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WORKSHOP “Application of Modern Analytical Techniques 2007”
■ Venue : Multi Purpose Hall, Level 7, Data Storage Institute, 5 Engineering Drive 1, Singapore 117608 ■ Date : 3rd August, 2007 ■ Registration @ 10:00am

Speakers WORKSHOP PROGRAM
■ Dr. John S. Hammond
1000 – 1020 1345 – 1440
ULVAC-PHI, Inc Registration Thermal Desorption with GC/MS for Trace Organic
Contaminants Detection
■ Dr. Yong Ching Tung 1020 – 1030 Mr. Alfred Chou
PerkinElmer Singapore Welcome speech Greater China Chrom Product Leader,
Pte Ltd PerkinElmer Taiwan Corporation
1030 – 1115
Auger Spectroscopy: New Opportunities for 1440 – 1515
■ Dr. Noriaki Sanada Nanotechnology Compositional Analysis Tea break
ULVAC-PHI, Inc Dr. John S. Hammond
Fellow, ULVAC-PHI, Inc. 1515 – 1615
■ Mr. Alfred Chou Transmission electron microscopy
1115 – 1150 Dr. Chris Boothroyd
PerkinElmer Taiwan Measurement of Trace Metallic Contaminants in Associate Principal Scientist,
Corporation Electronic-grade Gases by ICP-MS IMRE
Dr. Yong Ching Tung
■ Dr. Chris Boothroyd Director (Inorganic Product), 1615 – 1700
IMRE PerkinElmer Singapore Pte Ltd Infrared Imaging of Contaminants
Dr. Teo Wei Boon
1150 – 1300 Molecular Spectroscopy Product Specialist,
■ Dr. Teo Wei Boon Lunch PerkinElmer Singapore Pte Ltd
PerkinElmer Singapore
Pte Ltd 1300 – 1345 1700 – 1715
Expanded applications of XPS and TOF-SIMS Closing speech
using C60 ion beam sputtering
Dr. Noriaki Sanada,
Staff Manager (Analytical Laboratory),
ULVAC-PHI, Inc.

■ Please confirm your attendance by 27 July, 2007. To register, please visit www.dsi.a-star.edu.sg.
WORKSHOP “Application of Modern Analytical Techniques 2007”
■ Venue : Multi Purpose Hall, Level 7, Data Storage Institute, 5 Engineering Drive 1, Singapore 117608 ■ Date : 3rd August, 2007 ■ Registration @ 10:00am

Speakers Abstract Biography
Auger Spectroscopy: New Opportunities for Dr. John S. Hammond
■ Dr. John S. Hammond Nanotechnology Compositional Analysis Fellow, ULVAC-PHI, Inc
ULVAC-PHI, Inc
Recent advances in electron optics have improved the
John received his Ph. D. in Analytical Chemistry in 1976 from
performance of many field emission electron microscopy
■ Dr. Yong Ching Tung Purdue University in West Lafayette, Indiana. U. S. A.
techniques to visualize nanotechnology products. The analyst
In 1976, John joined the Ford Motor Company Scientific
PerkinElmer Singapore is now faced with the challenge to provide elemental and
Research Laboratory to conduct surface analysis research in
Pte Ltd chemical information for these nanophase materials. This is
catalysis, corrosion and polymer-metal adhesion.
becoming increasingly important for process research and
In 1980, John joined the Physical Electronics Division of
development as well as failure analysis in the semiconductor,
■ Dr. Noriaki Sanada Perkin-Elmer Corporation. John has held a number of
magnetic media and optical display industries. Compositional
ULVAC-PHI, Inc management positions in the Analytical Laboratory,
analysis is also important for many new basic research
Marketing, and Sales Departments. John has also been the
programs in nanotechnology.
Product Director for Physical Electronics XPS and TOF-SIMS
■ Mr. Alfred Chou The Scanning Auger Nanoprobe is a powerful compositional instrumentation. These activities have supported the market
PerkinElmer Taiwan analysis technique for these nanophases. The Auger spectra expansion of XPS, Auger, and Time of Fight SIMS by
Corporation are measured from a sampling depth less than 5 nm. When improving product performance and product yield in the
coupled with an incident electron beam as small as 6 nm in electronics, data storage and semiconductor industries.
■ Dr. Chris Boothroyd diameter and a system designed for long term stability, John has published 34 papers and has lectured extensively
quantitative elemental information with spatial resolution worldwide on the applications of surface analysis techniques.
IMRE better than 10 nm can be acquired. For many materials, John is currently a Fellow with ULVAC-PHI, Inc. in Chigasaki,
chemical information can also be obtained with chemometric Japan and Physical Electronics, Inc. in Chanhassen,
■ Dr. Teo Wei Boon analysis of the Auger spectra. By alternating low impact Minnesota, USA.
PerkinElmer Singapore voltage ion beam sputtering and Auger analyses,
Pte Ltd compositional depth profiles for multilayer structures up to 1
micron in depth can be obtained.
The unique system design of the Scanning Auger Nanoprobe
will first be discussed. Examples will then be shown for
silicon and III-V materials where the Scanning Auger
Nanoprobe can uniquely define the composition of nanophase
structures and defects that are important to advanced
semiconductor technology and nanotechnology materials
analysis.

