Ellipsometric Characterization of E. coli and C. xerosis Bacteria

							  Ellipsometric Characterization of E. coli and C. xerosis Bacteria
 Films on Micro-crystalline Diamond Films, Nano-composite carbon
           Film and Carbon Nanotubes (CNT) surfaces.
   Samelys Rodríguez, Triana Merced, Olga Medina, José Nocua, Kishore Uppireddi, Dr. Javier
                       Avalos, Dr. Gerardo Morell and Dr. Brad Weiner.



                                       ABSTRACT

       We are studying the optical properties of E. coli and C. xerosis bacteria films on
Micro-crystalline Diamond ( MCD) Films, Nano-composite carbon Film (NCD)and
Carbon Nanotubes (CNT) surfaces. There is a strong interest in understanding the growth
behavior of bacteria on various nanostructure media, such as MCD, NCD, and CNT.
Previous studies have focused on the bacterial attachment to surfaces, since this strongly
influences many industrial and natural processes. Ellipsometric measurements of optical
functions as the refraction index, absorption and extinction coefficients are done the
growing period of the bacteria. Measurements of bacterial population are simultaneously
done on a spectrophotometer , where the absorbance measurements allow us to study the
growth curve of the bacteria.