ODSTM-1 in-situ dynamic dyne measurement surface tension

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					Werner Grosse - IPM (International Perforation Management) Copyright

ODSTM-1 in-situ dynamic measurement of surface tension, surface energy

dyne level or wettability at fast moving plastic substrates, films, foils

prior German patent application DE19543289

modifications - tests with monolithic spectrometer process, 21.12.2010

Test condition - LDPE film - one side corona treated - A - 38 mN/m - B - 48 mN/m - C - 52 mN/m

graphics scales - X = wave length in nm - y = relative optical transmission

Graphic 1 – LDPE film 38 mN/m – one side corona treated
Graphic 2 – LDPE film 38 mN/m – one side corona treated




Graphic 3 – LDPE film 48 mN/m – one side corona treated
Graphic 4 – LDPE film 48 mN/m – one side corona treated
Graphic 5 – LDPE film 52 mN/m – one side corona treated

Graphic 6 – LDPE film 52 mN/m – one side corona treated




surface tension wettability dyne
Opto Dynamic Surface Tension Wettability Dyne in-situ Measurement
ODSTM-1 at fast moving plastic or packaging film, foil or other substrate as like BOPP, LDPE, LLDPE,
HDPE, MDPE, PET, PP, PE, PS, PO, EVA, PTFE, etc.

Patent application : DE19543289
Patent classification : G 01 L 1/24

Introduction

Non-contact, real-time and optical online operation surface-tension or surface-energy dynes control systems
for running webs as like plastic films in general, coatings, laminates etc. does not exist worldwide. Due to the
broad application field of surface-treated or surface-non-treated webs of plastic film, foil, tear tape, non-
woven, fabrics, laminates or coated paper, there is unimaginable market potential here in respect of the inline
process measuring of the surface tension dynes or wettablity and an inline control of the dynes treatment
level and moderate quality control.

A large number of companies are interest in project cooperation, system development, prototyping,
manufacturing, testing, and worldwide sales, system purchasing and licensing in order of the working
principle of the ODSTM-1 Process Measuring System and former Patent application DE19543289.

Literature, publications, copyrights to ODSTM-1 subject, contents, physical working method

       Schichtbetrieb - Anforderungen an Schichtdickenmessung in der Mikro- und Nanotechnik : MessTec
        & Automation 3/2003, Prof. Peter Pokrovski
       Optische Schichten mit ultrahydrophoben und streuarmen Eigenschaften : Photonik 4/2002, K.Reihs
        Surface Nanotechnologies GmbH, A.Duparre, Fraunhofer IOF
       Anforderungen an Spektralmessgeraete für DWDM Systeme : Photonik 4/2002, Laurant Begin, Jim
        Nerschook, NetTest, Utica, NY, USA
       Nanoporöse Polymerfilme als kostengünstige und zugleich hochwertige Antireflexbeschichtungen :
        Photonik 4/2002, Dr. Stefan Walheim, FZ-Karlsruhe, Institut für Nanotechnologie
       JURCA Optoelektronik GmbH : Hochgenaue schnelle Schichtdickenbestimmung mit Weißlicht
        Interferometrie, (Highly-accurate and quick layer-thickness measuring with white light interferometry)
        Sensor Magazine 1/2000
       JURCA Optoelektronik GmbH - Dr. Gerd Jakob : Koaxiale interferometrische Schichtdickenmessung,
        Photonik 9/2000
       Datron-Meßtechnik GmbH : Mikrowellensensor für Weg- und Geschwindigkeitsmessung, (Micro-
        wave sensor for distance and speed measuring) Meßtech 2/2000
       Franz Patat Zentrum : Oberflächenbehandlung - Neues höchstens im Labor, (Surface treatment –
        the latest, only in the laboratory) PKV-Magazine 3/2000
       Institut für Kunststoffverarbeitung (Institute for Plastic Processing) Aachen IKV : Folienextrusion -
        Ergänzendes Nebeneinander von Gieß- und Flachfolienverfahren, page 39, (Film extrusion –
        complementary use of casting and flat film techniques) PKV-Magazine 12/1999
       In-Line Nahinfrarot-Spektroskopie bei der Kunststoffextrusion : publication at GIT-Labor-
        Fachzeitschrift 12/2000, Dipl.Phys. Thomas Rohe, Dipl.Ing. Sabine Kölle - FHG für Chemische
        Technologie ( ICT )
       Smart Priming : publication at coating 12/2000 by Dr. Michael Bauer, Dr. Martin Kunz
       Semiconductor Metrology: Will Photonics Measure Up ?Scatterometry, ellipsometry and optoacoustic
        techniques represent photonics in metrology toolbox of next-generation integrated circuits :
        publication at Photonics Spectra December 2000 by Alain C.Diebold - International Sematech senior
        fellow
       Enercon : Reprint from Flexo May 1988 : Statistical Quality Control ( SQC ) Applied to Corona
        Treating, by David Markgraf Enercon : Corona Treatment an overview, by David Markgraf, Enercon
        Industries
       Light Scattering Measures Subangstrom Roughness - by Laurel M. Sheppard, Photonics Spectra
        9/1999
       Basis Weight, Sensor for Sheet and Film Products : by Honeywell-Measurex, Coating Magazine
        11/1998
       A comparison of 3D static light-scattering experiments with Monte Carlo simulations : Institute for
        Anorganic und Physical Chemistry of the Bremen University, IOP-Publishing Ltd. 32/1999
       Was kann Oberflächenanalyse ? Dr.J.Goschnick, coating 3/2000
       Corona Technologie : Patentinformationen, Anwendungen, Mechanismen : Dr. Ralf Quack, coating
        3/2000
       WO99/23479 : Reflectometer
       WO98/06999 : Method and Device for measuring the thickness of an insulating coating
       US5590560 : Apparatus for measuring viscosity or thickness, surface tension and surface dilational
        elasticity
       EP0225590 : Verfahren und Vorrichtung zur Bestimmung von Dicken- und/oder Orientierungs
        Änderungen innerhalb einer optisch aktiven Materialbahn (Method and device for the measurement
        of thickness changes and/or orientation changes within an optically active material web)
       Coating magazine 2-2004, Coronabehandlung von Polymerfolien, Nachweismethoden,
        Einflussfaktoren und On line-Kontrolle, Dr.-Ing. Andreas Kiesow, Dr. Jürgen Meinhardt, Prof. Dr.
        Andreas Heilmann

