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					WORKSHOP                                     “Application of Modern Analytical Techniques 2007”
■ Venue : Multi Purpose Hall, Level 7, Data Storage Institute, 5 Engineering Drive 1, Singapore 117608 ■ Date : 3rd August, 2007 ■ Registration @ 10:00am



Speakers                      WORKSHOP PROGRAM
■ Dr. John S. Hammond
                              1000 – 1020                                                     1345 – 1440
  ULVAC-PHI, Inc              Registration                                                    Thermal Desorption with GC/MS for Trace Organic
                                                                                              Contaminants Detection
■ Dr. Yong Ching Tung         1020 – 1030                                                     Mr. Alfred Chou
  PerkinElmer Singapore       Welcome speech                                                  Greater China Chrom Product Leader,
  Pte Ltd                                                                                     PerkinElmer Taiwan Corporation
                              1030 – 1115
                              Auger Spectroscopy: New Opportunities for                       1440 – 1515
■ Dr. Noriaki Sanada          Nanotechnology Compositional Analysis                           Tea break
  ULVAC-PHI, Inc              Dr. John S. Hammond
                              Fellow, ULVAC-PHI, Inc.                                         1515 – 1615
■ Mr. Alfred Chou                                                                             Transmission electron microscopy
                              1115 – 1150                                                     Dr. Chris Boothroyd
  PerkinElmer Taiwan          Measurement of Trace Metallic Contaminants in                   Associate Principal Scientist,
  Corporation                 Electronic-grade Gases by ICP-MS                                IMRE
                              Dr. Yong Ching Tung
■ Dr. Chris Boothroyd         Director (Inorganic Product),                                   1615 – 1700
  IMRE                        PerkinElmer Singapore Pte Ltd                                   Infrared Imaging of Contaminants
                                                                                              Dr. Teo Wei Boon
                              1150 – 1300                                                     Molecular Spectroscopy Product Specialist,
■ Dr. Teo Wei Boon            Lunch                                                           PerkinElmer Singapore Pte Ltd
  PerkinElmer Singapore
  Pte Ltd                     1300 – 1345                                                     1700 – 1715
                              Expanded applications of XPS and TOF-SIMS                       Closing speech
                              using C60 ion beam sputtering
                              Dr. Noriaki Sanada,
                              Staff Manager (Analytical Laboratory),
                              ULVAC-PHI, Inc.




■ Please confirm your attendance by 27 July, 2007. To register, please visit www.dsi.a-star.edu.sg.
WORKSHOP                                     “Application of Modern Analytical Techniques 2007”
■ Venue : Multi Purpose Hall, Level 7, Data Storage Institute, 5 Engineering Drive 1, Singapore 117608 ■ Date : 3rd August, 2007 ■ Registration @ 10:00am



Speakers                      Abstract                                                         Biography
                              Auger Spectroscopy: New Opportunities for                        Dr. John S. Hammond
■ Dr. John S. Hammond         Nanotechnology Compositional Analysis                            Fellow, ULVAC-PHI, Inc
  ULVAC-PHI, Inc
                              Recent advances in electron optics have improved the
                                                                                               John received his Ph. D. in Analytical Chemistry in 1976 from
                              performance of many field emission electron microscopy
■ Dr. Yong Ching Tung                                                                          Purdue University in West Lafayette, Indiana. U. S. A.
                              techniques to visualize nanotechnology products. The analyst
                                                                                               In 1976, John joined the Ford Motor Company Scientific
  PerkinElmer Singapore       is now faced with the challenge to provide elemental and
                                                                                               Research Laboratory to conduct surface analysis research in
  Pte Ltd                     chemical information for these nanophase materials. This is
                                                                                               catalysis, corrosion and polymer-metal adhesion.
                              becoming increasingly important for process research and
                                                                                               In 1980, John joined the Physical Electronics Division of
                              development as well as failure analysis in the semiconductor,
■ Dr. Noriaki Sanada                                                                           Perkin-Elmer Corporation. John has held a number of
                              magnetic media and optical display industries. Compositional
  ULVAC-PHI, Inc                                                                               management positions in the Analytical Laboratory,
                              analysis is also important for many new basic research
                                                                                               Marketing, and Sales Departments. John has also been the
                              programs in nanotechnology.
                                                                                               Product Director for Physical Electronics XPS and TOF-SIMS
■ Mr. Alfred Chou             The Scanning Auger Nanoprobe is a powerful compositional         instrumentation. These activities have supported the market
  PerkinElmer Taiwan          analysis technique for these nanophases. The Auger spectra       expansion of XPS, Auger, and Time of Fight SIMS by
  Corporation                 are measured from a sampling depth less than 5 nm. When          improving product performance and product yield in the
                              coupled with an incident electron beam as small as 6 nm in       electronics, data storage and semiconductor industries.
■ Dr. Chris Boothroyd         diameter and a system designed for long term stability,          John has published 34 papers and has lectured extensively
                              quantitative elemental information with spatial resolution       worldwide on the applications of surface analysis techniques.
  IMRE                        better than 10 nm can be acquired. For many materials,           John is currently a Fellow with ULVAC-PHI, Inc. in Chigasaki,
                              chemical information can also be obtained with chemometric       Japan and Physical Electronics, Inc. in Chanhassen,
■ Dr. Teo Wei Boon            analysis of the Auger spectra. By alternating low impact         Minnesota, USA.
  PerkinElmer Singapore       voltage ion beam sputtering and Auger analyses,
  Pte Ltd                     compositional depth profiles for multilayer structures up to 1
                              micron in depth can be obtained.
                              The unique system design of the Scanning Auger Nanoprobe
                              will first be discussed. Examples will then be shown for
                              silicon and III-V materials where the Scanning Auger
                              Nanoprobe can uniquely define the composition of nanophase
                              structures and defects that are important to advanced
                              semiconductor technology and nanotechnology materials
                              analysis.


