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TH EDA









Fine-Grained Sleep Transistor Sizing

Algorithm for Leakage Power Minimization





Student : Da-Cheng Juan

Advisor : Shih-Chieh Chang









NTHU-CS VLSI/CAD LAB

Outline

 Sleep Transistor Sizing Problem





 Maximum Instantaneous Current Estimation





 Time-Frame Partitioning for Sizing





 Experimental Results





 Conclusions

2

Trend of Low Power Designs

 Leakage increases exponentially

– reaches more than 50% of total power in 65nm technology.



 Low power design is a must-have, not an optional.



gate

 Power dissipation

– Active power (active mode)

source drain

– Leakage power (sleep mode)



Sub-threshold leakage









3

Power Gating

Power Gating

– One of the most effective ways to reduce leakage.







Low Vth Logic Devices

VDD SL

Mode Sleep

Transistor

Active 0 ON

Sleep 1 OFF

GND

VGND

SL use high Vth Sleep Transistor

to reduce the leakage current

GND

4

Implementation of Power Gating

 Distributed Sleep Transistor Network (DSTN)



Low Vth Logic Device

VDD



C1 C2 C3



VGND

SL SL SL



5

Leakage Saving

 In sleep mode:

– Leakage: proportional to the ST’s size.

– Small ST to reduce leakage.



VDD







VGND

Ileakage Ileakage Ileakage



6

Voltage Drop across Sleep Transistor



 In active mode:

– Voltage drop across a ST degrades the performance.

– Voltage drop: inversely proportional to the ST’s size.

– Large ST to bind the voltage drop.



VDD







VGND

VST VST VST

7

Sleep Transistor (ST) Sizing

 Dilemma scenario:

– Small ST to reduce leakage. (sleep mode)

– Large ST to bind the voltage drop. (active mode)



 Objective: minimize ST size (leakage) under a specified

voltage-drop constraint, VST*.

VDD







VGND

VST* VST* VST*

8

Voltage Drop Estimation with MIC

 Maximum Instantaneous Current (MIC) through a ST

– determines the worst case IR drop.

 Estimating the upper bound of MIC(ST)

– to size ST properly to meet the voltage-drop constraint.





VDD



C1 C2 C3

MIC(ST): MIC across a ST.



VGND

MIC(ST1) MIC(ST2) MIC(ST3)

9

Voltage Drop Estimation with MIC

 MIC(C) (MIC of a cluster) is easy to measure.

 Due to current balancing effect

– MIC(ST) (MIC through a ST) is hard to predict.





Finding the MIC of

a cluster is fast. VDD



C1 MIC(C1) C2 C3

Finding the MIC across

a ST is time-consuming.



VGND

MIC(ST1) MIC(ST2) MIC(ST3)

10

Temporal Perspective of Cluster’s MIC

 Conventional way

– ST sizes are determined with MIC

of the entire clock period.







one clock cycle

(Current)









Cluster 1

Cluster 2

MIC(C1) occurs at T6.





MIC(C2) occurs at T9.









11

(Time Unit : 10ps)

MIC(Ci) waveform

Temporal Perspective of Cluster’s MIC

 Smaller time frames lead to:

– a more accurate MIC estimation.

– but high computation complexity.

one clock cycle

Cluster 1

Current (mA)









Cluster 2









(Time Unit: 10ps) 12

MIC(Ci) waveform

Difficulties

 Current balancing effect complicates the sizing problem.







MIC



MIC MIC MIC

 Time-frame partitioning leads to high computation complexity.

one clock cycle









13

Contributions

 More accurate MIC prediction from temporal perspective.





 Variable-length partitioning to reduce computation complexity.





 Algorithm to minimize the sizes of sleep transistors.





 Achieving 21% area reduction in total sleep transistor sizes

compared with [2].

- [2] Chiou et al. DAC’06









14

Outline

 Sleep Transistor Sizing Problem





 Maximum Instantaneous Current Estimation





 Time-Frame Partitioning for Sizing





 Experimental Results





 Conclusions

15

Resistance Network





C1 C2 C3



I(C1) I(C2) I(C3)

RV RV

VGND

I(ST

R(ST1) I(ST

R(ST2) I(ST

R(ST3)









16

Discharging Ratio





C1 C2 C3



I(C1)

2Ω 2Ω

VGND

9Ω 8Ω 10Ω



0.43* I(C1) 0.34* I(C1) 0.23* I(C1)

 The discharging ratio can be calculated by

– Kirchhoff’s Current Law

17

– Ohm’s Law

Discharging Matrix Ψ (SAI )





C1 C2 C3



I(C1) I(C2) I(C3)

VGND

I(ST1) I(ST2) I(ST3)





 I ( ST1 )   I (C1 )  ψ11 ψ12 ψ13 

→  I ( ST2 )  Ψ   I (C2 )

   

where Ψ  ψ 21 ψ 22 ψ 23 

 

 I ( ST3 )   I (C3 )  ψ 31 ψ32 ψ33 

 

