"SURFACE ANALYSIS TECHNIQUES FOR METALLURGICAL APPLICATIONS"
SURFACE ANALYSIS TECHNIQUES FOR METALLURGICAL APPLICATIONS A symposium sponsored by ASTM Subcommittee E02.02 on Surface Analysis of ASTM Committee E-2 on Emission Spectroscopy AMERICAN SOCIETY FOR TESTING AND MATERIALS Cleveland, Ohio, 4 March 1975 ASTM SPECIAL TECHNICAL PUBLICATION 596 R. S. Carbonara and J. R. Cuthill, editors List price $15.00 04-596000-28 AMERICAN SOCIETY FOR TESTING AND MATERIALS 1916 Race Street, Philadelphia, Pa. 19103 by American Society for Testing and Materials 1976 Library of Congress Catalog Card Number: 75-39442 NOTE The Society is not responsible, as a body, for the statements and opinions advanced in this publication. Printed in Baltimore, Md. March 1976 Foreword The symposium on Surface Analysis Techniques for Metallurgical Applications was held in conjunction with the 1975 Pittsburgh Analytical Conference in Cleveland, Ohio, 4 March 1975. Subcommittee E02.02 on Surface Analysis of Committee E-2 on Emission Spectroscopy sponsored the symposium. G. L. Mason, Canada Center for Mineral and Energy Technology, served as organizing chairman of the symposium. J. R. Cuthill, National Bureau of Standards, presided as symposium chairman at the morning session, and A. H. Gillieson, Canada Center for Mineral and Energy Technology, presided at the afternoon session. R. S. Carbonara, Battelle Columbus Laboratories, and R. J. Koch, Armco Steel Corporation, along with Mason and CuthiU, served as the symposium committee. Related ASTM Publications Metallography--A Practical Tool for Correlating the Structural Properties of Materials, STP 557 (1974), $24.25, 04-557000-28 Manual on Electron Metallography Techniques, STP 547 (1973), $5.25, 04-547000-28 Electron Beam Microanalysis, STP 506 (1972), $3.75,04-506000-28 A Note of Appreciation to Reviewers This publication is made possible by the authors and, also, the unheralded efforts of the reviewers. This body of technical experts whose dedication, sacrifice of time and effort, and collective wisdom in review- ing the papers must be acknowledged. The quality level of ASTM publications is a direct function of their respected opinions. On behalf of ASTM we acknowledge their contribution with appreciation. A S T M C o m m i t t e e on P u b l i c a t i o n s Editorial Staff Jane B. Wheeler, Managing Editor Helen M. Hoersch, Associate Editor Charlotte E. DeFranco, Senior Assistant Editor Ellen J. McGlinchey, Assistant Editor Contents Introduction Chemical Analysis of Surfaces--R. L. PARK Some Quantitative Aspects of the X-Ray Photoelectron Spectroscopy Analysis of Metal and Oxide Surfaces---N. s. MCINTYRE AND M. G. COOK 18 ESCA Studies of Nickel-Boron Electroless Coatings--R. s. SWINGLE, II, C. R. G I N N A R D , A N D G. I. M A D D E N 28 Composition of Protective Films Formed on Iron and Stainless S t e e i s - - - J . B. L U M S D E N A N D R. W . S T A E H L E 39 Quantitative Auger Electron Spectroscopy with Elemental Sensitivity Factors---L. E. DAVIS AND A. JOSHI 52 Application of Anger Electron Spectroscopy to the Study of Embrlttlement in N i e k e l - - J . M. W A L S H A N D N. P. A N D E R S O N 58 Determination of the Low Temperature Diffusion of Chromium Through Gold Films by Ion Scattering Spectroscopy and Auger Electron Spectroscopy--G. C. N E L S O N A N D P. H. H O L L O W A Y 68 Comparison of Evaporated Surface Coatings Using the Ion Scattering Spectrometer and the Auger Electron Spectrometer--w. D. BINGLE 79 Chemistry of Metal and Alloy Adherends by Secondary Ion Mass Spectroscopy, Ion Scattering Spectroscopy, and Auger Electron Spectroscopy--w. L. B A U N , N. T. M C D E V I T T , A N D J. S. SOLOMON 86 Errors Observed in Quantitative Ion Microprobe Analysis--D. E. N E W B U R Y , K. F. J. H E I N R I C H , A N D R. L. M Y K L E B U S T 101 Small Area Depth Profiling with the Ion Microprobe---T. A. WHATLEY, D. J. COMAFORD, J O H N COLBY, A N D P A U L M I L L E R 114 Analysis of Solids Using A Quadrupole Mass Fiiter--R. D. FRALICK, H. J. RODEN, A N D J. R. H I N T H O R N E 126 Summary 141 Index 145