/544,765 11/544,7- 72 11/544,773 11/544,774 11/544,775 11/544,776 11/544,766 11/544,767 11/544,7- 71 11/544,770 11/544,769 11/544,777 11/544,768 11/544,763 11/293,804 11/293,8- 40 11/293,803
11/293,833 11/293,834 11/293,835 11/293,836 11/293,837 11/293,7- 92 11/293,794 11/293,839 11/293,826 11/293,829 11/293,830 11/293,827 11/293,8- 28 11/293,795 11/293,823 11/293,824 11/293,831 11/293,815 11/293,819 11/293,8- 18 11/293,817 11/293,816
11/838,875 11/482,978 11/640,356 11/640,357 11/640,3- 58 11/640,359 11/640,360 11/640,355 11/679,786 10/760,254 10/760,210 10/760,2- 02 7,201,468 10/760,198 10/760,249 7,234,802 10/760,196 10/760,247 7,156,511 10/760,264 7,258,432 7,097,291 10/760,222
10/760,248 7,083,273 10/760,192 10/760,203 10/760,204 10/760,205 10/760,206 10/760,267 10/760,270 7,198,35- 2 10/760,271 10/760,275 7,201,470 7,121,655 10/760,184 7,232,208 10/760,186 10/760,261 7,083,272 11/501,771 11/583,874 11/650,554 11/706,322
11/706,96-  8 11/749,119 11,779,848 11/855,152 11,855,151 11/014,764 11/014,763 11/014,7- 48 11/014,747 11/014,761 11/014,760 11/014,757 11/014,714 7,249,822 11/014,76- 2 11/014,724 11/014,723 11/014,756 11/014,736 11/014,759 11/014,758 11/014,7- 25
11/014,739 11/014,738 11/014,737 11/014,726 11/014,745 11/014,712 11/014,7- 15 11/014,751 11/014,735 11/014,734 11/014,719 11/014,750 11/014,749 7,249,83- 3 11/758,640 11/775,143 11/838,877 11/014,769 11/014,729 11/014,743 11/014,7- 33 11/014,754
11/014,755 11/014,765 11/014,766 11/014,740 11/014,720 11/014,7- 53 7,255,430 11/014,744 11/014,741 11/014,768 11/014,767 11/014,718 11/014,71- 7 11/014,716 11/014,732 11/014,742 11/097,268 11/097,185 11/097,184 11/778,5- 67 11,852,958 11,852,907
11/293,820 11/293,813 11/293,822 11/293,812 11/293,8- 21 11/293,814 11/293,793 11/293,842 11/293,811 11/293,807 11/293,806 11/293,8- 05 11/293,810 11/688,863 11/688,864 11/688,865 11/688,866 11/688,867 11/688,8- 68 11/688,869 11/688,871 11/688,872
11/688,873 11/741,766 11/482,982 11/482,9- 83 11/482,984 11/495,818 11/495,819 11/677,049 11/677,050 11/677,051 11/014,7- 22 10/760,180 7,111,935 10/760,213 10/760,219 10/760,237 7,261,482 10/760,220- 7,002,664 10/760,252 10/760,265 7,088,420 11/446,233
11/503,083 11/503,081- 11/516,487 11/599,312 11/014,728 11/014,727 7,237,888 7,168,654 7,201,272 6,991,098 7,217,051 6,944,970 10/760,215 7,108,434 10/760,257 7,210,407 7,186,042 10/760,266 6,920,704 7,217,049 10/760,214  10/760,260 7,147,102 10/760,269
7,249,838 10/760,241 10/962,413 10/962,427 7,261,477 7,225,739 10/962,402 10/962,425 10/962,428 7,191,978 10/962,426 10/962,409 10/962,41- 7 10/962,403 7,163,287 7,258,415 10/962,523 7,258,424 10/962,410 7,195,412 7,207,670 11/282,768 7,220,072
11/474,267 11/544,547 11/585,925 11/593,000- 11/706,298 11/706,296 11/706,327 11/730,760 11/730,407 11/730,787 11/735,9- 77 11/736,527 11/753,566 11/754,359 11/778,061 11/765,398 11/778,556 11/829,9- 37 11/780,470 11/223,262 11/223,018 11/223,114
11/223,022 11/223,021 11/223,0- 20


11/223,019 11/014,730 7,154,626 7,079,292 11/604,316


 The disclosures of these co-pending applications are incorporated herein by reference.


FIELD OF THE INVENTION


 The invention relates to the field of integrated circuit packaging.  In particular, the encapsulation of the wire bonds between a circuit board and the contact pads on the integrated circuit die.


