Field-Emission Scanning Electron Microscope JEOL JSM-6700F by uig68777

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									 Field-Emission Scanning Electron Microscope
 JEOL JSM-6700F
 • Secondary electron detector                             Resolving power:
 • Semi-in-lens detector for small working distances       1.0 nm @ 15kV
 • Backscattered electron detector (BSE)                   2.2 nm @ 1kV
 • Energy-dispersive X-ray spectrometer (EDXS),            Acceleration voltage:
   Oxford Instruments INCA 300 (detection from Be on)      0.5 - 30 kV




                                    Fracture surface of a perovskite tube




Crossed hollow tubes made from TiO2                     Catalyst support made from TiO2 (anatase)

 Contact: Dr. Armin Feldhoff
          Institut für Physikalische Chemie und Elektrochemie            Tel: +49-511-762-2940
          Leibniz Universität Hannover                                   Fax: +49-511-762-19121
          Callinstraße 3-3 A                                             armin.feldhoff@pci.uni-hannover.de
          D-30167 Hannover, Germany                                      http://www.caro.pci.uni-hannover.de/

								
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