ADVANCE PROGRAM & REGISTRATION FORM
The Antenna Measurement Techniques Association (AMTA)
In Cooperation With The
IEEE Joint Baltimore Chapter of the Antennas and Propagation Society/ Microwave Theory and Techniques Society
And The
IEEE Electromagnetic Compatibility Society Northern Virginia/Washington DC and Baltimore Chapters
Proudly Present
Advances in Antenna Test and Measurement Techniques:
A Colloquium and Exhibition
Monday, September 14, 2009 The Four Points by Sheraton BWI Airport Hotel 7032 Elm Road Baltimore, MD 21240
Program Outline - September 14
7:30 am 8:15 am
REGISTRATION CONTINENTAL BREAKFAST AMTA/IEEE Welcome
Mike Violette, Washington Laboratories Cessily Greene, Northrop Grumman
8:30 am
Test Zone Performance Improvement in Anechoic Chambers John Aubin, ORBIT/FR Inc
Abstract: Typical anechoic chambers for Far–Field (FF) antenna and Radar Crosssection (RCS) measurements comprise a rectangular or tapered metallic enclosure with the internal surfaces covered by absorbing material – typically pyramidal, wedge or similar shapes. The test zone performance in these chambers can be improved if shaped walls are utilized in lieu of flat wall surfaces. Appropriate shapes can be designed based on GTD principles. Another method of improving control over the reflected fields, and thus improving chamber performance, is to utilize an absorbing material layout comprising wedge components with predesigned, continuously and smoothly varying orientations. Use of a simultaneous combination of the two techniques can deliver higher quality test zone performance in antenna and RCS measurement chambers.
9:30 am
Measurement Speed Improvements Based on Receiver Architecture and Firmware Implementation O.J. Danzy, Agilent Technologies
Abstract: Data collection speed is always an area of concern in antenna measurement systems due to the amount of time that both near field and far-field pattern measurements can require. The architecture and firmware implementation of the measurement receiver used for antenna pattern measurements can greatly impact the speed of data collection. The use of FIFO buffers, high speed CW data collection and unique measurement receiver design to allow for continuous, highspeed testing, on multiple simultaneously sampled receiver channels. This presentation will discuss the evaluation of techniques allowed by these new hardware and software tools in improving the data collection speed which impacts overall test time.
10:30 am 11:00 am
BREAK in Exhibit Area Open Boundary Quadridge Horn Antenna for the 80 MHz to 1 GHz Range: A Dual Polarized Solution for Testing Antennas in the VHF and UHF Ranges Dr. Vince Rodriguez, ETS-Lindgren
Abstract: Over the past six years there has been an increasing interest in performing antenna measurements at very low frequencies. This presentation shows the concept of the open boundary quadridge horn (OBQH) introduced in 2005 now scaled to lower frequencies. The resulting antenna, although large in size, offers excellent VSWR and gain. The gain is fairly flat for most of the range. The antenna is designed to perform both as a standalone unit or mounted to the wall of a chamber nested in the absorber treatment.
12:00 pm
LUNCH
1:00 pm
Sub-millimeter Wave Planar Near-field Antenna Testing Dr. Daniël Janse van Rensburg, Nearfield Systems, Inc.
Abstract: This presentation provides an overview of planar near-field antenna test systems developed for sub-millimeter wave testing. Special techniques that have been developed to overcome technical restrictions that usually limit performance at very high RF frequencies are presented. Aspects such as thermal structural change, RF cable phase instability, scanner planarity and probe translation during polarization rotation are addressed. These methods have been implemented and validated on systems up to 660 GHz and 950 GHz. These cases have lead to the development of low cost commercial test systems, making antenna testing in the V and W-bands (40 – 110 GHz) cost effective.
2:00 pm
Novel Antenna Pattern Imaging Techniques Using Infrared Technology John Norgard, University of Colorado, Colorado Springs and NASA/JSC, Houston
Abstract: An IR imaging technique has been developed to measure and visualize EM fields (using IR thermograms/holograms). A lowloss (minimally perturbing) IR detector screen. e.g., a thin film of carbon loaded Kapton or a thin sheet of ferrite loaded epoxy, is placed in the 2D region over which the field is to be measured. Thermal heating of the screen (due to Joule Heating/Polarization/Magnetization) causes the temperature at each point of the screen to rise locally above the ambient background temperature by an amount (non-linearly) related to the intensity of the spatial distribution of the incident field. IR Thermograms (equi-temperature contours) are mapped with a sensitive IR imaging camera. IR Holograms are made with a calibrated interference source to recover the phase information. Examples of IR images of EM fields created from these thermal measurements are presented for radiation, scattering, and coupling problems.