Speakers Abstract Biography
■ Dr. John S. Hammond Measurement of Trace Metallic Contaminants in Dr. Yong Ching Tung
ULVAC-PHI, Inc Electronic-grade Gases by ICP-MS Director (Inorganic Product), PerkinElmer Singapore Pte Ltd

■ Dr. Yong Ching Tung A simple gas sampling device has been designed with the Yong Ching Tung is the AA Product Manager for PerkinElmer
appropriate purge facilities that eliminate any carry-over and Inc. based in Singapore. Prior to joining PerkinElmer in 1990
PerkinElmer Singapore
memory effect in the accurate and precise extraction and as a Product Specialist for Atomic Spectroscopy, he was the
Pte Ltd measurement of the trace and ultra-trace metallic Assistant Manager in the Chemical Technology Department
contaminants in high purity gases that are used in the of the Material Characterization Division of the then
■ Dr. Noriaki Sanada electronics and semiconductor industries. Singapore Institute of Standards and Industrial
ULVAC-PHI, Inc Research(SISIR), now the TUV-Productivity and Standards
Some typical examples are given on how these contaminants Boards(TUV-PSB), Singapore. In his present position, he is
can be measured using a high performance ICP-MS system. responsible for managing the AA product line and providing
■ Mr. Alfred Chou guidance and support to the Singapore R&D and Operations
PerkinElmer Taiwan teams. He is the key contact for the KOSEA, Indian and
Corporation Greater China field organizations for all aspects of the
inorganic business. Prior to his present capacity, he was the
■ Dr. Chris Boothroyd Director of Inorganic Products, Pacific Rim territory, when he
provided in the region the before-, during- and after-sales
IMRE technical support of all the Inorganic Products including the
Atomic Absorption Spectrometry(AAS), Inductively Coupled
■ Dr. Teo Wei Boon Plasma Optical Emission Spectrometry(ICP-OES) and
PerkinElmer Singapore Inductively Coupled Plasma Mass Spectrometry(ICP-MS) and
Pte Ltd its complementary sample preparation products.

Speakers Abstract Biography
■ Dr. John S. Hammond Expanded applications of XPS and TOF-SIMS using C60 Dr. Noriaki Sanada
ULVAC-PHI, Inc ion beam sputtering Staff Manager (Analytical Laboratory), ULVAC-PHI, Inc.

■ Dr. Yong Ching Tung Chemical analysis of buried interface is of great interest by Dr. Sanada received his doctoral degree in Science in 1998
material scientists. On the contrary, sputter etching generally from Tohoku University in Japan.
PerkinElmer Singapore
causes severe degradation in organic materials. Actually, it is In 1987, Dr. Sanada joined the Analysis Science Laboratory in
Pte Ltd well known to be difficult for scientists to analyze chemistry of Mitsubishi Chemical Incorporated, Central Research Facility,
sub-surface region of organic materials for surface analysis where he used a broad range of analytical techniques,
■ Dr. Noriaki Sanada techniques such as XPS and TOF-SIMS. including the major surface analysis techniques, for materials
ULVAC-PHI, Inc characterization.
Recently, buckminsterfullerene (C60) ion beam sputtering is
revealed to be capable of depth profiling with extremely low Dr. Sanada joined Shizuoka University from 1991 to 2001,
■ Mr. Alfred Chou damage in organic materials. We have examined the optimal where he studied the surface chemistry of compound
PerkinElmer Taiwan sputtering conditions to reduce the degradation. As a result, a semiconductors and oxide superconductors.
Corporation high energy (>10kV) C60 ion beam and oblique injection In 2001, Dr. Sanada transferred to ULVAC-PHI Inc as a
reduces the damage and carbon residue which would laboratory scientist. Dr. Sanada is currently the Staff Manager
■ Dr. Chris Boothroyd interfere chemical depth profiling. of the Analytical Laboratory for ULVAC-PHI, INC. in
Chigasaki, Japan.
IMRE In this talk, expanded applications of XPS and TOF-SIMS
analysis of organics and polymers after C60 ion beam
■ Dr. Teo Wei Boon sputtering will be demonstrated. For many polymers, the high
PerkinElmer Singapore energy resolution XPS spectra following C60 ion beam
Pte Ltd exposure showed a constant elemental and functional group
stoichiometry. The higher sensitivity of TOF-SIMS analysis of
those materials allows an examination of more subtle
changes induced by the C60 ion beam not observed in the
XPS analysis.