BACKGROUND OF THE INVENTION


 Integrated circuits fabricated on silicon wafer substrates are electrically connected to printed circuit boards by wire bonds.  The wire bonds are very thin wires--around 25 to 40 microns in diameter--extending from contact pads along the side
of the wafer substrate to contacts on the printed circuit board (PCB).  To protect and strengthen the wire bonds, they are sealed within a bead of epoxy called encapsulant.  The wires from the contact pads to the PCB are made longer than necessary to
accommodate changes in the gap between the PCB and the contact pads because of thermal expansion, flex in the components and so on.  These longer than necessary wires naturally form an arc between the contact pads and the PCB.  The top of the wire arc is
often about 300 microns above the contact pads although some wire bonding may extend even higher.  As the name suggests, the encapsulant needs to encapsulate the full length of the wire so the encapsulant bead will extend 500 microns to 600 microns proud
of the contact pads.


 The integrated circuit fabricated on the silicon wafer is often referred to as a `die`.  For the purposes of this specification, the term die will be used as a reference to an integrated circuit fabricated on a wafer substrate using lithographic
the well known etching and deposition techniques commonly used in semiconductor fabrication.  If the die is purely an electronic microprocessor, there is little need to keep close control of the encapsulant bead dimensions.  However, if the die is a
micro-electro mechanical systems (MEMS) device with an active upper surface, it may be necessary or desirable to bring the active surface of the die onto close proximity with another surface.  One such situation applies to inkjet printheads.  The
proximity of the print media to the nozzle array influences the print quality.  Similarly, if a cleaning surface is wiped across the nozzles, the bead of encapsulant can hamper the wiping contact.


 Another problems arises because of sides of the encapsulant bead are not straight.  One commonly used technique for depositing the encapsulant involves extruding it from a needle directly onto the line of wire bonds.  The encapsulant volume and
placement on the die is not very accurate.  Variations in the pressure from the pump or slight non-uniformities in the speed of the needle cause the side of the bead contacting the active surface to be reasonably crooked.  As the side of the bead is not
straight, it has to be generously spaced from any active parts on the active surface to comfortably accommodate the perturbations.  Spacing the electrical contacts away from the active portions (say for example, inkjet nozzles) of the active surface uses
up valuable wafer real estate and reduces the number of dies that can be fabricated from a wafer disc.


 In light of the widespread use of inkjet printheads, the invention will be described with specific reference to its application in this field.  However, the ordinary will appreciate that this is purely illustrative and the invention is equally
applicable to other integrated circuits wire bonded to a PCB or other support structure.


SUMMARY OF THE INVENTION


 According to a first aspect, the present invention provides a microprocessor device comprising:


 a support structure having a chip mounting area and a conductor mounting area;


 a die supported on the chip mounting area, the die having a back surface in contact with the chip mounting area and an active surface opposing the back surface, the active surface having electrical contact pads;


 a plurality of electrical conductors at least partially supported on the conductor mounting area; and,


 a series of wire bonds extending from the electrical contact pads to the plurality of electrical conductors supported on the conductor mounting area; wherein,


 the chip mounting area is raised relative to the conductor mounting area.


 By raising the chip mounting area relative to the rest of the PCB, or at least the conductors connected to the PCB end of the wire bonds, the top of the arc formed by the layer is much closer to the active surface of the die.  This, in turn,
allows the bead of encapsulant to have a lower profile relative to the active surface.  With a lower encapsulant bead, the active surface can be brought into closer proximity with another surface without making contact.  For example, the nozzle array on
a printhead IC can be 300 microns to 400 microns from the paper path.


 Preferably, the chip mounting area is raised more than 100 microns relative to the conductor mounting area.  Preferably, the support structure has a step between the chip mounting area and the conductor mounting area.


 Preferably, the plurality of conductors are incorporated into a flexible printed circuit board (flex PCB) with a line of bond pads along an edge closest the die, the bond pads being more than 2 mm from the contacts pads on the die.


 Preferably, the wire bonds are formed from wire with a diameter less than 40 microns and extend less than 100 microns above the active surface of the die.


 Preferably, the wire bonds are plastically deformed such that they extend less than 50 microns above the active surface of the die.


 Preferably, the active surface has functional elements spaced less than 260 microns from the contacts pads of the die.  In a particularly preferred form, the die is an inkjet printhead IC and the functional elements are nozzles through which ink
is ejected.  In some embodiments, the support structure is a liquid crystal polymer (LCP) molding.


 Preferably, the wire bonds are covered in a bead of encapsulant, the bead of encapsulant extending less than 200 microns above the active surface of the die.


 Preferably, the wire bonds are covered in a bead of encapsulant, the bead of encapsulant having a profiled surface that is flat, parallel to and spaced less than 100 microns from the active surface.


 Preferably, the wire bonds are covered in a bead of encapsulant, the bead of encapsulant having a profiled surface that is flat and inclined relative to the active surface.


 Preferably, the wire bonds are covered in a bead of encapsulant, the encapsulant being an epoxy material that is thixotropic when uncured.


