Slide 1 - SJTAG - Home

Document Sample
Slide 1 - SJTAG - Home Powered By Docstoc
					            State of the SJTAG Initiative




ITC 2006 Meeting
Bradford G. Van Treuren
Chairman


               SJTAG Fringe Meeting – October 2006
                   ITC 2006, Santa Clara, CA
Outline
   Goal of SJTAG
   Changes in the Core Group
   Direction of the SJTAG Initiative
   Connect and Development Survey
   Activities accomplished since ITC 2005
   Discussion




                    SJTAG Fringe Meeting – October 2006
                        ITC 2006, Santa Clara, CA
                                                          2
The Goal of SJTAG
       The goal for SJTAG is:
       for all variants of XBST and EBST, to define
       the data contents and formats
       communicated:
       between external Test Manager platforms
       and internal Embedded Test Controllers,
       and
       between Embedded Test Controllers and
       the UUTs they serve
       in an open-standard vendor-independent
       and non-proprietary way.

               SJTAG Fringe Meeting – October 2006
                   ITC 2006, Santa Clara, CA
                                                      3
 Changes Coming to Core Group
 The Chairman’s Role

 Goal: Move initiative to a viable standard
 Manage the expertise level of the core group
 Locate new members with relevant expertise for
  issues needing to be addressed
 Fill positions relevant to current needs
 Inspire sub-teams to work on focused issues
 Ensure core group stays focused on the topic
Ideal core group size needs to be 8 – 10 members
  to be effective
Members of core group will change over time
Sub-groups: important driving force behind SJTAG
                       SJTAG Fringe Meeting – October 2006
                           ITC 2006, Santa Clara, CA
                                                             4
 Core Group (September 2006)
 Change of Leadership – Focused Resources


SJTAG Core Group
Brad Van Treuren, Lucent Technologies – Chair
Gunnar Carlsson, Ericsson – Vice Chair
Ben Bennetts, Bennetts Associates – Chair Emeritus
?
?                                    Scan Support Device Vendors
?                                    Test Manager Vendors
?                                    System Company End Users
?
?
?


                     SJTAG Fringe Meeting – October 2006
                         ITC 2006, Santa Clara, CA
                                                             5
Structure of the SJTAG Groups




                       Core Group




                      Review Group


                   Extended Group

             SJTAG Fringe Meeting – October 2006
                 ITC 2006, Santa Clara, CA
                                                   6
How to join
 To join an SJTAG’s extended group: e-mail
 awareness of future events, access to archived
 and new documents:
   – Send e-mail to Brad Van Treuren,
     vantreuren@lucent.com
 To request to join the review group or core group:
  complete the survey from today and indicate your
  desire or email your survey results to Brad Van
  Treuren if you did not attend.
 Presentations available at www.dft.co.uk/SJTAG



                    SJTAG Fringe Meeting – October 2006
                        ITC 2006, Santa Clara, CA
                                                          7
  Targets and Focus (10 Nov 2005 ITC
  Meeting)
 Four main industries
   –   Telecoms
   –   Server/mass storage
   –   Mil/Aero
   –   Automotive
 Need ways of describing:
   – The nature of the Test Manager function: all external, all
     embedded, distributed
   – The access and communication protocols
   – Test flow control and data requirements for test, debug,
     diagnosis, configuration, etc
 Issues:
   – Security
 Initial focus: telecoms, especially MicroTCA/ATCA but not
  exclusively.

                        SJTAG Fringe Meeting – October 2006
                            ITC 2006, Santa Clara, CA
                                                                  8
 Direction of the SJTAG Initiative
 My first attempt at the Scope – Not an official statement
 This standard will develop a methodology for access to test,
  debug, instrument, and emulation features (but not the
  features themselves) of devices via the IEEE 1149.1 Test
  Access Port (TAP) for the board and system (multiple board)
  domains. The elements for this methodology include a
  description language describing the structure of the IEEE
  1149.1 connections in the system; a description of data
  representation formats for test vectors, diagnostic analysis,
  and data logging; and software application programming
  interfaces (APIs) defining command primitives facilitating
  communications between functional command, control, and
  data modules of a Test Manager application.