Speakers Abstract Biography
■ Dr. John S. Hammond Thermal Desorption with GC/MS for Trace Organic Mr. Alfred Chou
ULVAC-PHI, Inc Contaminants Detection Product Leader, Greater China Chrom Product Leader,
PerkinElmer Taiwan Corporation
■ Dr. Yong Ching Tung Thermal desorption is a useful technique to
collect/concentrate trace organic contaminants. Together with Alfred Chou, currently based in Taiwan, has been with
PerkinElmer Singapore
Gas chromatography/Mass spectrometry, they can be PerkinElmer for 12 years and is now responsible for our GC,
Pte Ltd positively identified and quantified. We present a trend in HPLC and Chrom Data System products for the China,
using such technique in various occasions to check organic HongKong and Taiwan(so called Greater China region) As
■ Dr. Noriaki Sanada contaminants from either material out-gassing or surface Greater China Chrom product Leader. He provide the
ULVAC-PHI, Inc contamination. Various new developments also help to widen before-, during- and after-sales technical support of all the
their applicability, preserve data integrity and make it more Chromatographic Products including the Gas
easy to use. This technique and examples are discussed in Chromatography(GC), Gas Chromatography/Mass
■ Mr. Alfred Chou this talk. Spectrometry(GC-MS), and Liquid Chromatography and
PerkinElmer Taiwan their complementary sample preparation products such as
Corporation Headspace sampler and thermal desorption.
Prior to his current position, he took the responsibility for all
■ Dr. Chris Boothroyd the performance of PerkinElmer’s Gas Chromatography and
Liquid Chromatography products for the Pacific Rim territory
IMRE for 4 years. Prior to that, he was a sales specialist for
Chromatography products for 5 years. Before that, he was a
■ Dr. Teo Wei Boon technical specialist for all chrom products. Before join
PerkinElmer Singapore PerkinElmer, he worked for Saintech Inc., which was the
Pte Ltd sole distributor for Hewlett Packard analytical instruments in
Taiwan for 6 years. He was initially responsible training and
technical support for all analytical products and then transfer
to sales for 2 yrars, giving him over 18 years of experience
in the analytical instrument market.
He earned his Bachelor of Science in
Pharmacy from Kaohsiung Medical College
In 1985 and an MSc (with honours) from
National Defence Medical Center major in
Pharmacology in Taipei, Taiwan in 1987.

Speakers Abstract Biography
■ Dr. John S. Hammond Transmission electron microscopy Dr. Chris Boothroyd
ULVAC-PHI, Inc Associate Principal Scientist, IMRE
Transmission electron microscopy is an important technique
■ Dr. Yong Ching Tung for characterizing materials on the nanometer scale. It has Dr Chris Boothroyd is a Principal Scientist in IMRE with over
been used to study a large variety of materials problems, 20 years experience in electron microscopy. He began his
PerkinElmer Singapore
ranging from semiconductor interfaces and nano particles to career at the Department of Materials Science and
Pte Ltd crystal structure determination. Over the years the best Metallurgy, University of Cambridge and moved to Singapore
resolution for conventional microscopes has improved down in 2002. His recent research interests lie in improving and
■ Dr. Noriaki Sanada to about 0.17 nm and is heading towards 0.1nm, which is at developing new high-resolution TEM techniques.
ULVAC-PHI, Inc point where many important crystal structures can be imaged
directly.
■ Mr. Alfred Chou In this talk I will give an introduction to transmission electron
PerkinElmer Taiwan microscopy and describe some of the applications of electron
Corporation microscopy that I have been particularly involved with.
Examples that will be discussed are novel forms of
■ Dr. Chris Boothroyd nanotubes, imaging single tungsten atoms and quantitative
microscopy.
IMRE

■ Dr. Teo Wei Boon
PerkinElmer Singapore
Pte Ltd

Speakers Abstract Biography
■ Dr. John S. Hammond Infrared Imaging of Contaminants Dr. Teo Wei Boon
ULVAC-PHI, Inc Molecular Spectroscopy Product Specialist,
Infrared microscopy is a useful tool to analyze micro- PerkinElmer Singapore Pte Ltd
■ Dr. Yong Ching Tung contaminants. We present a technique, infrared imaging,
capable of analyzing, not only small contaminants but also Teo Wei Boon graduated with a PhD from Tohoku University ,
PerkinElmer Singapore
contaminants on non-metallic surfaces which are difficult to Japan, in Instrumental Analysis in 1989. He joined
Pte Ltd do by conventional infrared micro-spectroscopy. It delivers PerkinElmer in the same year as an Infrared Product
higher spatial resolution and sharper images too without Specialist covering the Asia Pacific region. He has been
■ Dr. Noriaki Sanada undesirable interferences in the contamination spectra. This supporting the PerkinElmer Infrared Products by providing
ULVAC-PHI, Inc technique and examples are discussed in this talk. technical seminars, customer training, technical support to
customers. He is currently responsible for the Molecular
Spectroscopy Product Line involved in the the Infrared, UV-
■ Mr. Alfred Chou VIS and Raman techniques covering the Asia Pacific region.
PerkinElmer Taiwan
Corporation

■ Dr. Chris Boothroyd
IMRE

■ Dr. Teo Wei Boon
PerkinElmer Singapore
Pte Ltd

■ Please confirm your attendance by 27 July, 2007. To register, please visit www.dsi.a-star.edu.sg.

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