 Preferably, the wire bonds are covered in a bead of encapsulant, the encapsulant being an epoxy material has a viscosity greater than 700 cp when uncured.


 In a particular embodiment, the printhead IC is mounted in a printer such that during use the nozzles are less than 100 microns from the paper path.


 According to a second aspect, the present invention provides a method of profiling a wire bond between a contact pad on a die, and a conductor on a supporting structure, the method comprising the steps of:


 electrically connecting the contact pad on the die to the conductor on the supporting structure with a wire bond, the wire bond extending in an arc from the contact pad to the conductor;


 pushing on the wire bond to collapse the arc and plastically deform the wire bond; and,


 releasing the wire bonds such that the plastic deformation maintains the wire bond in a flatter profile shape.


 The strength of the wire bond is known to be relatively small; of the order of 3 to 5 grams force.  However, the Applicant's work has found that the wire bond structure is robust enough to withstand a certain degree of work hardening from
plastic deformation.  The arc of the wire bond can be deformed into a flatter profile without compromising the electrical connection with the PCB.


 Preferably, the die has an active surface that has functional elements, the contacts pad being formed at one edge of the active surface, the wire bond has a diameter less than 40 microns and the arc extends more than 100 microns above the active
surface of the die.


 Preferably, the wire bond is plastically deformed such that it extends less than 50 microns above the active surface of the die.


 Preferably, the wire bond is pushed by engagement with a blade having a rounded edge section for contacting the wire bond.


 Preferably, the method further comprises the steps of:


 applying a bead of encapsulant over the wire bond; and, moving a profiling surface over the active surface to flatten the bead of encapsulant.


 Preferably, the bead of encapsulant having a profiled surface that is flat, parallel to and spaced less than 100 microns from the active surface.


 Optionally, the bead of encapsulant having a profiled surface that is flat and inclined relative to the active surface.


 Preferably, the encapsulant being an epoxy material has a viscosity greater than 700 cp when uncured.  In a particularly preferred form, the encapsulant being an epoxy material that is thixotropic when uncured.


 Preferably, the method further comprises the steps of:


 positioning the profiling surface adjacent and spaced from the active surface to define a gap; and,


 applying the bead of encapsulant onto the contact pads such that one side of the bead contacts the profiling surface and a portion of the bead extends into the gap and onto the active surface.


 Preferably, the active surface has functional elements spaced less than 260 microns from the contacts pads of the die.  In a particularly preferred form, the die is an inkjet printhead IC and the functional elements are nozzles through which ink
is ejected.  In some embodiments, the printhead IC is mounted in a printer such that during use the nozzles are less than 100 microns from the paper path.


 Preferably, the support structure has a chip mounting area and a conductor mounting area, the die is supported on the chip mounting area, and a plurality of electrical conductors at least partially supported on the conductor mounting area
wherein, the chip mounting area is raised relative to the conductor mounting area.


 Preferably, the chip mounting area is raised more than 100 microns relative to the conductor mounting area.  Preferably, the support structure has a step between the chip mounting area and the conductor mounting area.  In some embodiments, the
plurality of conductors are incorporated into a flexible printed circuit board (flex PCB) with a line of bond pads along an edge closest the die, the bond pads being more than 2 mm from the contacts pads on the die.


 Preferably, the support structure is a liquid crystal polymer (LCP) molding.


 According to a third aspect, the present invention provides a method for profiling a bead of encapsulant extending along an edge of a die mounted to a supporting structure, the method comprising the steps of:


 depositing a bead of encapsulant onto wire bonds along the edge of the die;


 positioning a profiling surface over the die at a predetermined spacing from the die;


 moving the profiling surface across the bead before the bead of encapsulant has cured to reshape the bead profile; and,


 curing the bead of encapsulant.


 The invention has found that the encapsulant can be effectively shaped by a profiling surface without stripping the encapsulant from the wire bonds.  The normally convex-shaped upper surface of the encapsulant bead can be pushed to one side of
the bead with the profiling surface.  With a lower encapsulant bead, the active surface can be brought into closer proximity with another surface without making contact.  For example, the nozzle array on a printhead IC can be 300 microns to 400 microns
from the paper path.  By collapsing or flattening the wire bond arcs before applying and profiling a bead of encapsulant, the nozzle array on the printhead IC can be less than 100 microns from the paper path.


 Preferably, the wire bonds extend in an arc from respective contact pads on the die to corresponding conductors on the support structure and the method further comprises the steps of:


 pushing on the wire bonds to plastically deform the wire bonds; and, releasing the wire bond such that plastic deformation maintains the wire bond in a flatter profile shape.


 Preferably, the die has an active surface that has functional elements, the contacts pad being formed at one edge of the active surface, the wire bond has a diameter less than 40 microns and the arc extends more than 100 microns above the active
surface of the die.


 Preferably, the wire bond is plastically deformed such that it extends less than 50 microns above the active surface of the die.


