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72nd Conference Technical
Agenda Selections
Technical program with abstracts on www.arftg.org Conference Chair
Gating effects in time domain transforms (invited) Tom Ruttan
J. Dunsmore, Agilent Technologies
Measurements of characteristic impedance of high frequency
Intel Corporation
cables with TDR +1-503-696-1245
L. Navarro et al, Tyco Electronics thomas.g.ruttan@intel.com
Comparison between root-impulse-energy and VNA methods
for measuring loss on PCBs Local Host
M. Harper, et al, NPL-UK
Accurate wideband measurement of extreme impedances with
Evan Fledell 72nd ARFTG
Intel Corporation
Microwave
a multistate reflectometer
A. Lewandowski, et al, Warsaw Univ of Technology, NIST +1-971-214-3770
Statistical measurement techniques for equivalent source evan.m.fledell@intel.com
mismatch of 1.85 mm power splitter
T.M. Wallis, et al, NIST, Warsaw Univ of Technolgoy
Technical Program Chair
Measurement
Symposium
An envelope domain measurement test setup to acquire linear
S-parameters Leonard Hayden
E. Zenteno, et al, Univ of Gavle Sweden, Ericsson
Cascade Microtech, Inc.
Microwave characterization of optically modulated photo-
induced switches with a passivation layer using an LSNA
+1-503-601-1580
C. Roda Neve, et al, UCL, VUB, KU Leuven Belgium
Nonlinear network analysis for modern communication devices
Leonard.Hayden@ieee.org
Time domain and
Exhibits Chair
Frequency Domain
E. Zenteno, et al, Univ of Gavle Sweden, Ericsson
RF waveform metrology for characterization of NL amplifiers Joseph L. Tauritz
D.A. Humphreys, et al, NPL, Bristol University UK
Measurement
Universiteit Twente, The Netherlands
Load-pull + NVNA = enhanced X-parameters for PA designs
G. Simpson, et al, Maury Microwave, Agilent Technologies +31-70-5177398
A new technique for decreasing the characterization time of jltauritz@ieee.org
passive load-pull tuners to maximize measurement throughput
C. Roff, et al, Cardiff Univ UK, Freescale Semiconductor Short Course
Inexpensive solution to double RF bandwidth of vector sig gen
D. Schreurs, et al, KU Leuven, Belgium
Dominique Schreurs Red Lion Jantzen Beach
Real time spectrum analysis reveals
characteristics of frequency-domain signals
time domain
K.U. Leuven Div. ESAT-TELEMIC, Belgium
+32-16-321821
Portland, OR
T.C. Hill, Tektronix dominique.schreurs@ieee.org Dec. 9-12, 2008
Spectrum analyzer determination of synthesizer FM accuracy
Y.B. Lee, Anritsu Workshops
In-situ silicon integrated tuner for on-wafer 60-110 GHz noise
Y. Tagro, et al, ST Microelectronics, IEMN France Jean-Pierre Teyssier Information and Registration
A new noise parameter method with 100x speed improvement University of Limoges XLIM, France www.arftg.org
G. Simpson, et al, Maury Microwave, Agilent Technologies teyssier@brive.unilim.fr
Reciprocity-based multiport de-embedding sensitivity analysis
J. Martens, Anritsu NVNA Users Forum
Traceability of VNA Measurements john.wood@freescale.com,
K. Wong, Agilent Technologies
Cal substrate boundary influences on CPW characteristics
dominique.schreurs@ieee.org,
A. Rumiantsev, et al, Suss Microtec, FBH Germany, Maxim IP or teyssier@brive.unilim.fr
Software solutions for linear and NL measurement and cal
A. Ferrero, et al, Politecnico di Torino, Italy
Invitation Nonlinear Measurement Workshop Schedule of Events
The Automatic RF Techniques Group will hold its 72nd The Nonlinear Measurement Workshop theme is “Time-
NIST/ARFTG Tuesday Dec. 9
Microwave Measurement Symposium in Portland, domain approaches: issues, solutions, and evaluations.” 8:00 AM – 5:00 PM
Microwave
Oregon. Join us as we explore Time Domain and Learn about the state-of-the-art of time-domain
Measurement Wednesday Dec. 10
Frequency Domain Measurement as reflected in waveform measurement of active devices at Short Course 8:00 AM – 12:20 PM
measurement and modeling methodologies for the microwaves. Experts of the field will present load-pull
microwave and high-speed electronics communities. solutions, the possible applications of the information
Wednesday Dec. 10
The Symposium includes the 72nd Microwave and give insights into accuracy issues and uncertainty Nonlinear Workshop
1:20 PM – 5:00 PM
Measurement Conference, a short course, a users’ causes. See the complete agenda at www.arftg.org.