3:00 pm 3:30 pm
BREAK in the Exhibit Area Practical Applications for Antennas and Chambers for MIL-STD Testing Lance Pearce, Naval Air Warfare Center, Patuxent River, Maryland
Abstract: This presentation discusses how the updates of MIL-STD-461 that have been incorporated into the new F version affect EMI Laboratories, and what some of the challenges are in the future for EMI testing. Changes in test setups, equipment, test limits, test requirements, and applicability, will require labs to make changes in their test procedures, software, equipment purchases, time to perform testing, and may also require training. Advancing technologies, new emerging threats, and ever changing economic conditions are challenging the traditional test and evaluation methodologies. The test and evaluation community needs to determine realistic test limits to allow robust and affordable system designs and develop new methodologies to adequately evaluate future systems.
4:15 pm 5:00 pm
RECEPTION, DEMONSTRATIONS AND RAFFLE IN THE EXHIBITS AREA
NOTE: Tabletop displays (exhibits) will be open during registration, lunch, all breaks, and the reception. Access to the tabletop displays is available during the technical sessions, but the displays may not be manned during those times. You must be present to win at the raffle. The above program is subject to change without notice.
About the Speakers
John Aubin currently serves as Vice President for Business Development and Chief Technology Officer at ORBIT/FR Inc. in Horsham, PA. Mr. Aubin received the BSEE from Virginia Tech in 1977, MBA from Temple University in 1983, and MSEE from Drexel University in 1988. His interests include antenna and radar cross section measurement technology, wireless systems, radar and microwave systems engineering, and antenna design. Mr. Aubin has served as principal design engineer on a number of automated antenna and radar measurement systems ranging from VHF up to millimeter waves, and has authored over thirty papers on antenna, radar, and measurement technology.
O.J. Danzy is a RF and Microwave Application Engineer at Agilent Technologies--specializing in areas surrounding the use of vector network analysis. Most recently, he has focused on antenna measurements, test automation optimization, multiport applications, fixture removal, and in-fixture calibration methods and techniques. He received a Bachelor of Science in Electrical Engineering from Tennessee State University and a Master of Electrical Engineering from Cornell University.
Dr. Daniël Janse van Rensburg has been working in the microwave test industry for the past 18 years, both as user and supplier of automated antenna test systems. His particular fields of interest are measurement error analysis & computational electromagnetic modeling. He graduated from the University of Pretoria, South Africa and was awarded the B. Eng (cum laude), M. Eng and Ph.D. degrees in 1985, 1987 and 1991 respectively, all in Electrical Engineering. He joined the Canadian Space Agency as research engineer in 1994 and in 1996 he joined COMDEV’s Space Division in Cambridge, ON, Canada. In 1997 he joined Nearfield Systems Inc in Torrance, CA, USA where he is currently employed as Sales & Marketing Manager. He is a Senior Member of the IEEE, Licensed Professional Engineer in Ontario, Canada and a member of the AMTA. He served as president of the AMTA in 2007. He is the author of more than 40 journal and conference papers and regularly contributes to industry courses on near-field test technology. In 2005 Dr. Janse van Rensburg was appointed as adjunct professor in the School of Information Technology and Engineering, University of Ottawa, Ottawa, ON, Canada.