■ Please confirm your attendance by 27 July, 2007. To register, please visit www.dsi.a-star.edu.sg.
WORKSHOP                                     “Application of Modern Analytical Techniques 2007”
■ Venue : Multi Purpose Hall, Level 7, Data Storage Institute, 5 Engineering Drive 1, Singapore 117608 ■ Date : 3rd August, 2007 ■ Registration @ 10:00am



Speakers                      Abstract                                                         Biography
■ Dr. John S. Hammond         Measurement of Trace Metallic Contaminants in                    Dr. Yong Ching Tung
  ULVAC-PHI, Inc              Electronic-grade Gases by ICP-MS                                 Director (Inorganic Product), PerkinElmer Singapore Pte Ltd

■ Dr. Yong Ching Tung         A simple gas sampling device has been designed with the          Yong Ching Tung is the AA Product Manager for PerkinElmer
                              appropriate purge facilities that eliminate any carry-over and   Inc. based in Singapore. Prior to joining PerkinElmer in 1990
  PerkinElmer Singapore
                              memory effect in the accurate and precise extraction and         as a Product Specialist for Atomic Spectroscopy, he was the
  Pte Ltd                     measurement of the trace and ultra-trace metallic                Assistant Manager in the Chemical Technology Department
                              contaminants in high purity gases that are used in the           of the Material Characterization Division of the then
■ Dr. Noriaki Sanada          electronics and semiconductor industries.                        Singapore Institute of Standards and Industrial
  ULVAC-PHI, Inc                                                                               Research(SISIR), now the TUV-Productivity and Standards
                              Some typical examples are given on how these contaminants        Boards(TUV-PSB), Singapore. In his present position, he is
                              can be measured using a high performance ICP-MS system.          responsible for managing the AA product line and providing
■ Mr. Alfred Chou                                                                              guidance and support to the Singapore R&D and Operations
  PerkinElmer Taiwan                                                                           teams. He is the key contact for the KOSEA, Indian and
  Corporation                                                                                  Greater China field organizations for all aspects of the
                                                                                               inorganic business. Prior to his present capacity, he was the
■ Dr. Chris Boothroyd                                                                          Director of Inorganic Products, Pacific Rim territory, when he
                                                                                               provided in the region the before-, during- and after-sales
  IMRE                                                                                         technical support of all the Inorganic Products including the
                                                                                               Atomic Absorption Spectrometry(AAS), Inductively Coupled
■ Dr. Teo Wei Boon                                                                             Plasma Optical Emission Spectrometry(ICP-OES) and
  PerkinElmer Singapore                                                                        Inductively Coupled Plasma Mass Spectrometry(ICP-MS) and
  Pte Ltd                                                                                      its complementary sample preparation products.




■ Please confirm your attendance by 27 July, 2007. To register, please visit www.dsi.a-star.edu.sg.
WORKSHOP                                     “Application of Modern Analytical Techniques 2007”
■ Venue : Multi Purpose Hall, Level 7, Data Storage Institute, 5 Engineering Drive 1, Singapore 117608 ■ Date : 3rd August, 2007 ■ Registration @ 10:00am



Speakers                      Abstract                                                            Biography
■ Dr. John S. Hammond         Expanded applications of XPS and TOF-SIMS using C60                 Dr. Noriaki Sanada
  ULVAC-PHI, Inc              ion beam sputtering                                                 Staff Manager (Analytical Laboratory), ULVAC-PHI, Inc.

