SURFACE ANALYSIS TECHNIQUES FOR METALLURGICAL APPLICATIONS

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					SURFACE ANALYSIS
TECHNIQUES FOR
METALLURGICAL
APPLICATIONS

   A symposium
   sponsored by ASTM Subcommittee E02.02
   on Surface Analysis of ASTM Committee E-2 on
    Emission Spectroscopy
   AMERICAN SOCIETY FOR
   TESTING AND MATERIALS
   Cleveland, Ohio, 4 March 1975


    ASTM SPECIAL TECHNICAL PUBLICATION 596
    R. S. Carbonara and J. R. Cuthill, editors


   List price $15.00
   04-596000-28




    AMERICAN SOCIETY FOR TESTING AND MATERIALS
    1916 Race Street, Philadelphia, Pa. 19103
 by American Society for Testing and Materials 1976
Library of Congress Catalog Card Number: 75-39442

                       NOTE
      The Society is not responsible, as a body,
          for the statements and opinions
            advanced in this publication.




                  Printed in Baltimore, Md.
                         March 1976
Foreword
   The symposium on Surface Analysis Techniques for Metallurgical
Applications was held in conjunction with the 1975 Pittsburgh Analytical
Conference in Cleveland, Ohio, 4 March 1975. Subcommittee E02.02 on
Surface Analysis of Committee E-2 on Emission Spectroscopy sponsored
the symposium. G. L. Mason, Canada Center for Mineral and Energy
Technology, served as organizing chairman of the symposium. J. R.
Cuthill, National Bureau of Standards, presided as symposium chairman
at the morning session, and A. H. Gillieson, Canada Center for Mineral
and Energy Technology, presided at the afternoon session. R. S.
Carbonara, Battelle Columbus Laboratories, and R. J. Koch, Armco
Steel Corporation, along with Mason and CuthiU, served as the
symposium committee.
                         Related
                     ASTM Publications
Metallography--A Practical Tool for Correlating the Structural Properties
    of Materials, STP 557 (1974), $24.25, 04-557000-28
Manual on Electron Metallography Techniques, STP 547 (1973), $5.25,
    04-547000-28
Electron Beam Microanalysis, STP 506 (1972), $3.75,04-506000-28
                 A Note of Appreciation
                      to Reviewers

  This publication is made possible by the authors and, also, the
unheralded efforts of the reviewers. This body of technical experts whose
dedication, sacrifice of time and effort, and collective wisdom in review-
ing the papers must be acknowledged. The quality level of ASTM
publications is a direct function of their respected opinions. On behalf of
ASTM we acknowledge their contribution with appreciation.

                               A S T M C o m m i t t e e on P u b l i c a t i o n s
            Editorial Staff
      Jane B. Wheeler, Managing Editor
     Helen M. Hoersch, Associate Editor
Charlotte E. DeFranco, Senior Assistant Editor
    Ellen J. McGlinchey, Assistant Editor
Contents

Introduction
Chemical Analysis of Surfaces--R. L. PARK
Some Quantitative Aspects of the X-Ray Photoelectron Spectroscopy
     Analysis of Metal and Oxide Surfaces---N. s. MCINTYRE AND
    M. G. COOK                                                                  18
ESCA Studies of Nickel-Boron Electroless Coatings--R. s. SWINGLE, II,
    C. R. G I N N A R D , A N D G. I. M A D D E N                              28
Composition of Protective Films Formed on Iron and Stainless
    S t e e i s - - - J . B. L U M S D E N A N D R. W . S T A E H L E          39
Quantitative Auger Electron Spectroscopy with Elemental Sensitivity
    Factors---L. E. DAVIS AND A. JOSHI                                         52
Application of Anger Electron Spectroscopy to the Study of Embrlttlement
    in N i e k e l - - J .   M. W A L S H A N D N. P. A N D E R S O N          58
Determination of the Low Temperature Diffusion of Chromium Through
    Gold Films by Ion Scattering Spectroscopy and Auger Electron
    Spectroscopy--G. C. N E L S O N A N D P. H. H O L L O W A Y                68
Comparison of Evaporated Surface Coatings Using the Ion Scattering
    Spectrometer and the Auger Electron Spectrometer--w. D. BINGLE              79
Chemistry of Metal and Alloy Adherends by Secondary Ion Mass
    Spectroscopy, Ion Scattering Spectroscopy, and Auger Electron
    Spectroscopy--w. L. B A U N , N. T. M C D E V I T T , A N D J. S.
    SOLOMON                                                                     86
Errors Observed in Quantitative Ion Microprobe Analysis--D. E.
    N E W B U R Y , K. F. J. H E I N R I C H , A N D R. L. M Y K L E B U S T   101
Small Area Depth Profiling with the Ion Microprobe---T. A. WHATLEY,
    D. J. COMAFORD, J O H N COLBY, A N D P A U L M I L L E R                   114
Analysis of Solids Using A Quadrupole Mass Fiiter--R. D. FRALICK,
    H. J. RODEN, A N D J. R. H I N T H O R N E                                 126
Summary                                                                        141
Index                                                                          145