Time domain and Frequency Domain by szz56815

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									     72nd Conference Technical
         Agenda Selections

Technical program with abstracts on www.arftg.org                Conference Chair
Gating effects in time domain transforms (invited)               Tom Ruttan
J. Dunsmore, Agilent Technologies
Measurements of characteristic impedance of high frequency
                                                                 Intel Corporation
cables with TDR                                                  +1-503-696-1245
L. Navarro et al, Tyco Electronics                               thomas.g.ruttan@intel.com
Comparison between root-impulse-energy and VNA methods
for measuring loss on PCBs                                       Local Host
M. Harper, et al, NPL-UK
Accurate wideband measurement of extreme impedances with
                                                                 Evan Fledell                                 72nd ARFTG
                                                                 Intel Corporation
                                                                                                              Microwave
a multistate reflectometer
A. Lewandowski, et al, Warsaw Univ of Technology, NIST           +1-971-214-3770
Statistical measurement techniques for equivalent source         evan.m.fledell@intel.com
mismatch of 1.85 mm power splitter
T.M. Wallis, et al, NIST, Warsaw Univ of Technolgoy
                                                                 Technical Program Chair
                                                                                                             Measurement
                                                                                                              Symposium
An envelope domain measurement test setup to acquire linear
S-parameters                                                     Leonard Hayden
E. Zenteno, et al, Univ of Gavle Sweden, Ericsson
                                                                 Cascade Microtech, Inc.
Microwave characterization of optically modulated photo-
induced switches with a passivation layer using an LSNA
                                                                 +1-503-601-1580
C. Roda Neve, et al, UCL, VUB, KU Leuven Belgium
Nonlinear network analysis for modern communication devices
                                                                 Leonard.Hayden@ieee.org
                                                                                                           Time domain and
                                                                 Exhibits Chair
                                                                                                          Frequency Domain
E. Zenteno, et al, Univ of Gavle Sweden, Ericsson
RF waveform metrology for characterization of NL amplifiers      Joseph L. Tauritz
D.A. Humphreys, et al, NPL, Bristol University UK

                                                                                                             Measurement
                                                                 Universiteit Twente, The Netherlands
Load-pull + NVNA = enhanced X-parameters for PA designs
G. Simpson, et al, Maury Microwave, Agilent Technologies         +31-70-5177398
A new technique for decreasing the characterization time of      jltauritz@ieee.org
passive load-pull tuners to maximize measurement throughput
C. Roff, et al, Cardiff Univ UK, Freescale Semiconductor         Short Course
Inexpensive solution to double RF bandwidth of vector sig gen
D. Schreurs, et al, KU Leuven, Belgium
                                                                 Dominique Schreurs                       Red Lion Jantzen Beach
Real time spectrum analysis reveals
characteristics of frequency-domain signals
                                                time    domain
                                                                 K.U. Leuven Div. ESAT-TELEMIC, Belgium
                                                                 +32-16-321821
                                                                                                               Portland, OR
T.C. Hill, Tektronix                                             dominique.schreurs@ieee.org                  Dec. 9-12, 2008
Spectrum analyzer determination of synthesizer FM accuracy
Y.B. Lee, Anritsu                                                Workshops
In-situ silicon integrated tuner for on-wafer 60-110 GHz noise
Y. Tagro, et al, ST Microelectronics, IEMN France                Jean-Pierre Teyssier                     Information and Registration
A new noise parameter method with 100x speed improvement         University of Limoges XLIM, France             www.arftg.org
G. Simpson, et al, Maury Microwave, Agilent Technologies         teyssier@brive.unilim.fr
Reciprocity-based multiport de-embedding sensitivity analysis
J. Martens, Anritsu                                              NVNA Users Forum
Traceability of VNA Measurements                                 john.wood@freescale.com,
K. Wong, Agilent Technologies
Cal substrate boundary influences on CPW characteristics
                                                                 dominique.schreurs@ieee.org,
A. Rumiantsev, et al, Suss Microtec, FBH Germany, Maxim IP       or teyssier@brive.unilim.fr
Software solutions for linear and NL measurement and cal
A. Ferrero, et al, Politecnico di Torino, Italy
Invitation                                                  Nonlinear Measurement Workshop                                 Schedule of Events
The Automatic RF Techniques Group will hold its 72nd        The Nonlinear Measurement Workshop theme is “Time-
                                                                                                                            NIST/ARFTG              Tuesday Dec. 9
Microwave Measurement Symposium in Portland,                domain approaches: issues, solutions, and evaluations.”                                   8:00 AM – 5:00 PM
                                                                                                                             Microwave
Oregon. Join us as we explore Time Domain and               Learn about the state-of-the-art of time-domain
                                                                                                                            Measurement             Wednesday Dec. 10
Frequency Domain Measurement as reflected in                waveform measurement of active devices at                       Short Course             8:00 AM – 12:20 PM
measurement and modeling methodologies for the              microwaves. Experts of the field will present load-pull
microwave and high-speed electronics communities.           solutions, the possible applications of the information
                                                                                                                                                    Wednesday Dec. 10
The Symposium includes the 72nd Microwave                   and give insights into accuracy issues and uncertainty      Nonlinear Workshop
                                                                                                                                                     1:20 PM – 5:00 PM
Measurement Conference, a short course, a users’            causes. See the complete agenda at www.arftg.org.
forum, and two workshops. Register early!!                                                                                                          Thursday Dec. 11
                                                            Scheduled Speakers: Kate Remley – NIST, Johannes             ARFTG Microwave              8:00 AM – 5:00 PM
Location                                                    Benedikt – Cardiff University, Basim Noori – Freescale         Measurement
                                                            Semiconductor, Jan Verspecht – JanVerspect b.v.b.a.,            Conference              Friday Dec. 12
Our scenic hotel is just a few miles from downtown          Sandro Pinarello – Infineon.                                                              8:00 AM – Noon
Portland on an Island in the Columbia River forming the
border between the states of Oregon and Washington. It      Organizer: Valeria Teppati – Politecnico di Torino             Awards Dinner            Thursday Evening
is a great location with nearby shopping (no sales tax!)                                                                    River Cruise              6:00 PM – 9:30 PM
and many points of interest.                                Multiport/Differential SI Workshop
Red Lion Hotel on the River – Jantzen Beach                                                                                                         Friday Dec. 12
                                                            The multiport/differential measurement for signal            NVNA Users Forum
909 N. Hayden Island Drive                                                                                                                            1:15 PM – 3:15 PM
                                                            integrity workshop addresses the challenging issues of
Portland, OR 97217
Phone +1-503-283-4466                                       high-speed     passive    interconnects     design   and    Multiport-Differential
Fax +1-503-283-4743                                         characterization. Several topics will be covered, ranging                               Friday Dec. 12
                                                                                                                           Measurement
Email: info@redlionontheriver.com                           from crosstalk characterization of Multi-Gigabit BGA                                      1:15 PM – 5:00 PM
                                                                                                                             Workshop
http://tinyurl.com/arftgpdx group code:120672ND             packaging to multiport VNA use and applications for
All sessions will be at the Red Lion Hotel.                 backplane analysis and model validation using a new

