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About This Document: Photoconductive phenomenon has been observed from the ZnS layer deposition on the quartz substrate. Determination of film thickness of materials has been done through the fitting procedure of optical transmittance obtained from the measurement in visible-NIR (near infrared) spectral region. The optical transmittance of ZnS layer has been observed to have more oscillating from 50 to 70 % over the spectrum for thicker layer of 290 nm. These results show an encouraging work of layer thickness determination for some IR materials through a visible-NIR spectral region. The photoconductive phenomenon has been observed for a variation of temperatures introduced to the sample from 30 to 42 C. The increase of temperature was followed by the increase of output voltage that indicates the increase of current flow due to the photoconductive phenomenon. [PUBLICATION ABSTRACT]

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Tags: Sensors & Transducers, Dec 2010, Photoconductive Phenomenon Observed f..., Soetedjo, Hariyadi, Prabowo, Gunawan S, Feature, Motion pictures, Measurement techniques, Glass substrates, Deposition

Photoconductive Phenomenon Observed from ZnS Layer Deposition for a Potential of IR Sensor Applications

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Sensors & Transducers Journal, Vol. 123, Issue 12, December 2010, pp. 100-105

Sensors & Transducers

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