forum, and two workshops. Register early!! Thursday Dec. 11
Scheduled Speakers: Kate Remley – NIST, Johannes ARFTG Microwave 8:00 AM – 5:00 PM
Location Benedikt – Cardiff University, Basim Noori – Freescale Measurement
Semiconductor, Jan Verspecht – JanVerspect b.v.b.a., Conference Friday Dec. 12
Our scenic hotel is just a few miles from downtown Sandro Pinarello – Infineon. 8:00 AM – Noon
Portland on an Island in the Columbia River forming the
border between the states of Oregon and Washington. It Organizer: Valeria Teppati – Politecnico di Torino Awards Dinner Thursday Evening
is a great location with nearby shopping (no sales tax!) River Cruise 6:00 PM – 9:30 PM
and many points of interest. Multiport/Differential SI Workshop
Red Lion Hotel on the River – Jantzen Beach Friday Dec. 12
The multiport/differential measurement for signal NVNA Users Forum
909 N. Hayden Island Drive 1:15 PM – 3:15 PM
integrity workshop addresses the challenging issues of
Portland, OR 97217
Phone +1-503-283-4466 high-speed passive interconnects design and Multiport-Differential
Fax +1-503-283-4743 characterization. Several topics will be covered, ranging Friday Dec. 12
Measurement
Email: info@redlionontheriver.com from crosstalk characterization of Multi-Gigabit BGA 1:15 PM – 5:00 PM
Workshop
http://tinyurl.com/arftgpdx group code:120672ND packaging to multiport VNA use and applications for
All sessions will be at the Red Lion Hotel. backplane analysis and model validation using a new
Reserve your hotel room at the Red Lion by November
error vector magnitude technique. See the complete Registration
agenda at www.arftg.org.
17th to guarantee your lodging. Mention “72nd ARFTG Please see www.arftg.org for on-line registration.
Conference” to qualify for the special single/double rate Scheduled Speakers: Andrea Ferrero – Politecnico di
of $106 + tax. Registration: Before Nov. 24th After Nov. 24th
Turino, Matthew Claudius – Intel, Heidi Barnes – Verigy,
NIST/ARFTG Microwave Jack Carrel – Xilinx, Julien Lintignat – XLIM Limoges. Symposium Package $610 $655
Includes conference, dinner cruise, workshops, and
Measurement Short Course Workshop organizers: Ali Boudiaf – Focus Microwaves,
Mike Resso – Agilent Technologies.
NVNA users’ forum
We present a 1.5 day microwave measurement tutorial. Complete Package $910 $970
On the first day a broad overview on various microwave NVNA Users’ Forum Includes symposium plus short course (all events)
measurement techniques is presented. Topics include Short Course Only $450 $485
connectorized and on-wafer S-parameter measurement, The Nonlinear VNA Users’ Forum program will be
power and large-signal measurement, thermal noise and available approximately one-month prior to the Workshop Only $150/wkshp $165/wkshp
phase noise measurement, and finally measurement conference on the ARFTG web site. Those with potential
agenda items should contact the forum organizers (see Conference Only $445 $470
uncertainty. The second morning focuses on the
conference themes. Topics include oscilloscope and contact info on last page).
NVNA Users Forum Only $15 $20
time domain network analyzer measurement, as well as
signal integrity and power integrity measurement. Spring Conference Submissions Guest Meal $25 $25
Scheduled Instructors: Joel Dunsmore – Agilent; Jon Please see the web site for the spring conference Guest Dinner Cruise $65 $65
Martens – Anritsu; Brett Grossman, Michael Hill – Intel; Call for Papers – Space permitting, priority given to conference goers
Dominique Schreurs – KU Leuven; Nick Ridler – NPL;
Dylan Williams, Tom Crowley, David Walker, Craig Spring Conference Deadline: Dec. 27th Student/retiree rates – please see www.arftg.org.
Nelson, Paul Hale – NIST.