 Preferably, the wire bond is pushed by engagement with a blade having a rounded edge section for contacting the wire bond.


 Preferably, the bead of encapsulant has a profiled surface that is flat, parallel to and spaced less than 100 microns from the active surface.


 Preferably, the bead of encapsulant has a profiled surface that is flat and inclined relative to the active surface.


 Preferably, the encapsulant being an epoxy material has a viscosity greater than 700 cp when uncured.


 Preferably, the encapsulant being an epoxy material that is thixotropic when uncured.


 Preferably, the method further comprises the steps of:


 positioning the profiling surface adjacent and spaced from the active surface to define a gap; and,


 applying the bead of encapsulant onto the contact pads such that one side of the bead contacts the profiling surface and a portion of the bead extends into the gap and onto the active surface.


 Preferably, the active surface has functional elements spaced less than 260 microns from the contacts pads of the die.  In a further preferred form, the die is an inkjet printhead IC and the functional elements are nozzles through which ink is
ejected.  In some embodiments, the printhead IC is mounted in a printer such that during use the nozzles are less than 100 microns from the paper path.


 Preferably, the support structure has a chip mounting area and a conductor mounting area, the die is supported on the chip mounting area, and a plurality of electrical conductors at least partially supported on the conductor mounting area
wherein, the chip mounting area is raised relative to the conductor mounting area.


 Preferably, the chip mounting area is raised more than 100 microns relative to the conductor mounting area.  In a particularly preferred form, the support structure has a step between the chip mounting area and the conductor mounting area.


 Preferably, the plurality of conductors are incorporated into a flexible printed circuit board (flex PCB) with a line of bond pads along an edge closest the die, the bond pads being more than 2 mm from the contacts pads on the die.


 Preferably, the support structure is a liquid crystal polymer (LCP) molding.


 According to a fourth aspect, the present invention provides a method of applying encapsulant to a die mounted to a support structure, the method comprising the steps of:


 providing a die mounted to the support structure, the die having a back surface in contact with the support structure and an active surface opposing the back surface, the active surface having electrical contact pads;


 positioning a barrier proximate the electrical contact pads and spaced from the active surface to define a gap; and,


 depositing a bead of encapsulant onto the electrical contact pads such that one side of the bead contacts the barrier and a portion of the bead extends into the gap and onto the active surface.


 Placing a barrier over the active surface so that it defines a narrow gap allows the geometry of the encapsulant front (the line of contact between the encapsulant and the active surface) can be more closely controlled.  Any variation in the
flowrate of encapsulant from the needle tends to cause bulges or valleys in the height of the bead and or the PCB side of the bead.  The fluidic resistance generated by the gap between the barrier and the active surface means that the amount of
encapsulant that flows into the gap and onto the active surface is almost constant.  The reduced flow variations make the encapsulant front closely correspond to the shape of the barrier.  Greater control of the encapsulant front allows the functional
elements of the active surface of the die to be closer to the contact pads.


 Preferably, the barrier is a profiling surface and the method further comprises the steps of:


 moving the profiling surface over the active surface to flatten the bead of encapsulant.


 Preferably, the method further comprises the steps of:


 prior to depositing the bead of encapsulant, electrically connecting the contact pads on the die to respective conductors on the support structure with wire bonds, the wire bonds each extending in an arc from the contact pad to the conductor;


 pushing on the wire bonds to collapse the arc and plastically deform the wire bond; and,


 releasing the wire bonds such that plastic deformation maintain the wire bonds in a flatter profile shape.


 In a further preferred form, the active surface that has functional elements, the contacts pad being formed at one edge of the active surface, the wire bond has a diameter less than 40 microns and the arc extends more than 100 microns above the
active surface of the die.


 Preferably, the wire bond is plastically deformed such that it extends less than 50 microns above the active surface of the die.  In another preferred form, the wire bond is pushed by engagement with a blade having a rounded edge section for
contacting the wire bond.


 Preferably, the bead of encapsulant has a profiled surface that is flat, parallel to and spaced less than 100 microns from the active surface.


 Optionally, the bead of encapsulant has a profiled surface that is flat and inclined relative to the active surface.


 Preferably, the encapsulant being an epoxy material has a viscosity greater than 700 cp when uncured.


 Preferably, the encapsulant is an epoxy material that is thixotropic when uncured.


 Preferably, the active surface has functional elements spaced less than 260 microns from the contacts pads of the die.  In a particularly preferred form, the die is an inkjet printhead IC and the functional elements are nozzles through which ink
is ejected.  Preferably, the printhead IC is mounted in a printer such that during use the nozzles are less than 100 microns from the paper path.


