Deviatoric and dilatation strain measurements with x-ray micro-diffraction W.Yanga, W.Liub, B.C. Larsonc , G.E. Icec, H.P. Liermanna, G. Shena a HPCAT, Carnegie Institution of Washington, Argonne national Laboratory, Argonne, IL 60439 b XOR/UNI, Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 c Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 Recently developed sub-micron focused x-ray beams along with high precision x-ray optics provide an excellent experimental tool to study the strain and lattice constant for single crystal and polycrystals. We demonstrate this technique by showing the samples under constrain, after deformation, and in Diamond anvil cells. 1 micron spatial resolution and 1x 10-4 strain resolution have been achieved using sub-micron x-ray beams with white beam Laue and scanning monochromatic beam diffraction techniques. Dedicated synchrotron radiation beamlines and robust data acquisition/analysis package have been developed at APS sector 16 and 34 for collaboration and general users. Future developments will be addressed for high pressure community.
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