 Do not use this draft as fact!


                     SJTAG Fringe Meeting – October 2006
                         ITC 2006, Santa Clara, CA
                                                                  9
 Direction of the SJTAG Initiative
 My first attempt at the Purpose – Not an official statement

 There is currently no defined, independent standard for this test
  technology. Each vendor is free in the way of implementing test
  hardware and software functionality on their boards. Without an
  independent standard, testability at the system level is reduced or
  impossible making the test technology in the system less useful for
  users integrating designs from multiple sources – limiting the
  ability to use the test technology in other facets of a product’s life
  cycle beyond manufacturing. In practice, the software used to
  perform test actions is written in an ad-hoc manner across the
  industry to access the IEEE 1149.1 features of the devices
  installed on the various boards of a system. Further,
  communications between remote and embedded hosts managing
  the tests applied to the system under test is non-existent or
  implemented using ad-hoc communications protocols. The
  purpose of the SJTAG initiative is to provide an extension of the
  IEEE 1149.1 standard specifically aimed at the configuration,
  control, management, and representation of the communications
  required at the hierarchical system and board level to perform
  operations on the IEEE 1149.1 Test Access Port (TAP) Controller
  of one or more devices, including multiple core devices, in a
  uniform way across all system modules.
                          SJTAG Fringe Meeting – October 2006
                              ITC 2006, Santa Clara, CA
                                                                           10
Direction of the SJTAG Initiative
 Identification of the issues to address
  – Current issues targeted
    • Diagnostics Support
    • Software Interfaces and API architectures
    • Test Languages
    • System Description
 Develop a Use Case library to baseline
  ideas
 Scope the work to the purpose
               SJTAG Fringe Meeting – October 2006
                   ITC 2006, Santa Clara, CA
                                                     11
  Core Group Focus
 A. G. Lafley, CEO of Proctor & Gamble
   – Changed the company focus
      • From: 10% new product ideas provided by
        customers
      • To: 50% new product ideas provided by customers
   – Reframed the R&D imperative
      • From: “Research and Development”
      • To: “Connect and Development”
   – Now P&G is the most innovative packaged-goods
     marketer
For our core group to be effective, it needs innovative
  ideas and feedback from the extended group to make
  SJTAG a success   SJTAG Fringe Meeting – October 2006
                        ITC 2006, Santa Clara, CA
                                                           12
Purpose of the Survey
 Survey of attendees
  – Provide feedback to core group members on
    the current issues being addressed
  – Provide information regarding the extended
    group members and interest areas in SJTAG
  – Provide demographics for what sectors of
    industry are participating in SJTAG activities
  – To know who we can address with questions for
    a particular audience
  – To better get to know YOU and YOUR NEEDS


                SJTAG Fringe Meeting – October 2006
                    ITC 2006, Santa Clara, CA
                                                      13
Directions for the Survey
   On provided paper
    1. Write the number of the question followed by the
       answer
    2. There is no need to write down the question
    3. Each question following the first set of questions with
       have a single letter answer or a short description if your
       answer falls into the “Other” category
   Example:
    – On Slide: What sector of the business are you affiliated
       with?
       •   A. Telecom
       •   B. Mass Storage/Servers
       •   C. Aerospace/Military/Defense
       •   D. Automotive
       •   E. Tool Provider
       •   F. Other (Please state sector)
    – I would answer:
       •   A
                         SJTAG Fringe Meeting – October 2006
                             ITC 2006, Santa Clara, CA
                                                                    14
Survey Questions
1. What is your name?
Please print your name next to 1. on your paper.