 Preferably, the support structure has a chip mounting area and a conductor mounting area, the die is supported on the chip mounting area, and a plurality of electrical conductors at least partially supported on the conductor mounting area
wherein, the chip mounting area is raised relative to the conductor mounting area.  In a particularly preferred form, the chip mounting area is raised more than 100 microns relative to the conductor mounting area.  In preferred embodiments, the support
structure has a step between the chip mounting area and the conductor mounting area.  In particularly preferred embodiments, the plurality of conductors are incorporated into a flexible printed circuit board (flex PCB) with a line of bond pads along an
edge closest the die, the bond pads being more than 2 mm from the contacts pads on the die.


 Preferably, the support structure is a liquid crystal polymer (LCP) molding.


 According to a fifth aspect, the present invention provides a method of applying encapsulant to wire bonds between a die and conductors on a supporting substrate, the method comprising the steps of:


 forming a bead of the encapsulant on a profiling surface;


 positioning the profiling surface such that the bead contacts the die; and,


 moving the profiling surface relative to the die to cover the wire bonds with the encapsulant.


 Wiping the encapsulant over the wire bonds with a profiling surface provides control of the encapsulant front as well as the height of the encapsulant relative to the die.  The movement of the profiling surface relative to the die can closely
controlled to shape the encapsulant to a desired form.  Using the example of a printhead die, the encapsulant can be shaped to present an inclined face rising from the nozzle surface to a high point over the wire bonds.  This can be used by the printhead
maintenance facilities to maintain contact pressure on the wiping mechanism.  This is illustrated further below with reference to the drawings.  However, it will be appreciated that the encapsulant can be shaped to have ridges, gutters, grooves and so on
by using a particular shape of profiling surface and relative movement with the die.


 Preferably, the method further comprises the steps of:


 dipping the profiling surface into a reservoir of the encapsulant material to form a the bead of encapsulant material on the profiling surface.


 Optionally, the profiling surface is a blade with a straight edge and the method further comprises the steps of:


 orienting the blade such that the straight edge is lowest and dipping the straight edge into the encapsulant material to form the bead of encapsulant along the straight edge.


 Preferably, the die has an active surface with functional elements and a plurality of contacts pad being formed along one edge for connection with the wire bonds such that the wire bonds extend in an arc from the contacts pads to each of the
conductors respectively, the wire bonds having a diameter less than 40 microns and the arc extends more than 100 microns above the active surface of the die.


 Preferably, the method further comprises the steps of:


 prior to encapsulation, pushing on the wire bonds to collapse the arc and plastically deform the wire bonds; and,


 releasing the wire bonds such that plastic deformation maintains the wire bonds in a flatter profile shape.


 Preferably, the wire bond is plastically deformed such that it extends less than 50 microns above the active surface of the die.  Preferably, the wire bond is pushed by engagement with a blade having a rounded edge section for contacting the
wire bond.


 Preferably, the encapsulant covering the wire bonds has a profiled surface that is flat, parallel to and spaced less than 100 microns from the active surface.


 Preferably, the bead of encapsulant having a profiled surface that is flat and inclined relative to the active surface.


 Preferably, the encapsulant being an epoxy material has a viscosity greater than 700 cp when uncured.


 Preferably, the encapsulant is an epoxy material that is thixotropic when uncured.  Preferably, the functional elements are spaced less than 260 microns from the contacts pads of the die.  In a further preferred form, the die is an inkjet
printhead IC and the functional elements are nozzles through which ink is ejected.  Optionally, the printhead IC is mounted in a printer such that during use the nozzles are less than 100 microns from the paper path.


 Preferably, the support structure has a chip mounting area and a conductor mounting area, the die is supported on the chip mounting area, and a plurality of electrical conductors at least partially supported on the conductor mounting area
wherein, the chip mounting area is raised relative to the conductor mounting area.  In a particularly preferred form, the chip mounting area is raised more than 100 microns relative to the conductor mounting area.  In another preferred form, the support
structure has a step between the chip mounting area and the conductor mounting area.  In a preferred embodiment, the plurality of conductors are incorporated into a flexible printed circuit board (flex PCB) with a line of bond pads along an edge closest
the die, the bond pads being more than 2 mm from the contacts pads on the die.  In some embodiments, the support structure is a liquid crystal polymer (LCP) molding. 

BRIEF DESCRIPTION OF THE DRAWINGS


 Embodiments of the invention will now be described by way of example only with reference to the accompanying drawings, in which:


 FIG. 1 is a schematic representation of a common prior art technique for applying a bead of encapsulant to wire bonds;


 FIG. 2 is a schematic representation of a die mounted to a supporting structure with a chip mounting area raised relative to the flex PCB mounting area;


 FIGS. 3A, 3B and 3C are schematic representations of the encapsulant bead being profiled into a desired shape using a moveable blade;


 FIGS. 4A to 4D are schematic representations of wire bonds being profiled by plastic deformation;


 FIGS. 5A and 5B show the encapsulant bead height reductions for plastically deformed wire bonds;


 FIGS. 6A to 6C show the encapsulant bead being applied to the wire bonds using the profiling blade; and,


 FIGS. 7A and 7B show the profiling blade being used to control the encapsulant bead front on the surface of the die.


DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS


 FIG. 1 shows a common technique used for applying a bead encapsulant to wire bonds.  A die 4 is mounted to a supporting structure 6 adjacent the edge of a flex PCB 8 (flexible printed circuit board).  The die 4 has a line of contact pads 10
along one edge and the flex PCB 8 has corresponding bond pads 12.  Wire bonds 16 extend from the bond pads 10 to the bonds pads 12.  Power and data is transmitted to the die 4 via conductive traces 14 in the flex PCB 8.  This is a simplified
representation of the dies mounted within many electronic devices.  The printhead IC dies mounted to the LCP (liquid crystal polymer) molding to receive print data from an adjacent flex PCB, as described in U.S.  Ser.  No. 11/014,769 incorporated herein
by cross reference, is one example of this type of die mounting arrangement.  The ordinary worker will appreciate that the die may also be mounted directly to a hard PCB with traces formed thereon.


 The wire bonds 16 are covered in a bead on encapsulant 2 to protect and reinforce the bonds.  The encapsulant 2 is dispensed from a discharge needle 18 directly onto the wire bonds 16.  Often the encapsulant bead 2 is three separate beads--two
beads of so-called `dam` encapsulant 20, and one bead of `fill` encapsulant 22.  The dam encapsulant 20 has a higher viscosity than the fill encapsulant 22, and serves to form a channel to hold the fill encapsulant bead.  The height H of the bead 2 above
the die 4 is usually about 500-600 microns.  In most electronic devices, this does not pose a problem.  However, if the die has an active surface that needs to operate in close proximity to another surface, this bead can be an obstruction.


 Elevating the Die Relative to the Flex PCB


 FIG. 2 shows a stepped support structure 6 that has raised the chip mounting area 26 relative to the PCB mounting area 24 (or at least the area mounting the PCB bonds pads 12).  With the die 4 on a raised chip mounting area 26, the arc of the
wire bonds 16 are lower relative to active surface 28 of the die 4.  In fact, the end of the wire bond 16 attached to the contact pad 10 can be the apex of the arc (bearing in mind that the wire bond arc is intended to accommodate some relative movement
of the die and PCB).  When the wire bonds 16 are covered with encapsulant 2, the bead has a reduced height H above the active surface 28 of the die 4.  If the bead of encapsulant 2 uses two beads of dam encapsulant 24 and a fill encapsulant 22, the
positions, volumes and viscosities of the beads need to take the step into account.  Bead heights less than 100 microns are easily achievable, and with additional measures, such as wire arc collapsing and bead profiling (discussed below), bead height of
less than 50 microns are possible.


 With the die 4 raised above the flex PCB 8 by 410 microns, the height of the wire bonds 16 above the die is about 34 microns.  With the die raised 610 microns above the flex PCB, the wire bond height is around 20 microns.  Raising the die even
further has shown little or no further reduction in wire bond height with a step of 710 microns having a wire bond height of around 20 microns.


 Shaping the Encapsulant Bead with a Profiling Blade


 FIGS. 3A to 3C show the encapsulant 2 being profiled with a profiling blade 30.  The support structure 6 is again stepped to reduce the height of the wire bonds 16 above the die 4.  Before the epoxy encapsulant 2 has cured, the profiling blade
30 moves across the die 4 and wire bonds in a predetermined path.  As shown in FIG. 3B, the blade 30 displaces the top of the bead 30 to its flex PCB side to form a flat top surface 32 that is at a significantly reduced height H above the die 4.


 The encapsulant bead 2 may be a plurality of separate beads as shown in FIGS. 1 and 2, or a single bead of one material.  However, for close dimensional control of the profiled encapsulant, the encapsulant materials used should be
thixotropic--that is, once deposited from the discharge needle, or profiled by the blade 30, the material should not flow under its own weight, but rather hold its form until it cures.  This requires the epoxy to have an uncured viscosity greater than
about 700 cp.  A suitable encapsulant is DYMAX 9001-E-v3.1 Chip Encapsulant produced by Dymax Corporation with a viscosity of approximately 800 cp when uncured.  The blade 30 may be ceramic (glass) or metal and preferably about 200 microns thick.


