Magma C20 Magnetic
Microscope
A Non-Contact, Non-Destructive Next Generation Imaging tool for the
Semiconductor Industry’s complex devices, advanced packages, and full assemblies
Isolate failures in Isolate Interconnect failures such as Clearly see the Current
Stacked Devices C4 Resistive Opens / Shorts Direction & Magnitude Peak Localization
Magma C20 – delivers compelling benefits
A Next Generation Non-Contact, Non-Destructive Imaging Tool
Magma answers the Semiconductor Industry’s SYSTEM FEATURES
call for non-contact, non-destructive fault
isolation tools. Magma’s unique capability for Interactive User Interface
peering into a device, while operating • Intuitive and easy to use
dynamically or statically, gives the analyst the • Automated X, Y, and Z
capability for isolating failures in complex staging for quick setups and
devices, advanced packages, and full assemblies changes
without de-capsulation or de-processing.
• Immediate test results
Advanced Packaging schemes are creating Data Analysis Tools
issues for the analyst that are not easily solvable • Peak localization for
with today's tools or techniques. Determining increased defect resolution
whether the defects are in the die, interconnect or • Current Vectoring gives you
package is a time consuming and often elusive direction of current and
process. Magma is not affected by IC materials, magnitude
which enables the Magma to see through • 3D plotting
packaging and interconnect layers to pinpoint
‘buried’ defects at extremely low currents as well • Image Overlay – overlay
as resolve resistive open failures. These include; Magma, XRAY, CAD or
metal line cracks, PTH cracks, C4 bump failures, other customer supplied
via delaminations, and wire bond failures that are images
a major concern for most semiconductor • Image Subtraction – create
manufactures. image libraries and compare
images for quick isolation
With Magma, you can speed up the analysis • Knights Interface
process by building characterization libraries for • High resolution Optical / IR
your unique defects, IDDQ leakage signatures, and Camera
KGD libraries. Image subtraction allows you to • Resolves defects at extremely
compare images between your library images and low current levels (500nA)
the device under test, significantly shortening the
analysis process, saving you time, and money. • Resistive Open Defects
• Functional Failures
Magma’s innovative Data Analysis software Mobile and Versatile
enables you to get new designs to market faster, • All units on wheels
quickly resolve strategic customer issues, and • No special facilities
reduce time-to-yield giving the Magma a great
return on investment. • Room-temperature scan
Magma C20
Innovative Approach – addressing the
needs of the Semiconductor Industry
Employs a unique approach
Magma senses converts to current uses overlays to
Magma employs a unique magnetic fields,… maps them,… intensity, and… pinpoint defects
approach, mapping current
through its magnetic fields
that travel unaffected through
all materials, allowing the
Magma to see through
packaging, and interconnect
layers to pinpoint ‘buried’
defects.
Lowest non-contact current sensitivity available
Technology processes are
shrinking and putting limits
on tools and techniques used Same failure:
in solving many device Magma
PEM
failures, often blowing open
LC
the defects before they can be
analyzed. Magma’s extremely
low current sensitivity
eliminates this problem.
Magma: 0.48µW PEM: 147,000µW LC: 93,000µW
Back-side Back-side Front-side
Emission tools have been Helps eliminate false positives
the work horse in many labs
but one of their characteristics
is false positives, leading the
analysis astray on a lengthy Magma image site PEM emission site
process of elimination.
Magma can coordinate with
your emission tools to
identify the true emission site
that is causing the failure and
eliminate false positives, Defect found after analysis
shortening the analysis time.
Innovative Solutions – interactive user
interface, easy to use Data Analysis Tools
Interactive user interface: Intuitive
and easy to use, fully automated X, Y,
and Z staging, high resolution optical / IR
camera, and image from front-side or
back-side. Mobile and Versatile.
Data Analysis Tools: A rich feature
set of tools allows you to analyze the
data in many ways:
• Current Vectoring
• Peak Localization
• Image Subtraction
• Knights Interface
• Image Overlay
• Scan Merge
• 3D Plotting
Solving complex problems:
Shorts: Variety of short defects;
power to ground, plane to plane, Short
wire bond, interconnects, etc.
Opens: Complex Opens,
Resistive Opens - Metal line
cracks, PTH cracks, C4 bump
failures, via delaminations, and Magma
PEM
wire bond failures.
Functional failures: Use the Tester toggled Fail
Scan Chain: Site
Magma with your tester, test
PEM
boards, run your functional vectors Magma
or scan chains.
Magma C20
Innovative Company and Value
Semiconductor test professionals need tools that can solve their issues today on platforms
capable of evolving to meet tomorrow’s. Neocera has designed the Magma with this in mind.
The Magma’s unique approach and state-of-the-art data analysis tools give the semiconductor
test community the Next Generation Imaging tool needed for the complex devices, advanced
packages, and full assemblies of today along with the roadmap to meet tomorrow’s; sub-micron
spatial resolution and spot size.
Magma C20 delivers compelling benefits: Magma C20 at a glance:
• Wafer, die, advanced packages, and full Defect localization: +/- 3µm
assemblies Current sensitivity: typical – 7µA, 500nA
• Shorts, complex opens, resistive open with averaging
defects, and functional failures Depth sensitivity: ~10mm
• Resolve defects that other tools cannot Minimum magnetic field: 3.7nT
• User friendly Minimum step size: 2µm
• Preserves devices and wafers Power: 115V, 20A, 60Hz
• Minimize time-to-market Safety: TÜV listed
• Improve yield Environment: Recommend 70º F, <50% RH;
• Great return-on-investment Isolate from rf, EMI, and
Large magnetic sources
• Platform that meets today's needs with
the capability of evolving to meet
tomorrow’s
For More Information Please Contact Us
For more information about Neocera, Magma C20, Magma Roadmap or to see a
demonstration, please contact:
Neocera, Inc. Neocera – North America Sales
10000 Virginia Manor Road (301) 792-9054 main
Beltsville, Maryland 20705 (530) 676-1086 cell
(800) 290-4322 main brown@neocera.com
(301) 210-1042 fax
www.neocera.com
Neocera – Asia Sales Neocera – Europe Sales
Seki Technotron Corp. veonis Technologies GmbH
5-6-30, Kiba, Koto-ku, Junkersstrasse 1,
Tokyo 135-0042 D-82178 Puchheim,
(03) 3820-1712 main Munich, Germany
(03) 3820-1728 fax (0) 89-800 85 0 main
(0) 89-800 52 68 fax
Seki Technotron Asia PTE Ltd.
491 B River Valley Road, #14-02A
Valley Point, Singapore 248373
6225-3800 main
6225-3977 fax
Seki Technotron Taiwan Corp.
6F-1, No. 26, Taiyuen St.
Chupei, Hsinchu
Taiwan, R.O.C.
(03) 552-6080 main
(03) 552-6200 fax
The Magma C20 Team – Committed to Your Success