Ellipsometric Characterization of E. coli and C. xerosis Bacteria
Ellipsometric Characterization of E. coli and C. xerosis Bacteria Films on Micro-crystalline Diamond Films, Nano-composite carbon Film and Carbon Nanotubes (CNT) surfaces. Samelys Rodríguez, Triana Merced, Olga Medina, José Nocua, Kishore Uppireddi, Dr. Javier Avalos, Dr. Gerardo Morell and Dr. Brad Weiner. ABSTRACT We are studying the optical properties of E. coli and C. xerosis bacteria films on Micro-crystalline Diamond ( MCD) Films, Nano-composite carbon Film (NCD)and Carbon Nanotubes (CNT) surfaces. There is a strong interest in understanding the growth behavior of bacteria on various nanostructure media, such as MCD, NCD, and CNT. Previous studies have focused on the bacterial attachment to surfaces, since this strongly influences many industrial and natural processes. Ellipsometric measurements of optical functions as the refraction index, absorption and extinction coefficients are done the growing period of the bacteria. Measurements of bacterial population are simultaneously done on a spectrophotometer , where the absorbance measurements allow us to study the growth curve of the bacteria.