Reserve your hotel room at the Red Lion by November
                                                            error vector magnitude technique. See the complete          Registration
                                                            agenda at www.arftg.org.
17th to guarantee your lodging. Mention “72nd ARFTG                                                                     Please see www.arftg.org for on-line registration.
Conference” to qualify for the special single/double rate   Scheduled Speakers: Andrea Ferrero – Politecnico di
of $106 + tax.                                                                                                          Registration:        Before Nov. 24th After Nov. 24th
                                                            Turino, Matthew Claudius – Intel, Heidi Barnes – Verigy,
NIST/ARFTG Microwave                                        Jack Carrel – Xilinx, Julien Lintignat – XLIM Limoges.      Symposium Package         $610              $655
                                                                                                                          Includes conference, dinner cruise, workshops, and
Measurement Short Course                                    Workshop organizers: Ali Boudiaf – Focus Microwaves,
                                                            Mike Resso – Agilent Technologies.
                                                                                                                          NVNA users’ forum

We present a 1.5 day microwave measurement tutorial.                                                                    Complete Package        $910                $970
On the first day a broad overview on various microwave      NVNA Users’ Forum                                             Includes symposium plus short course (all events)
measurement techniques is presented. Topics include                                                                     Short Course Only          $450             $485
connectorized and on-wafer S-parameter measurement,         The Nonlinear VNA Users’ Forum program will be
power and large-signal measurement, thermal noise and       available approximately one-month prior to the              Workshop Only            $150/wkshp      $165/wkshp
phase noise measurement, and finally measurement            conference on the ARFTG web site. Those with potential
                                                            agenda items should contact the forum organizers (see       Conference Only            $445             $470
uncertainty. The second morning focuses on the
conference themes. Topics include oscilloscope and          contact info on last page).
                                                                                                                        NVNA Users Forum Only       $15              $20
time domain network analyzer measurement, as well as
signal integrity and power integrity measurement.           Spring Conference Submissions                               Guest Meal                  $25              $25

Scheduled Instructors: Joel Dunsmore – Agilent; Jon         Please see the web site for the spring conference           Guest Dinner Cruise        $65               $65
Martens – Anritsu; Brett Grossman, Michael Hill – Intel;    Call for Papers –                                            Space permitting, priority given to conference goers
Dominique Schreurs – KU Leuven; Nick Ridler – NPL;
Dylan Williams, Tom Crowley, David Walker, Craig            Spring Conference Deadline: Dec. 27th                       Student/retiree rates – please see www.arftg.org.

Nelson, Paul Hale – NIST.

								
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