Electrical characterisation of Carbon Nanotubes
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Electrical characterisation of Carbon Nanotubes
René Geithner, Holger Mühlig, Frank Schmidl, and Paul Seidel
Carbon Nanotubes (CNTs) are one-
dimensional nanoscopic conductors with
unique mechanical and electrical properties
[1].
The electrical measurements are done on
single-walled carbon nanotubes (SWNTs),
which are electrically connected with gold
(fig. 1).
Fig. 3: Semiconducting CNT at room temperature
Source-Drain current as a function of source-drain voltage at
different gate voltages
Conductance depends on gate voltage.
Fig. 1: SEM image of CNTs contacted with gold
A carbon nanotube field effect transistor
(CNT-FET) is realized with a back-gate
(fig. 2). Source-Drain voltage (V SD) and
gate voltage (VG) is applied and the
resulting source-drain current (I SD) is Fig. 4: Metallic CNT at room temperature
measured. Source-Drain current as a function of source-drain voltage at
different gate voltages
Conductance is almost independent from gate voltage.
VSD V+
VA At low temperatures a gap appears for all
AD-card
Voltage source
Vg V- samples, where no source-drain current is
detectable although a source-drain voltage
Current-voltage converter
is applied (figs. 5, 6). Quantum effects
Voltage divider 100:1
might be evidenced on a few samples [2].
Uds Ids These CNTs show Coulomb-blockade
back -gate
characteristics, which means that the
conductance and the gap width oscillate
Fig. 2: Measurement setup used for the electrical
characterisation of CNT with varying gate voltage (figs. 5 – 8).
Two types of measurements are done at
Measurements at room temperature show low temperatures.
conductance of CNTs, which is dependent 1. Source-drain current is measured by
as well as independent from an applied varying source-drain voltage and
gate voltage (figs. 3, 4). These results holding gate voltage constant
correspond to the picture of metallic and (figs. 5, 6).
semiconducting CNTs. In the case of 2. Source-drain current is measured by
semiconducting CNTs, conductance varying gate voltage and holding
variations about some order of magnitudes source-drain voltage constant
are achieved (fig. 3). (figs. 7, 8).
Fig. 5: Semiconducting CNT at temperature below 20mK
Source-Drain current as a function of source-drain voltage at Fig. 8: Metallic CNT at temperature below 20m
different gate voltages Source-Drain current as a function of gate voltage at constant
Conductance and gap width depends on gate voltage. CNT is source-drain voltage VS D = 25mV
blocking above applied gate voltage VG = -5V. Conductance oscillates with varying gate voltage over the whole
rang of applied gate voltage.
For a metallic CNT the results of the two
types of measurements are plotted together
in a colourscale-graph. This shows so
called “Coulomb-diamonds” (fig. 9).
Fig. 6: Metallic CNT at temperature below 20mK
Source-Drain current as a function of source-drain voltage at
different gate voltages
Conductance and gap width depends on gate voltage. CNT is
conductive over the whole range of applied gate voltage.
Fig. 9: Conductance G = dIS D/dUS D as a function of source-
drain voltage and gate voltage for a metallic CNT. G i s
normalized to the maximum conductance of a mesoscopic
conductor G0 = e²/h (Landauer-Büttiker).
Further work will concentrate on quantum
effects and the appearing gap on other
CNTs and the ir temperature depend
behaviour.
Fig. 7: Semiconducting CNT at temperature below 20m
Source-Drain current as a function of gate voltage at constant
source-drain voltage VS D = 100mV
[1] M. P. Anantram et al., Reports on Process in
Conductance oscillates with varying gate voltage. CNT is Physics 69, 507 -561, 2006
blocking above applied gate voltage VG = -3V. [2] B. Babic, Electrical Characterization of
Carbon Nanotubes grown by the Chemical
Vapor Deposition Method, Diss., University of
Basel, 2004
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