Publications, patent applications relating to state-of-the-art STATIC surface tension measurement

Significant here are the recent relatively new applications which, without exception, concern the static
detection and determination of the surface tension value with sequentially applied liquid drops and imaging
system. It includes: DE4102990, DE3808860, EP0237221 and DE3410778. Further information mention in
application document.

Actual status ODSTM-1 development

Further information concerning publications, patents and engineering reports are specified in the below
applications. Spectral measurements as well the feasibility study with well known optical institutes are
positive finished. Furthermore some significant modifications and breakthroughs of the base ODSTM-1
measuring process in using state-of-the-art monolithic spectrometers and PC support. Specific information of
current project status on request.

Regarding ODSTM-1 development and project status together with a well known optical institute specific
measurements with monolithic spectrometers wave ranges from 1,200 up to 1,600 nm are successful done
all measurements are based on the detection principle which are described in the former patent application
DE19543289 used non treated LDPE films in 15 and 30 microns thicknesses by 28 mN/m base level
comparison measurements of LDPE films with one side corona treated of 38, 48, 52, 60 mN/m test results
are positive with good prospects for further developments.

Extracts of publications, patent applications relating to state-of-the-art of STATIC surface tension
measurement have been compiled.

Significant recent relatively new applications which, without exception, concern the static detection and
determination of the surface tension value with sequentially applied liquid drops and imaging system. This
includes DE4102990, DE3808860, EP0237221 and DE3410778. Further information are mentioned in the
application document.

datas of Opto Dynamic Surface-Tension Measuring system ODSTM-1
     web widths: up to 6,000 mm
     web speeds: up to 600 m/min
     substrates : PE, PP, HDPE, LDPE, LLDPE, PET, EVA, BOPP, etc.
     surface-tension measuring range: 30 - 55 mNm
     resolution, respectively, reproduction: +/- 0.5 mNm
     single-sided or double-sided measurement of the treated or untreated sides of the film
     IR wavelength range: 1,200 - 1,800nm
     mode: dual scattered light, multiple sensor system, variable wavelengths in transmission
     measuring method: similar to ellipsometry
     measuring gap: approx. 5 - 20mm
     stationary and/or web-traversing measuring head
     optical fiber waveguide to measuring head system
     spatially remote, highly-stable IR light source with beam processing
     wavelength variation via a monolithic optical converter
     industrial PC, multiple processor system, data recording, analysis, product documentation, statistics
     actual value output : optical fiber, serial RS 232, RS485, RS 422, PROFIBUS, CANBUS, Ethernet
Summary
Described is a method and device for optical dynamic inline surface tension measurement in which a
substrate web running vertically through a measuring gap is subjected to a chromatic light transmission from
two optical channels displaced by 90° to each other.

This light transmission is detectable by two optical detection systems located on the other side of the web.
Material-specific wavelength selection, light transmission angle changes, polarization slot diaphragms and
transverse displacements of the light beam feeder along the optical X-axis result in extreme scattering and
diffraction of the IR light photons in the boundary layer area on both sides of the sub nano layer within the
substrate web. Their transmitted light intensity enables, after detection and evaluation, the determination of a
direct relationship to the absolute surface tension.

And this entirely independent of the material specific influences like: material and surface consistency,
crystallinity, thickness, density, structure, polar grouping, temperature and type of pre-treatment.

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Science/test results at our website
http://www.microperforation.com/odstm-1-optical-dyne-control.html

http://www.microperforation.com/engineerreport.html
http://www.microperforation.com/mll-1-laser-perforation.html
http://www.microperforation.com/lpm-1.html
http://www.microperforation.com/opss-1-optical-online-porosity.html
http://www.microperforation.com/igbt-esp-unit.html
http://www.microperforation.com/online-perforation-cigarette.html


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IPM International Perforation Management
hi-tech engineering, Asia, Germany, Thailand
Mr. Werner Grosse
Tel./fax : 0049-3212-5097465
http://www.microperforation.com
http://www.deguodaguan.com/ipm/

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DOCUMENT INFO
Description: In-suit dynes surface tension wettability control. Described is a method and device for optical inline tough less surface tension control ODSTM-1 in DE19543289 by which the fast moving substrate through the measuring gap. It’s transmitted with a chromatic beam and spectral selected light source were two optical channels are displaced and polarized by 90 degree to each other. Both optical axles are precise and motor driven shift able in certain angles from 25 up to 65 degree. The spectral light photons, photonics, photovoltaic, illumination, transmission, extinction, absorption grades are detectable by two optical CCD imagine vision devices which are integrate in the sensor case on the other side of the substrate. Material condition, moving substrates means plastic foil, flexible, hi-tech, film, laminate, coating, bonding, label, co-extrusion, BOPP, LDPE, LLDPE, HDPE, MDPE, MAS, MOH, MEV, PET, FEP, PP, PE, PS, PO, EVA, PTFE, PVC, PTFE, Vinyl.