John Norgard is a Professor of Electrical & Computer Engineering at the University of Colorado at Colorado Springs and is the Director of the Electromagnetics Laboratory, which includes a large broadband anechoic chamber. He also holds a joint appointment with the US Air Force Academy and is the Chief Engineer for NASA/JSC for Electromagnetic Environmental Effects (E3). He received a BSEE (Coop) degree from Georgia Tech in 1966, and Master of Science and PhD degrees in Applied Physics from Caltech in 1967 and 1969, respectively. After graduating from Caltech, he was a Post-Doctoral Fellow at the University of Oslo, working with the Norwegian Defense Research Establishment and the Auroral Observatory on plasma models of the polar ionosphere that included the effects of the Aurora Borealis, and helped establish an experimental observation program that performed rocket soundings of the Aurora Borealis to measure ion concentrations and temperature profiles of the disturbed polar ionosphere. He then taught at Georgia Tech for 15 years before coming to the University of Colorado. He also worked for the Rome Air Development Center as an AFOSR Fellow on a project that predicted and measured the effects of rocket plumes on the coupling of EM energy into the guidance systems of missiles. At the University of Colorado, he
designed and constructed a large broadband Microwave Anechoic Chamber and developed an EM lab based on the extended measurement capabilities of the chamber. He developed a new infrared imaging technique that can be used to measure and visualize EM fields (using IR thermograms/holograms). This work is supported by the EM Metrology Division at NIST/Boulder. John was elected Fellow of the IEEE for his work on developing this measurement technique. He is now using this IR imaging technique to measure the fields generated by High Power Microwave weapon systems that are being developed and tested by the Air Force Research Laboratory at the Phillips Research Site (Directed Energy Directorate) at Kirtland AFB in Albuquerque, NM. John has served as the Dean of the College of Engineering & Applied Science and as the Chair of the Department of Electrical & Computer Engineering. He is a past chairman of Commission A (Metrology) of the International Union of Radio Scientists (URSI). He is a member of the Board of Directors of the IEEE EMC Society and is the Vice-President for Standards.
Lance Pearce is the Electromagnetic Interference Branch Head for the Naval Air Warfare Center Aircraft Division at Patuxent River, Maryland. As Branch Head, he is responsible for the day to day administration and operations of the EMI Lab and to ensure the EMI Lab maintains NVLAP Accreditation. His focus for the EMI Lab is to help the Fleet get the best products possible by finding innovative and efficient ways to test. He also ensures that the “testers” perspective is represented by having lab personnel actively participate in MIL-STD working groups and industry and government technical committees. Lance received his Bachelor of Science degree in Electrical Engineering from Virginia Polytechnic Institute & State University in 1985. In July of that year he joined the Naval Air Test Center as a Project Engineer in the Electrical Systems Department, performing environmental testing on aircraft electrical systems and components. In 1989, Lance joined the EMI Lab to concentrate on MIL-STD-461 testing of those same electrical components. In 1997, he transferred to the Electromagnetic Transients Branch to perform electromagnetic pulse (EMP) and precipitation-static evaluations on a variety of Navy aircraft. After two years, Lance returned to the EMI Lab as the Lab Manager and became the Team Lead soon after. When the EMI Branch became an independent branch in April 2007, Lance was named Acting Branch Head, formally taking the Branch Head position in August 2008.
Vicente Rodríguez attended The University of Mississippi, in Oxford MS, where he obtained his B.S.E.E. in 1994. During the fall of 1994 he joined the Department of Electrical Engineering at the University of Mississippi as a research assistant. During his tenure at the department he completed his Master of Science and Doctorate in the area of Engineering Science with an emphasis on Electromagnetic Theory in 1996 and 1999, respectively. In August 1999, Dr. Rodríguez joined the department of Electrical Engineering and Computer Science at Texas A&M University-Kingsville (formerly Texas A&I University) as a Visiting Assistant Professor. In June 2000 Dr. Rodríguez left the academic world when he joined EMC Test Systems (now ETS-Lindgren) as an RF and Electromagnetics engineer. During this time he was involved in the RF anechoic design of several chambers, including rectangular and taper antenna pattern measurement chambers some of them operating from 100 MHz to 40 GHz. In September 2004, Dr. Rodríguez took over the position of Senior Principal Antenna Design Engineer, placing him in charge of the development of new antennas for different applications. Among the antennas developed by Dr. Rodriguez are new broadband double and quad-ridged guide horns with a single lobe pattern and high field generator horns for the automotive industry. Dr. Rodríguez’s interests include numerical methods in electromagnetics, especially when applied to antenna, EMC and RF/MW absorber design and analysis. Dr. Rodríguez is the author of more than twenty publications and holds patents for hybrid absorber and for a new dual ridge horn antenna. Dr. Rodríguez is a senior member of the IEEE and several of its technical societies including the AP, MTT and the EMC Societies. He is also a senior member of the Antenna Measurements Techniques Association (AMTA).
