72nd Conference Technical Agenda Selections Technical program with abstracts on www.arftg.org Conference Chair Gating effects in time domain transforms (invited) Tom Ruttan J. Dunsmore, Agilent Technologies Measurements of characteristic impedance of high frequency Intel Corporation cables with TDR +1-503-696-1245 L. Navarro et al, Tyco Electronics firstname.lastname@example.org Comparison between root-impulse-energy and VNA methods for measuring loss on PCBs Local Host M. Harper, et al, NPL-UK Accurate wideband measurement of extreme impedances with Evan Fledell 72nd ARFTG Intel Corporation Microwave a multistate reflectometer A. Lewandowski, et al, Warsaw Univ of Technology, NIST +1-971-214-3770 Statistical measurement techniques for equivalent source email@example.com mismatch of 1.85 mm power splitter T.M. Wallis, et al, NIST, Warsaw Univ of Technolgoy Technical Program Chair Measurement Symposium An envelope domain measurement test setup to acquire linear S-parameters Leonard Hayden E. Zenteno, et al, Univ of Gavle Sweden, Ericsson Cascade Microtech, Inc. Microwave characterization of optically modulated photo- induced switches with a passivation layer using an LSNA +1-503-601-1580 C. Roda Neve, et al, UCL, VUB, KU Leuven Belgium Nonlinear network analysis for modern communication devices Leonard.Hayden@ieee.org Time domain and Exhibits Chair Frequency Domain E. Zenteno, et al, Univ of Gavle Sweden, Ericsson RF waveform metrology for characterization of NL amplifiers Joseph L. Tauritz D.A. Humphreys, et al, NPL, Bristol University UK Measurement Universiteit Twente, The Netherlands Load-pull + NVNA = enhanced X-parameters for PA designs G. Simpson, et al, Maury Microwave, Agilent Technologies +31-70-5177398 A new technique for decreasing the characterization time of firstname.lastname@example.org passive load-pull tuners to maximize measurement throughput C. Roff, et al, Cardiff Univ UK, Freescale Semiconductor Short Course Inexpensive solution to double RF bandwidth of vector sig gen D. Schreurs, et al, KU Leuven, Belgium Dominique Schreurs Red Lion Jantzen Beach Real time spectrum analysis reveals characteristics of frequency-domain signals time domain K.U. Leuven Div. ESAT-TELEMIC, Belgium +32-16-321821 Portland, OR T.C. Hill, Tektronix email@example.com Dec. 9-12, 2008 Spectrum analyzer determination of synthesizer FM accuracy Y.B. Lee, Anritsu Workshops In-situ silicon integrated tuner for on-wafer 60-110 GHz noise Y. Tagro, et al, ST Microelectronics, IEMN France Jean-Pierre Teyssier Information and Registration A new noise parameter method with 100x speed improvement University of Limoges XLIM, France www.arftg.org G. Simpson, et al, Maury Microwave, Agilent Technologies firstname.lastname@example.org Reciprocity-based multiport de-embedding sensitivity analysis J. Martens, Anritsu NVNA Users Forum Traceability of VNA Measurements email@example.com, K. Wong, Agilent Technologies Cal substrate boundary influences on CPW characteristics firstname.lastname@example.org, A. Rumiantsev, et al, Suss Microtec, FBH Germany, Maxim IP or email@example.com Software solutions for linear and NL measurement and cal A. Ferrero, et al, Politecnico di Torino, Italy Invitation Nonlinear Measurement Workshop Schedule of Events The Automatic RF Techniques Group will hold its 72nd The Nonlinear Measurement Workshop theme is “Time- NIST/ARFTG Tuesday Dec. 9 Microwave Measurement Symposium in Portland, domain approaches: issues, solutions, and evaluations.” 