 It will be appreciated that the relative movement of the blade 30 and the die 4 can be precisely controlled.  This allows the height H to be determined by the tolerance of the wire bonding process.  As long as H is greater than the nominal
height of the wire bond arc above the die, plus the maximum tolerance, the encapsulant 2 will cover and protect the wire bonds 16.  With this technique, the height H can be easily reduced from 500-600 microns to less than 300 microns.  If the heights of
the wire bond arcs are also reduced, the height H of the encapsulant bead can be less than 100 microns.  The Applicant uses this technique to profile encapsulant on printhead dies down to a height of 50 microns at its lowest point.  As shown in FIG. 3C,
the lowest point is at the encapsulant front and the blade 30 forms an inclined face 32 in the top of the bead 2.  The inclined face is utilized by the printhead maintenance system when cleaning the paper dust and dried ink from the nozzle face.  This
illustrates the technique's ability to not just reduce the height of the encapsulant bead, but to form a surface that can perform functions other than just encapsulate the wire bonds.  The edge profile of the blade and the path of the blade relative to
the die can be configured to form a surface that has a multitude of shapes for a variety of purposes.


 Plastic Deformation of the Wire Bond Arcs


 FIGS. 4A to 4C show another technique for lowering the profile of wire bonds.  FIG. 4A shows the die 4 connected to the flex PCB 8 via the wire bonds 16.  While the stepped support structure 6 has lowered the height of the wire bond arcs
compared to a flat supporting structure, the wire bonds still have a natural tendency to bow upwards rather than downwards towards the corner of the step.  The wires 16 are typically about 32 microns in diameter and have a pull force of about 3 to 5
grams force.  The pull force is the tensile load necessary to break the connection to the contact pad 10 or the bond pad 12.  Given the fragility of these structures (one of the reasons encapsulant is applied), conventional wisdom is to avoid any contact
between the wire bond arcs and other solid surfaces.


 As shown in FIG. 4B, the arc of the wire bonds 16 can be collapsed by a wire pusher 34.  The wire pusher 34 displaces the wire bond 16 enough to elastically and plastically deform the arc.  The Applicants have shown that contact with the wire
pusher 34 can cause localized work hardening in the wire, but as long as the pushing force is not excessive, it does not break.  The end of the wire pusher 34 is rounded to avoid stress concentration points.  The wire pusher may be a stylus for engaging
single wire bonds or a blade that pushes on multiple wire bonds simultaneously.


 Referring now to FIG. 4C, the wire pusher 34 is retracted and the wire springs back toward its original shape to relieve the elastic deformation.  However, the plastic deformation remains and the wire bond height above the die 4 is much reduced. Testing has shown that an initial wire bond loop height of 200 microns can be reduced to about 45 microns using this technique.  Tests have also shown that the pull strength of the plastically deformed wires remains at about 3 to 5 grams force.


 The collapse of the wire bonds is uncontrolled and leaves the wire bonds somewhat randomly deformed.  However, pushing the wire bonds closer to the die provides more uniformly shaped collapsed wire bonds.  The Applicant's work has shown that
engaging the wires about 200 to 300 microns for the die provides the best results.


 As shown in FIG. 4D, the die 4 and the flex PCB 8 are mounted to a flat support structure 6.  As discussed above, this means the original loop height of the wire bond arc is much higher--approximately 400 microns above the die 4.  Consequently,
the wire has more plastic deformation when the loop is collapsed by the wire pusher.  Even so, the Applicants results show that the residual loop height after pushing is about 20-50 microns.


 FIGS. 5A and 5B show the collapsed wire bonds 16 covered with an encapsulant bead 2.  Even without bead profiling prior to curing, the height H of the bead above the die is much less than the bead necessary to encapsulate the original undeformed
wire loops.


 Applying Encapsulant with Profiling Blade


 FIGS. 6A, 6B and 6C show the application of the encapsulant bead using the profiling blade 30 instead of a discharge needle (see FIGS. 1 and 2).  As previously discussed, the flowrate of encapsulant from the discharge needle can vary and this
gives rise to large variations on the position of the encapsulant front on the active surface of the die 4.  Consequently, any functional elements in the active surface of the die need to be sufficiently spaced from the contacts pads 10 to allow for the
meandering encapsulant front.


 Applying the encapsulant with the profiling blade avoids the problems caused by the flowrate fluctuations from the discharge needle.  As shown in FIG. 6A, the bead of encapsulant 40 can be formed on the profiling blade 30 by simply dipping it
into a reservoir of uncured encapsulant epoxy.  Of course, the bead 40 may also be formed by any other convenient method, such as running the discharge needle along one end of the blade 30.


 FIG. 6B show the blade 30 having been lowered to touch the bead 40 onto the die 4.  When the encapsulant material touches the die surface, it wets and wicks along the surface while remaining pinned to the edge of the blade.  The blade 30 is held
at a predetermined height above the die 4 and moved over the bead 2 to flatten and lower its profile.  The encapsulant displaced from the top of the bead 2 by the blade 30, spreads over the PCB side of the bead 2.  It is not relevant if the encapsulant
spreads further over the PCB than necessary.  As long as the wire bonds 16 and the bonds pads 12 are covered, any additional encapsulant on the PCB 8 surface is not detrimental.