■ Dr. Yong Ching Tung         Chemical analysis of buried interface is of great interest by       Dr. Sanada received his doctoral degree in Science in 1998
                              material scientists. On the contrary, sputter etching generally     from Tohoku University in Japan.
  PerkinElmer Singapore
                              causes severe degradation in organic materials. Actually, it is     In 1987, Dr. Sanada joined the Analysis Science Laboratory in
  Pte Ltd                     well known to be difficult for scientists to analyze chemistry of   Mitsubishi Chemical Incorporated, Central Research Facility,
                              sub-surface region of organic materials for surface analysis        where he used a broad range of analytical techniques,
■ Dr. Noriaki Sanada          techniques such as XPS and TOF-SIMS.                                including the major surface analysis techniques, for materials
  ULVAC-PHI, Inc                                                                                  characterization.
                              Recently, buckminsterfullerene (C60) ion beam sputtering is
                              revealed to be capable of depth profiling with extremely low        Dr. Sanada joined Shizuoka University from 1991 to 2001,
■ Mr. Alfred Chou             damage in organic materials. We have examined the optimal           where he studied the surface chemistry of compound
  PerkinElmer Taiwan          sputtering conditions to reduce the degradation. As a result, a     semiconductors and oxide superconductors.
  Corporation                 high energy (>10kV) C60 ion beam and oblique injection              In 2001, Dr. Sanada transferred to ULVAC-PHI Inc as a
                              reduces the damage and carbon residue which would                   laboratory scientist. Dr. Sanada is currently the Staff Manager
■ Dr. Chris Boothroyd         interfere chemical depth profiling.                                 of the Analytical Laboratory for ULVAC-PHI, INC. in
                                                                                                  Chigasaki, Japan.
  IMRE                        In this talk, expanded applications of XPS and TOF-SIMS
                              analysis of organics and polymers after C60 ion beam
■ Dr. Teo Wei Boon            sputtering will be demonstrated. For many polymers, the high
  PerkinElmer Singapore       energy resolution XPS spectra following C60 ion beam
  Pte Ltd                     exposure showed a constant elemental and functional group
                              stoichiometry. The higher sensitivity of TOF-SIMS analysis of
                              those materials allows an examination of more subtle
                              changes induced by the C60 ion beam not observed in the
                              XPS analysis.




■ Please confirm your attendance by 27 July, 2007. To register, please visit www.dsi.a-star.edu.sg.
WORKSHOP                                    “Application of Modern Analytical Techniques 2007”
■ Venue : Multi Purpose Hall, Level 7, Data Storage Institute, 5 Engineering Drive 1, Singapore 117608 ■ Date : 3rd August, 2007 ■ Registration @ 10:00am



Speakers                      Abstract                                                        Biography
■ Dr. John S. Hammond         Thermal Desorption with GC/MS for Trace Organic                 Mr. Alfred Chou
  ULVAC-PHI, Inc              Contaminants Detection                                          Product Leader, Greater China Chrom Product Leader,
                                                                                              PerkinElmer Taiwan Corporation
■ Dr. Yong Ching Tung         Thermal desorption is a useful technique to
                              collect/concentrate trace organic contaminants. Together with   Alfred Chou, currently based in Taiwan, has been with
  PerkinElmer Singapore
                              Gas chromatography/Mass spectrometry, they can be               PerkinElmer for 12 years and is now responsible for our GC,
  Pte Ltd                     positively identified and quantified. We present a trend in     HPLC and Chrom Data System products for the China,
                              using such technique in various occasions to check organic      HongKong and Taiwan(so called Greater China region) As
■ Dr. Noriaki Sanada          contaminants from either material out-gassing or surface        Greater China Chrom product Leader. He provide the
  ULVAC-PHI, Inc              contamination. Various new developments also help to widen      before-, during- and after-sales technical support of all the
                              their applicability, preserve data integrity and make it more   Chromatographic Products including the Gas
                              easy to use. This technique and examples are discussed in       Chromatography(GC), Gas Chromatography/Mass
■ Mr. Alfred Chou             this talk.                                                      Spectrometry(GC-MS), and Liquid Chromatography and
  PerkinElmer Taiwan                                                                          their complementary sample preparation products such as
  Corporation                                                                                 Headspace sampler and thermal desorption.
                                                                                              Prior to his current position, he took the responsibility for all
■ Dr. Chris Boothroyd                                                                         the performance of PerkinElmer’s Gas Chromatography and
                                                                                              Liquid Chromatography products for the Pacific Rim territory
  IMRE                                                                                        for 4 years. Prior to that, he was a sales specialist for
                                                                                              Chromatography products for 5 years. Before that, he was a
■ Dr. Teo Wei Boon                                                                            technical specialist for all chrom products. Before join
  PerkinElmer Singapore                                                                       PerkinElmer, he worked for Saintech Inc., which was the
  Pte Ltd                                                                                     sole distributor for Hewlett Packard analytical instruments in
                                                                                              Taiwan for 6 years. He was initially responsible training and
                                                                                              technical support for all analytical products and then transfer
                                                                                              to sales for 2 yrars, giving him over 18 years of experience
                                                                                              in the analytical instrument market.
                                                                                              He earned his Bachelor of Science in
                                                                                              Pharmacy from Kaohsiung Medical College
                                                                                              In 1985 and an MSc (with honours) from
                                                                                              National Defence Medical Center major in
                                                                                              Pharmacology in Taipei, Taiwan in 1987.