2. What is your email address?
Please print your email address next to 2. on your
   paper.

3. What is the name of your company?
Please print the name of your company next to 3. on
   your paper.


                  SJTAG Fringe Meeting – October 2006
                      ITC 2006, Santa Clara, CA
                                                        15
Survey Questions
4. What sector of the business are you affiliated
   with?
   A.   Telecom
   B.   Mass Storage/Servers
   C.   Aerospace/Military/Defense
   D.   Automotive
   E.   Tool Provider
   F.   Other (Please state sector)




                      SJTAG Fringe Meeting – October 2006
                          ITC 2006, Santa Clara, CA
                                                            16
Survey Questions
5. What is your role with the SJTAG initiative?
   A. Member of core group
   B. Member of extended group
   C. Would like to be a member of the core group because I
      feel I have significant skills needed by the core group
      and am willing to sign up for work
   D. Would like to be a member of the review group
   E. Would like to be a member of the extended group
   F. Just visiting and not interested in joining a group




                     SJTAG Fringe Meeting – October 2006
                         ITC 2006, Santa Clara, CA
                                                                17
Survey Questions
6. Have you read the SJTAG White Paper?
  A. Yes
  B. No


7. An SJTAG Test Manager is:
  A. An external system for generating and managing tests
  B. A hardware interface between the microprocessor and
     the boundary-scan infrastructure on the board
  C. Any combined hardware/software test control system
  D. None of the above



                   SJTAG Fringe Meeting – October 2006
                       ITC 2006, Santa Clara, CA
                                                            18
Survey Questions
8. An SJTAG Test Controller is:
  A. A hardware interface between the
     microprocessor and the boundary-scan
     infrastructure on the board
  B. Some or all of the functionality of a runtime-
     control Test Manager that is built into the UUT
  C. Any combined hardware/software test control
     system
  D. None of the above



                 SJTAG Fringe Meeting – October 2006
                     ITC 2006, Santa Clara, CA
                                                       19
Survey Questions
9. A JTAG Protocol Manager (JTAG-PM) is:
  A. Handshake protocol between a Test Manager
     and a Test Controller
  B. Any combined hardware/software test control
     system
  C. A hardware interface between the
     microprocessor and the boundary-scan
     infrastructure on the board
  D. None of the above



                SJTAG Fringe Meeting – October 2006
                    ITC 2006, Santa Clara, CA
                                                      20
Survey Questions
10.The term EBST stands for:
  A. External Boundary Scan Test
  B. Embedded Boundary Scan Test
  C. Embedded Board Self Test
  D. Enhanced Boundary Scan Test
  E. None of the above




               SJTAG Fringe Meeting – October 2006
                   ITC 2006, Santa Clara, CA
                                                     21
Survey Questions
11.Do you implement Boundary-Scan as a test
   process for your system-level test now?
   A. Yes
   B. No
   C. N/A


12.Do you anticipate the use of Boundary-Scan test
   at the system-level in the future for your systems?
   A. Yes
   B. No
   C. N/A


                  SJTAG Fringe Meeting – October 2006
                      ITC 2006, Santa Clara, CA
                                                         22
Survey Questions
13.I feel SJTAG is:
   A. Predominantly a “Software” issue and is NOT a
      Hardware and Architectural one.
   B. Predominantly a “Hardware” issue and is NOT a
      Software and Architectural one.
   C. Predominantly an “Architectural” issue and is NOT a
      Hardware and Software one.
   D. An even mix of Software, Hardware, and Architectural
      issues.
   E. A even mix of Software and Hardware issues and less
      of an Architectural issue.
   F. An even mix of Software and Architectural issues and
      less of a Hardware issue.
   G. An even mix of Hardware and Architectural issues and
      less of a Software issue.

