Use Surface Analysis Techniques in your Laboratory by ORS
ORS offers a wide range of analytical techniques for material evaluation, process monitoring and failure
analysis. Our laboratory staff has in-depth expertise in electronic components and modules, PCBs,
metals, gases, organics and inorganic. Our scientific staff will recommend the analytical technique that
will best meet your requirements.
Surface Analysis Techniques:
Micro Fourier Transform Infrared Spectroscopy: (FTIR) This technique is useful for identifying functional
groups of small spot size organic contaminants found on surfaces.
Scanning Auger Microanalysis:
Provides elemental information from the top atomic layers of conductor and semiconductor surfaces. In
combination with Argon milling, an elemental profile of the surface can be plotted, determining
variations in elemental compositions with depth.
Material Characterizations and Identification Techniques
° Scanning Electron Microscopy (SEM)
° Backscattered Electron Imaging (BSEI)
° Energy Dispersive X-ray Microanalysis
° Fourier Transform Infrared Spectroscopy (FTIR)
° X-ray Diffraction
° Ion Chromatography
° Organic Mass Spectrometry (GC/MS)
Importance of Surface analysis:
Analyzing how the surface of a product will behave is very essential as areas of various elements are
totally interwoven into many aspects of our everyday life. Based on the behavior of the top region,
different components can be used for different purposes and products. So you should have details about
content areas. These details can be collected using the technique of surface analysis.
To be able to comprehend the qualities and reactivity of any area it is necessary to comprehend its
physical terrain, material design, nuclear and substance framework, the electronic condition, and the
way in which the surface substances connection with each other. Different methods of area research
have been designed to evaluate and comprehend these different features of surface.
While it is not necessary to comprehend all of these features for individual programs, having a essence
about them always helps improve the quality of products and programs. To be able to get specific
information about the area, it is necessary to somehow intervene with its condition in some way. This
could be in the form of junk mail the top area with electrons, photons or ions.
While the bombardment is not significant, it does have an impact on the physical and substance
qualities of the top region. However, by managing the surroundings in which this bombardment is
performed, it is possible to control the changes that take place in the top spot. This atmosphere is best
designed through the use of contemporary research gadgets known as surface analyzers. Another name
given to these analyzers is profilometers as they help make finish information of the surface of any
Majority of spot analyzers contain a stylus pen that has a signal at its tip. This signal choice up area
problems and features and transforms these into user understandable format. In the simplest of terms,
a spot analyzer is a device that decides quality of a region by assessing and increasing the current
changes that take place when a sensitive stylus pen is moved over it. The current generated from such
movement is fed into an indication that magnifies it up to 50,000 times to create a accurate and detailed
map of the area under analysis.
Oneida Research Services® (ORS) offers specialized laboratory testing services to support the
microelectronics, tele-communications, aerospace, medical, and defense industries. Our services focus
on research, development and quality control of our client's products exclusively for our client. ORS
strives to develop long term relationships with our clients through unwavering professionalism,
flexibility and attention to detail.
8282 Halsey Road
Whitesboro, NY 13492
Phone: (315) 736-5480 ext. 2202 (Deborah Delluomo)
Fax: (315) 736-9321