■ Please confirm your attendance by 27 July, 2007. To register, please visit www.dsi.a-star.edu.sg.
WORKSHOP                                     “Application of Modern Analytical Techniques 2007”
■ Venue : Multi Purpose Hall, Level 7, Data Storage Institute, 5 Engineering Drive 1, Singapore 117608 ■ Date : 3rd August, 2007 ■ Registration @ 10:00am



Speakers                      Abstract                                                            Biography
■ Dr. John S. Hammond         Transmission electron microscopy                                    Dr. Chris Boothroyd
  ULVAC-PHI, Inc                                                                                  Associate Principal Scientist, IMRE
                              Transmission electron microscopy is an important technique
■ Dr. Yong Ching Tung         for characterizing materials on the nanometer scale. It has         Dr Chris Boothroyd is a Principal Scientist in IMRE with over
                              been used to study a large variety of materials problems,           20 years experience in electron microscopy. He began his
  PerkinElmer Singapore
                              ranging from semiconductor interfaces and nano particles to         career at the Department of Materials Science and
  Pte Ltd                     crystal structure determination. Over the years the best            Metallurgy, University of Cambridge and moved to Singapore
                              resolution for conventional microscopes has improved down           in 2002. His recent research interests lie in improving and
■ Dr. Noriaki Sanada          to about 0.17 nm and is heading towards 0.1nm, which is at          developing new high-resolution TEM techniques.
  ULVAC-PHI, Inc              point where many important crystal structures can be imaged
                              directly.
■ Mr. Alfred Chou             In this talk I will give an introduction to transmission electron
  PerkinElmer Taiwan          microscopy and describe some of the applications of electron
  Corporation                 microscopy that I have been particularly involved with.
                              Examples that will be discussed are novel forms of
■ Dr. Chris Boothroyd         nanotubes, imaging single tungsten atoms and quantitative
                              microscopy.
  IMRE

■ Dr. Teo Wei Boon
  PerkinElmer Singapore
  Pte Ltd




■ Please confirm your attendance by 27 July, 2007. To register, please visit www.dsi.a-star.edu.sg.
WORKSHOP                                     “Application of Modern Analytical Techniques 2007”
■ Venue : Multi Purpose Hall, Level 7, Data Storage Institute, 5 Engineering Drive 1, Singapore 117608 ■ Date : 3rd August, 2007 ■ Registration @ 10:00am



Speakers                      Abstract                                                       Biography
■ Dr. John S. Hammond         Infrared Imaging of Contaminants                               Dr. Teo Wei Boon
  ULVAC-PHI, Inc                                                                             Molecular Spectroscopy Product Specialist,
                              Infrared microscopy is a useful tool to analyze micro-         PerkinElmer Singapore Pte Ltd
■ Dr. Yong Ching Tung         contaminants. We present a technique, infrared imaging,
                              capable of analyzing, not only small contaminants but also     Teo Wei Boon graduated with a PhD from Tohoku University ,
  PerkinElmer Singapore
                              contaminants on non-metallic surfaces which are difficult to   Japan, in Instrumental Analysis in 1989. He joined
  Pte Ltd                     do by conventional infrared micro-spectroscopy. It delivers    PerkinElmer in the same year as an Infrared Product
                              higher spatial resolution and sharper images too without       Specialist covering the Asia Pacific region. He has been
■ Dr. Noriaki Sanada          undesirable interferences in the contamination spectra. This   supporting the PerkinElmer Infrared Products by providing
  ULVAC-PHI, Inc              technique and examples are discussed in this talk.             technical seminars, customer training, technical support to
                                                                                             customers. He is currently responsible for the Molecular
                                                                                             Spectroscopy Product Line involved in the the Infrared, UV-
■ Mr. Alfred Chou                                                                            VIS and Raman techniques covering the Asia Pacific region.
  PerkinElmer Taiwan
  Corporation

■ Dr. Chris Boothroyd
  IMRE

■ Dr. Teo Wei Boon
  PerkinElmer Singapore
  Pte Ltd




■ Please confirm your attendance by 27 July, 2007. To register, please visit www.dsi.a-star.edu.sg.

				
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