                    SJTAG Fringe Meeting – October 2006
                        ITC 2006, Santa Clara, CA
                                                             23
Survey Questions
14.I feel that tests need to be managed (e.g. Test
   Manager role)
   A. Entirely within my system
   B. Entirely from an external system
   C. Primarily from within my system with provisions to add
      additional tests on request
   D. Primarily from an external system with provisions to run
      stand-alone within my system

 Tool suppliers: Please indicate what you feel
   your tools need to support


                     SJTAG Fringe Meeting – October 2006
                         ITC 2006, Santa Clara, CA
                                                                 24
Survey Questions
15.What level of diagnostics do you need from an
   SJTAG based system?
   A. GO/NO-GO
   B. Device Pin and Net Failure information
   C. Pin Faults (stuck-at, shorts, opens)


16.Diagnostic analysis needs to be performed:
   A. In the system.
   B. Real-time from a remote computer.
   C. Off-line from a remote computer.



                    SJTAG Fringe Meeting – October 2006
                        ITC 2006, Santa Clara, CA
                                                          25
Survey Questions
17.Do you feel emulation support at the system-level
   is important to you?
   A. Yes
   B. No

18.Do you feel board-level access to instrumentation
   inside devices is important?
   A. Yes
   B. No

19.Do you feel system-level (multiple board) access
   to instrumentation inside devices is important?
   A. Yes
   B. No
                  SJTAG Fringe Meeting – October 2006
                      ITC 2006, Santa Clara, CA
                                                        26
Survey Questions
20.The test language I primarily use for Boundary-
   Scan test application is:
   A. SVF
   B. STAPL
   C. Other (Please state what language that is)




                     SJTAG Fringe Meeting – October 2006
                         ITC 2006, Santa Clara, CA
                                                           27
Activities accomplished since ITC 2005
 May 2006 SJTAG Meeting at EBTW2006
  – Demonstration of an example Test Manager/Test
    Controller coordinated test system
  – Presentation from Test Manager Developer (Adam Ley)
  – Presentation from Test Controller Developer (Peter
    Horwood)
  – Presentation from Motorola and their perspective of
    SJTAG (Stephen Harrison)




                  SJTAG Fringe Meeting – October 2006
                      ITC 2006, Santa Clara, CA
                                                          28
    Demo Shown at EBTW May 2006
            Full                                                     Return
        Diagnostics                                                  format
                      SVF




                                       JTAG Module
                      SVF
                                          Chains                     BVR2      Translator
    Test              STAPL
                                  μP
   Manager                                                                                   BVR
                                              Chain                   Firecron Diagnostics
                  OTHER?
                                             Selector
                                JTAG
                               Controller                                   First level
                                             Gateway                    Interchangeability




ASSET’s ScanWorks
                                                                         Firecron’s BVR file
                              Single board
                              Firecron’s FSC-1000 Controller
                              Ethernet link Meeting – October 2006
                                   SJTAG Fringe
                                       ITC 2006, Santa Clara, CA
                                                                                                   29
Activities accomplished since ITC 2005
 September 2006 SJTAG at BTW2006
  – Demonstration of Lucent embedded device pin
    and net failure reporting from their Lucent Test
    Flow Control Language™ (TFCL™)
  – Presentation of an SJTAG Interface Perspective
  – Discussion on diagnostic representation
    alternatives
  – Discuss relationship between IJTAG and
    SJTAG



                 SJTAG Fringe Meeting – October 2006
                     ITC 2006, Santa Clara, CA
                                                       30
  Layers of the Software for Traditional
  EBST
 Test                  Application
Manager                                                  Apply a set of vectors
                 Test Package and Test                   Capture a set of responses
             Program Flow Control (Ordered
               collection of Test Programs)
                                                         Compare responses to
                                                          known expected values
               Test Programs and Test Step
                                                         Conditionally apply next set

 ?
             Flow Control (Ordered collection
                      Of Test Steps)                      of vectors based on
                      Test Steps
                                                          response result of PASS or
                 (Ordered collection of                   FAIL
               Scan and PIO Operations)

                 1149.1 Scan Operations
               (Represents Leaf Functions
                   as Vector Patterns)                   Fixed set of tests that are
                                                            applied over and over again
  Test              Test Access Port
Controller        Controller Operations

                                SJTAG Fringe Meeting – October 2006
                                    ITC 2006, Santa Clara, CA
                                                                                          31
Interface Boundaries of the Software
          Application

