System Design and Test Metrology

SYSTEM DESIGN PROGRAM AND TEST METROLOGY Lead counts of several thousand per chip and test frequencies in the microwave regime challenge current test methodologies. The addition of new functions to provide system on-chip solution poses additional testing challenges. The overall task is to develop test methodologies to address these new requirements. Accurate at-speed test methodology of digital integrated circuits is a critical requirement. Traditional methods utilizing integrated circuit (IC) contact probing technology requires large contact pads incompatible with current IC designs. The development of alternative probing approaches through non-contact and intermittent probing techniques appear very promising. However, to implement these techniques, solving the at-speed test calibration issues is crucial. With the challenges facing designers and the rising costs of development, it is essential to develop accurate testing strategies. Semiconductor Microelectronics and Nanoelectronics Programs 207