18

   

MIC(ST) Estimation Mechanism





C1 C2 C3



MIC(C1) MIC(C2) MIC(C3)





MIC(ST1) MIC(ST2) MIC(ST3)





 MIC ( ST1 )   MIC (C1 )  ψ11 ψ12 ψ13 



→ MIC ( ST2 )  Ψ  MIC (C2 )

   

where Ψ  ψ 21 ψ 22 ψ 23 

 

ψ 31 ψ 32 ψ 33 

 

 MIC ( ST3 )   MIC (C3 ) 

19

   

Outline

 Sleep Transistor Sizing Problem





 Maximum Instantaneous Current Estimation





 Time-Frame Partitioning for Sizing





 Experimental Results





 Conclusions

20

Temporal Perspective of Cluster’s MIC





 Different MIC(Ci) occurs at

different time points.



one clock cycle

(Current)









Cluster 1

Cluster 2

MIC(C1) occurs at T6.





MIC(C2) occurs at T9.









21

MIC(Ci) waveform (Time Unit: 10ps)

Temporal Perspective of Cluster’s MIC



 Different MIC(Ci) occurs at different time points

within a clock period.



 Traditional way to estimate MIC(STi) is over

pessimistic.



 MIC ( ST1 )   MIC (C1 ) 

 MIC ( ST )  Ψ   MIC (C )

 2   2 



 MIC ( ST3 ) 

   MIC (C3 ) 

 





over-estimated !

22

Time-Frame Partitioning for MIC(ST) Estimation







 Expand MIC(Ci) into MIC(Ci,Tj).





one clock

MIC(C1,T6) cycle

(Current)









Cluster 1

Cluster 2









MIC(C1,T3) MIC(C2,T6)



MIC(C1,T1)





23

MIC(C2,T1) MIC(C2,T3) MIC(Ci,Tj) waveform (Time Frame)

Time-Frame Partitioning for MIC(ST) Estimation



 For each time frame Tj, use MIC(Ci,Tj) to obtain MIC(STi,Tj).









 MIC ( ST1 , T1 )   MIC (C1 , T1 ) 

 MIC ( ST , T )   Ψ   MIC (C , T ) 

 2 1   2 1 



 MIC ( ST3 , T1 ) 

   MIC (C3 , T1 ) 

  24

Time-Frame Partitioning for MIC(ST) Estimation



 For ST1, the maximum MIC(ST1,Tj)

among all Tj is the upper bound of

MIC(ST1) after partitioning.









one clock cycle

(Current)









Cluster 1

ST 1

Cluster 2

ST 2





MIC(ST2)





MIC(ST1)







25

MIC(STi,Tj) waveform (Time Frame)

Notation Review

 MIC(Ci)

– Maximum Instantaneous Current of ith Cluster

 MIC(STi)

– Estimated MIC upper bound flowing through ith sleep transistor

 MIC(Ci,Tj)

– MIC of Ci in jth time frame

 MIC(STi,Tj) =Ψ * MIC(Ci,Tj)

– Estimated MIC upper bound through STi in jth time frame

 MIC(STi) = Ψ * MIC(Ci)

– With time-frame partitioning

 MIC(STi) = max{ MIC(STi,Tj) for all j }

– Without time-frame partitioning

26

Time-Frame Partitioning for MIC(ST) Estimation



Time-Frame Partitioning leads

to a better MIC(ST) estimation!







ORIGINAL_MIC(ST1) one clock cycle

ORIGINAL_MIC(ST2)

37% larger! 27% larger! Cluster 1

ST 1

Cluster 2

ST 2

(Current)









MIC(ST1)

MIC(ST2)





27

MIC(STi,Tj) waveform (Time Frame)

Reduce the Computation Complexity



 More time frames lead to

– more accurate voltage-drop estimation.

– but higher computation complexity.





 Reduce the computation complexity:

– dominated time-frame removal

– variable length time-frame partitioning









28

Dominated Time Frame Removal



 T3 is dominated by T6.

– MIC(C1,T6) > MIC(C1,T3),

– MIC(C2,T6) > MIC(C2,T3).

 Neglect T3

– MIC(ST1,T6) > MIC(ST1,T3),

– MIC(ST2,T6) > MIC(ST2,T3).

Cluster 1

MIC(C1,T6) Cluster 2









MIC(C2,T6)

MIC(C1,T3)



Cluster MIC

MIC(C2,T3) waveform

29

Variable-Length Time-Frame Partitioning

MIC(C1,Tc)

Ta Tb Tc Td

MIC(C2,Td)

MIC(C1,Tb) MIC(C2,Tc)





MIC(C2,Tb)



MIC(C1,Td)

(1) uniform two-way partition (2)Variable-length two-way partition









 (Tb dominates Tc ) and (Tb dominates Td)

=> the estimated upper bound of Fig(2) will be smaller.

30

Variable-Length Time-Frame Partitioning



 With all MIC(Ci)s are separated

- MIC(STi) can be better estimated!