Event Overview
The Program This program was designed to bring the latest technology related to RF and antenna measurement techniques to the local community. Experts in the industry will share practical information on various topics in an extended presentation format. This allows a thorough discussion of each topic and provides the opportunity for extended questions and answers. The “hands-on” quality of the presentation enables the registrant to learn useful information that can be used on the job – in the “real world.” The Exhibition & Reception There will be an exhibition by vendors of antenna, test and measurement related products and services in a ballroom neighboring the technical presentation area. These products and services address the needs of the commercial, military, and aerospace industries. During the reception from 4:15 to 5:00 pm in the exhibit area, heavy appetizers and a hosted bar will be available. AMTA and IEEE members are welcome to attend the reception only at NO CHARGE provided a registration form is completed and sent in advance. A badge will be available for the reception only attendees upon arrival at 4:15 pm. Thus, if you can’t join us for the entire day, drop by for the reception and exhibition to network with AMTA and IEEE. You can see demonstrations, meet the speakers, and you might even win a raffle prize!
Colloquium and Exhibition Location
The Four Points by Sheraton BWI Airport Hotel 7032 Elm Road Baltimore, MD 21240 410-859-3300
Hotel Guest Room and Parking Information
A limited number of guest rooms are being held for “AMTA/IEEE” at the rate of $125.00, plus tax, for single or double occupancy, and are available on a first come, first serve basis. Please reserve by the cut-off date of August 20 to ensure guest room availability. Call the hotel directly at 215-365-4500 or 800-368-7764. Self-parking is available at no charge at the hotel.
Organizing Committee
Honorary Committee Chair
Cessily Greene Northrop Grumman cessily.greene@ngc.com
Joint IEEE Baltimore Chapter: Antennas and Propagation/Microwave Theory and Techniques
Nathan A. Bushyager Northrop Grumman nathan.bushyager@ngc.com
IEEE Northern Virginia/Washington DC Chapter: Electromagnetic Compatibility Mike Violette Washington Labs mikev@wll.com IEEE Baltimore Chapter: Electromagnetic Compatibility Bob Berkovits Northrop Grumman rjberkov@ieee.org AMTA Technical Coordinator Ed Urbanik BAE Systems Edward.A.Urbanik@baesystems.com Logistics Kim Hassett Nearfield Systems, Inc. Phone: 410-531-5597 khassett@nearfield.com AMTA Meetings Advisor and Tabletop Exhibits Janet O’Neil ETS-Lindgren Phone: 425-868-2558 janet.oneil@ets-lindgren.com Registration Tom Boughner EMC Technologists Phone: 301-639-5636
tomboughner@emctech.com
REGISTRATION FEES
AMTA/IEEE Members, Received by July 15 AMTA/IEEE Members, Received From July 16 – September 1 AMTA/IEEE Members, After September 1 or at Door* Non Member Additional Charge**: Full-time Students with copy of valid Student I.D., Postmark by September 1: NOTE: Unemployed/retired attendees: Take a 50% discount off the AMTA/IEEE Member fees above. *Please do not mail after September 1. **Includes one year membership in AMTA $100 $150 $195 $50 $40
NOTE: The registration fee includes one copy of the colloquium record, continental breakfast, lunch, refreshment breaks, and the reception. The organizing committee reserves the right to substitute speakers, restrict size, or to cancel the colloquium and exhibition. In the event the organizing committee cancels this event, registration fees only will be fully refunded. Individuals canceling their registration prior to August 14 will receive a full refund. No refunds will be made to individuals who cancel their registration after August 14. Substitutions are allowed. Attendance is limited. Registration will be confirmed on a first come, first served basis.
Registration Information
Please print clearly Name:_______________________________________ Title: _______________________________________ Company: ____________________________________ Street Address: City: _____________ _ State: _____ Zip: ___________ Daytime Phone: ______________________________ E-mail Address: ______________________________ AMTA or IEEE Member: Y___ N___ IEEE #: ______________ Full-time Student: Y___ N___ School: _______________________________________ (Please attach copy of Student ID to obtain Student rate.)
Registration by Mail/Fax/On-Line
Registration Total per Fees Above Check Enclosed in Amount of: $_________________ (Checks payable to: AMTA) Or Credit Card Payment – Please Provide: Name on Card: ______________________________ Credit Card No: ______________________________ Expiration Date: ______________________________ Amount Charged: $ _______________________ Signature: ____________________________________
Mail to: AMTA, c/o EMC Technologists Tom Boughner EMC Technologists 9515 Bellhaven Ct Frederick, MD 21701 301-639-5636 E-mail to: tomboughner@emctech.com Fax to: 301-668-3845 (fax)
REGISTER ON LINE AFTER JULY 1: www.amta.org