8:00 AM – 5:00 PM Microwave Oregon. Join us as we explore Time Domain and Learn about the state-of-the-art of time-domain Measurement Wednesday Dec. 10 Frequency Domain Measurement as reflected in waveform measurement of active devices at Short Course 8:00 AM – 12:20 PM measurement and modeling methodologies for the microwaves. Experts of the field will present load-pull microwave and high-speed electronics communities. solutions, the possible applications of the information Wednesday Dec. 10 The Symposium includes the 72nd Microwave and give insights into accuracy issues and uncertainty Nonlinear Workshop 1:20 PM – 5:00 PM Measurement Conference, a short course, a users’ causes. See the complete agenda at www.arftg.org. forum, and two workshops. Register early!! Thursday Dec. 11 Scheduled Speakers: Kate Remley – NIST, Johannes ARFTG Microwave 8:00 AM – 5:00 PM Location Benedikt – Cardiff University, Basim Noori – Freescale Measurement Semiconductor, Jan Verspecht – JanVerspect b.v.b.a., Conference Friday Dec. 12 Our scenic hotel is just a few miles from downtown Sandro Pinarello – Infineon. 8:00 AM – Noon Portland on an Island in the Columbia River forming the border between the states of Oregon and Washington. It Organizer: Valeria Teppati – Politecnico di Torino Awards Dinner Thursday Evening is a great location with nearby shopping (no sales tax!) River Cruise 6:00 PM – 9:30 PM and many points of interest. Multiport/Differential SI Workshop Red Lion Hotel on the River – Jantzen Beach Friday Dec. 12 The multiport/differential measurement for signal NVNA Users Forum 909 N. Hayden Island Drive 1:15 PM – 3:15 PM integrity workshop addresses the challenging issues of Portland, OR 97217 Phone +1-503-283-4466 high-speed passive interconnects design and Multiport-Differential Fax +1-503-283-4743 characterization. Several topics will be covered, ranging Friday Dec. 12 Measurement Email: firstname.lastname@example.org from crosstalk characterization of Multi-Gigabit BGA 1:15 PM – 5:00 PM Workshop http://tinyurl.com/arftgpdx group code:120672ND packaging to multiport VNA use and applications for All sessions will be at the Red Lion Hotel. backplane analysis and model validation using a new Reserve your hotel room at the Red Lion by November error vector magnitude technique. See the complete Registration agenda at www.arftg.org. 17th to guarantee your lodging. Mention “72nd ARFTG Please see www.arftg.org for on-line registration. Conference” to qualify for the special single/double rate Scheduled Speakers: Andrea Ferrero – Politecnico di of $106 + tax. Registration: Before Nov. 24th After Nov. 24th Turino, Matthew Claudius – Intel, Heidi Barnes – Verigy, NIST/ARFTG Microwave Jack Carrel – Xilinx, Julien Lintignat – XLIM Limoges. Symposium Package $610 $655 Includes conference, dinner cruise, workshops, and Measurement Short Course Workshop organizers: Ali Boudiaf – Focus Microwaves, Mike Resso – Agilent Technologies. NVNA users’ forum We present a 1.5 day microwave measurement tutorial. Complete Package $910 $970 On the first day a broad overview on various microwave NVNA Users’ Forum Includes symposium plus short course (all events) measurement techniques is presented. Topics include Short Course Only $450 $485 connectorized and on-wafer S-parameter measurement, The Nonlinear VNA Users’ Forum program will be power and large-signal measurement, thermal noise and available approximately one-month prior to the Workshop Only $150/wkshp $165/wkshp phase noise measurement, and finally measurement conference on the ARFTG web site. Those with potential agenda items should contact the forum organizers (see Conference Only $445 $470 uncertainty. The second morning focuses on the conference themes. Topics include oscilloscope and contact info on last page). NVNA Users Forum Only $15 $20 time domain network analyzer measurement, as well as signal integrity and power integrity measurement. Spring Conference Submissions Guest Meal $25 $25 Scheduled Instructors: Joel Dunsmore – Agilent; Jon Please see the web site for the spring conference Guest Dinner Cruise $65 $65 Martens – Anritsu; Brett Grossman, Michael Hill – Intel; Call for Papers – Space permitting, priority given to conference goers Dominique Schreurs – KU Leuven; Nick Ridler – NPL; Dylan Williams, Tom Crowley, David Walker, Craig Spring Conference Deadline: Dec. 27th Student/retiree rates – please see www.arftg.org. Nelson, Paul Hale – NIST.
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