 Example with the number of time frames = 3

one clock cycle

Cluster 1

Cluster 2

Cluster 3









T1 T2 T3

31

Cluster MIC waveform

Variable-Length Time-Frame Partitioning



 Partition one clock period

– with the minimum time unit exhausively

 Not efficient

 Accurate MIC(STi) estimation



– with limited number of variable-length time frames

 Efficient

 Only lose slight accuracy









32

Problem Formulation of ST Sizing

 Inputs:

1. Voltage-drop constraint.

2. MIC(Ci,Tj): Cluster’s MIC information.





 Objective:

1. Minimize the total width of sleep transistors.

2. Voltage drops must meet the constraint.





 Output:

1. A set of sleep transistor width.



33

ST Sizing Algorithm

1. Initialize ST size with a 2. Update the discharging 3. Update MIC(STi,Tj)

large value. matrix. and voltage drops.

0.38 0.30 0.21 0.18





Ψ=

0.27 0.30 0.21 0.18

Ψ

MIC(STi,Tj)= .MIC(Ci,Tj)

0.21 0.24 0.35 0.28 V(STi,Tj)=MIC(STi,Tj).R(STi)

99Ω 99Ω 99Ω 99Ω 0.14 0.16 0.23 0.36









4. Resize ST with the

worst drop.

MIC ( STi , T j ) No Voltage

WST *  ( )k drops ok?

VST *



Yes



Return 34

99 99 73 99 ST size

Outline

 Sleep Transistor Sizing Problem





 Maximum Instantaneous Current Estimation





 Time-Frame Partitioning for Sizing





 Experimental Results





 Conclusions

35

Environment Setup

 TSMC 130nm CMOS technology.



 Vdd = 1.3 volt.



 Specified tolerable voltage drop: 5% of the ideal supply

voltage (0.065 volt.)





 MIC(Ci) is obtained via 10,000-random-pattern

PrimePowerTM simulations.



 Minimum time unit is set to 10 pico-second.



36

Implementation Flow

RTL netlist Synthesis

Gate-level netlist SDF file



Placement Simulation

DEF file VCD file

Gate Positioning VCD Partitioning



Gate location Partitioned VCD file

MIC Estimation





Variable-length Partitioning (Optional)



: Commercial tools

ST Sizing ST size

: Our tools 37

Experimental Results

Total Area (Width in μm) Runtime (Sec.)

Circuit

[8] [2] TP V-TP TP V-TP

C432 12817 8491 6775 7086 4262 495

C499 10741 8347 6684 7229 3644 568

C880 15050 11296 9233 9676 2561 345

C1355 19352 13056 10591 11496 2514 422

C3540 29808 23020 18650 20282 16856 942

C5315 29794 23773 18785 19534 13830 2190

C7552 41016 29500 24269 25621 17216 2896

dalu 3468 2904 2110 2283 3816 483

frg2 3632 2835 2232 2255 701 136

i8 13247 9931 7836 8141 7720 1080

t481 9405 7389 5024 5402 16289 1514

des 11804 9766 7850 8145 8321 1180

AES 44378 33965 27229 28137 28379 3524

Avg. 1.70 1.26 1 1.06 8.09 1

38

Previous works: [2] Chiou et al. DAC’06, [8] Long et al. DAC’03

Outline

 Sleep Transistor Sizing Problem





 Maximum Instantaneous Current Estimation





 Time-Frame Partitioning for Sizing





 Experimental Results





 Conclusions

39

Conclusions

 Propose an efficient sleep transistor sizing method

for DSTN power-gating designs.



 Present theorems based on temporal perspective to

estimate a tight upper bound of voltage drop.



 Achieve 21% size as well as leakage reduction on

average compared with [2].

- [2] Chiou et al. DAC’06









40

Thanks for your time.







41

Q&A







42

Backup Slides







43

Sleep Transistor (ST) Sizing

 In the active mode

– Sleep Transistors operate in linear region.

– WST is inversely proportional to RST.

 WST = k / RST



 Relations between WST and VST.

VDD

VST: the voltage I(ST): the current

drop across the through the sleep

sleep transistor transistor



VGND

VST I(ST)

I ( ST )

WST  ( )k

GND VST 44

Sleep Transistor (ST) Sizing

 Determine the minimum required size (WST* )

based on:

1. MIC(ST)

2. VST*: IR-drop constraint

MIC(ST): Maximum

InstantaneousVDD

Current

I ( ST ) (MIC) through ST

WST  ( )k

VST

MIC ( ST ) VGND

WST *  ( )k

VST * MIC(ST)



GND

Smaller MIC(ST) leads to a

better ST size! 45

MIC Waveform

Pattern 1

Current







Time

MIC waveform of 3 patterns

Pattern 2

Current







Time

Pattern 3

Current







Time

46

RST Initialization

 Physical limitation

– CMOS process limits the width of a sleep transistor.

– Choose the minimum width as the initial RST.









47



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