 In FIG. 6C, the wire bond 16 height has been reduced by collapsing the arc in accordance with the techniques discussed above.  As previously discussed, the bead 2 deposited by the discharge needle need not be as big to cover the wire bond 16
once it has been collapsed.  Furthermore, the blade 30 can be brought closer to the die 4 without contacting wire bonds 16 when profiling the encapsulant 2.  Hence the bead profile in FIG. 6C is substantially lower than that of FIG. 6B.


 Encapsulant Front Control


 When the encapsulant material is dispensed from the discharge needle, minor variations in the flowrate can cause the bead to bulge at points of higher flow.  Consequently, the side of the bead that contacts the active surface of the die is not
straight, but has significant perturbations.  These perturbations have to be accommodated between the contact pads and any functional elements on the active surface.  The spacing between the contacts pads and the functional elements consumes valuable
`chip real estate`.  The Applicant has previously developed printhead dies with a spacing of 260 microns between the contact pads and the first row of nozzles.  Better control of the encapsulant front reduces the space between the contacts and
operational elements, and so the overall dimensions of the die.  Hence the design can be more compact and more chips fabricated from the original wafer disc.


 As shown in FIGS. 7A and 7B, the profiling blade 30 is used to control the front 36 of the bead of encapsulant 2.  The blade 30 is positioned over the die 4 to define a gap 42 between its lower edge and the active surface 28.  As the discharge
needle 18 dispenses the encapsulant material 44, it flows onto the active surface, one side of the blade and a fillet of the material extends through the gap 42.  Because of the flow restriction created by the gap, flow variations have a reduced effect
on the dimensions of the fillet that flows through the gap.  Therefore the encapsulant front 36 closely corresponds to the line of the lower edge of the blade 30.


 As shown in FIG. 7B, the profiling blade 30 is already in position to profile the encapsulant bead 2 once it has been dispensed from the discharge needle.  The blade 30 simply moves over the die 4 in a direction away from the nozzles 38.  This
keeps the encapsulant front 36 in place and flattens the profile of the encapsulant bead 2 over the wire bonds 16.


 The invention has been described herein by way of example only.  The ordinary will readily recognize many variations and modifications which do not depart from the spirit and scope of the broad inventive concept.


* * * * *























				
DOCUMENT INFO
Description: CO-PENDING APPLICATIONS The following applications have been filed by the Applicant simultaneously with the present application: TABLE-US-00001 11/860,539 11/860,540 11/860,541 11/860,542 The disclosure of these co-pending applications are incorporated herein by reference.CROSS REFERENCES TO RELATED APPLICATIONS Various methods, systems and apparatus relating to the present invention are disclosed in the following U.S. patents/patent applications filed by the applicant or assignee of the present invention: TABLE-US-00002 6,405,055 6,628,430 7,136,186 10/920,372 7,145,689 7,130,075 7,081,974 7,177,055 7,209,257 7,161,715 7,154,632 7,158,258 7,148,993 7,075,684 7,158,809 11/225,172 11/474,280 11/635,482 11/635,526 11/650,545 11/653,24- 1 11/653,24011,758,648 7,241,005 7,108,437 6,915,140 6,999,206 7,136,198 7,092,130 7,249,108 6,566,858 6,331,946 6,246,970 6,442,525 09/517,384 09/505,951 6,374,354 7,246,098 6,816,968 6,757,832 6,334,190 6,745,331 7,249,109 10/203,559 7,197,642 7,093,139 10/636,26310/636,283 10/866,608 7,210,038 10/902,833 10/940,653 10/942,858 11/706,329 11/757,385 11/758,64- 2 7,170,652 6,967,750 6,995,876 7,099,051 11/107,942 7,193,734 11/209,711 11/599,336 7,095,533 6,914,686 7,161,709 7,099,033 11/003,786 7,258,417 11/003,41811/003,334 11/003,600 11/003,404 11/003,419 11/003,700 7,255,41- 9 11/003,618 7,229,148 7,258,416 11/003,698 11/003,420 6,984,017 11/003,699 11/071,473 11,748,482 11/778,563 11/779,851 11/778,574 11/853,816 11/853,8- 14 11/853,786 11/856,694 11/003,46311/003,701 11/003,683 11/003,614 11/003,7- 02 11/003,684 7,246,875 11/003,617 11/764,760 11,853,777 11/293,800 11/293,80- 2 11/293,801 11/293,808 11/293,809 11/482,975 11/482,970 11/482,968 11/482,9- 72 11/482,971 11/482,969 11/097,266 11/097,26711/685,084 11/685,086 11/685,0- 90 11/740,925 11/763,444 11/763,443 11/518,238 11/518,280 11/518,244 11/518,2- 43 11/518,242 11/084,237 11/084,240 11/084,238 11/357,296 11/357,298 11/357,2- 97 11/246,676 11/246,677 11/246,678 11/246,679