     Test Package Interface
     Test Package and Test                                              Potential
Program Flow Control (Ordered
  collection of Test Programs)                                       Standardization
     Test Program Interface
  Test Programs and Test Step                                          of Interface
Flow Control (Ordered collection
          Of Test Steps)
       Test Step Interface
           Test Steps
      (Ordered collection of                       STAPL
   Scan and PIO Operations)
        Scan Interface                   SVF
    1149.1 Scan Operations
  (Represents Leaf Functions
      as Vector Patterns)
         TAP Interface
       Test Access Port
     Controller Operations
                               SJTAG Fringe Meeting – October 2006
                                   ITC 2006, Santa Clara, CA
                                                                                       32
  SJTAG Data Perspective
  Interconnect ATPG Example – Data Representation
Net – Device Pin – Device Cell – Chain Cell
 Databases store data in tables
 Related information contained on same row
 Can we use a table for diagnostic data storage in EBST?
                     Table: DIAGDATA
        Chain Cell Device Cell Device Pin                  Nets
            5         IC3.5                  IC3.A5        SIG1
           137       IC26.7                 IC26.10        WRITE
           138       IC26.8                 IC26.12         CE

           …           …                        …           …
                     SJTAG Fringe Meeting – October 2006
                         ITC 2006, Santa Clara, CA
                                                                   33
IJTAG Relationship with SJTAG
 IJTAG provides an interface bridge for a device
  package between embedded instruments and the
  external JTAG port of the device package
 IJTAG is an extension of the IEEE 1149.1 standard
  aimed at using the TAP to manage the
  configuration, operation, and collection of data
  from embedded instrumentation circuitry inside a
  device package
 IJTAG defines the data file format necessary to
  describe the instrumentation configuration,
  operation, and data registers that are accessible
  from the TAP for tools to generate commands for
  the instrument (i.e., BSDL for instruments)

                  SJTAG Fringe Meeting – October 2006
                      ITC 2006, Santa Clara, CA
                                                        34
IJTAG Relationship with SJTAG
 SJTAG defines an interface methodology from
  external or embedded test systems to
  boards/blades installed in a system
 SJTAG defines an interface methodology from
  embedded test systems on boards to the device
  packages located locally on the board or daughter
  boards
 SJTAG defines an interface methodology from
  external or embedded test systems to the device
  packages located in system (The IJTAG world)



                  SJTAG Fringe Meeting – October 2006
                      ITC 2006, Santa Clara, CA
                                                        35
IJTAG Relationship with SJTAG
 SJTAG defines the software interfaces
  between layers of the interface methodology
 SJTAG defines the data description formats
  that describe the JTAG interface definition
  for each IEEE 1149.1 architectural module
  in the system




               SJTAG Fringe Meeting – October 2006
                   ITC 2006, Santa Clara, CA
                                                     36
 IJTAG Relationship with IEEE 1500
                                         IJTAG provides a bridge interface
                                          from the device package JTAG
  IJTAG                                   port to embedded instruments
                                         The 1500 wrapper for core
                   Core w/
  Bridge         Instrument


             1500 Wrapper
                                          features are considered one of
                                          the IJTAG specialized
                                          instruments
  TAP                                    The IJTAG bridge interfaces
Controller                                directly with the 1500 wrapper as
                                          the Test Access Mechanism
                                          (TAM) control logic
                                         IJTAG provides the control,
   TAP
                                          operation, and register access to
                                          the 1500 wrapper using the
Interface
                                          1149.1 TAP interface of the
                                          device package

                            SJTAG Fringe Meeting – October 2006
                                ITC 2006, Santa Clara, CA
                                                                              37
Your Turn




    Q&A
            SJTAG Fringe Meeting – October 2006
                ITC 2006, Santa Clara, CA
                                                  38

				
DOCUMENT INFO
Shared By:
Categories:
Tags:
Stats:
views:6
posted:4/23/2011
language:English
pages:38