Abstract submitted to the ICDD Spring Annual Meeting 2004
ICDD Headquarters, Newtown Square, PA, 23-25 March 2004
Two-dimensional X-ray Diffractometer:
Convention, Components and Configuration
Bob B. He, Ph.D.
GADDS Development and Mechanical Engineering Manager
Bruker AXS Inc.
Engineering & Development
5465 East Cheryl Parkway
Madison, WI 53711-5373, USA
Fueled by recent technological advances in detectors, X-ray sources and optics, and software, applications
of two-dimensional X-ray diffraction have increased dramatically in the past few years. In order to utilize
the abundant amount of information in two-dimensional diffraction patterns, new theories and approaches
are necessary to configure the two-dimensional diffractometer and to analyze the data. It is also beneficial
to keep the new approaches consistent with the conventional X-ray diffractometers using point or one-
dimensional detectors. This presentation covers some instrumentation basics and recent development of the
two-dimensional diffractometer, including geometry convention, critical components, and configurations
associated with various applications.