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Microwave Design and Measurements

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Microwave Design and Measurements
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Microwave Design and Measurements

Project #5 – Transistor Modeling & Characterization

PRE-LAB: (Due Monday, June 30th)

1. Review DC and RF operation of a GaAs MESFET

2. Be prepared to measure DC values for device transconductance, Idss and Vpo.

3. Review on-line data sheet for NEC NE721S01 device:

http://www.cel.com/pdf/datasheets/ne721s01.pdf

4. Create a linear equivalent circuit model for a common-source MESFET on AWR or

ADS. Determine values of each element to fit the published S-parameters given in the

NEC data sheet for a bias condition of Vds=3V, Ids=10mA. Plot your equivalent

model S11 and S22 parameters over the 2-20 GHz frequency band and compare with

the published values. Send your equivalent circuit with final values and the S11 and

S22 comparison plots to Dr. Lehmann by midnight, Monday, June 30th.



LAB PROCEDURE:



1. CAUTION: When handling any static-sensitive device, such as a microwave transistor,

make sure you are properly grounded. ESD wrist straps are provided for each bench and

must be used when handling and assembling the transistor into the test fixture and when

making DC and RF measurements.



2. Measure and record the following device characteristics:

a) Idss

b) Vpo

c) Gm @ Vd=3v, Ids=Idss

d) Gm @ Vd=3v, Ids=50%Idss

e) Gm @ Vd=3v, Ids=10mA

f) Document device number, gatelength, and gatewidth from NEC data sheet



3. Calibrate the VNA for 2-port S-parameter measurements over the frequency range of 100MHz

to 8GHz (501 points). Check your calibration by disconnecting the cables, re-connect and

measure the “thru” S-parameters of the cables.



4. Determine reference plane extensions:

a) For both S11 and S22 measurements the length of the 50Ω transmission line between the

VNA cable and the device-under-test (DUT) must be accurately known.

b) Measure the electrical length of the “50Ω microstrip thru” line provided to you in lab. The

total electrical length represents the length of the 50Ω transmission line in the transistor

fixture plus two SMA connectors. Therefore, half of the “thru” length is on the input side

of the transistor fixture; half is on the output side of the transistor.

c) Record the total “thru” length in degrees and seconds. Record what you will use for the

reference plane extension on the input and the output when measuring the transistor in its

test fixture.

Input Reference Output Reference

Plane Extension Plane Extension









Through holes (vias

to ground; 2 places)

DUT









Microstrip Device Test Fixture





5. Mount your microwave transistor in the test fixture provided. Carefully connect the gate tab to

the RF input port and drain tab to the RF output port using conductive epoxy or solder. The case

of the RF package must make good electrical contact to ground through both ground tabs. Use

solder or conductive epoxy to make the ground connections to the back side of the Duroid.



Biasing of the transistor is accomplished by connecting the appropriate voltages to the input

bias tee connections on the rear panel of the VNA.



IMPORTANT NOTES:

 Check the power supply current limit to ensure it is set at 200mA or less.

 When biasing the FET apply the negative gate voltage FIRST! After setting the gate

voltage to approximately -1 V, then apply the drain voltage. Adjust the gate voltage for

desired drain current. Failure to bias the transistor in the proper sequence may lead to

catastrophic results!

 Use a volt meter to ensure your gate and drain voltages are what you desire at the device

terminals.



6. Using the appropriate reference plane extensions measured in step 4, measure the microwave

transistor 2-port S-parameters at:

a) Vd=3v, Id=50%Idss

b) Vd=3v, Id=10mA



Save all 2-port S-parameters for later use.

 Compare measured S-parameter data to data sheet values (plot S11 and S22 on

same Smith Chart). Comment on differences.

 Determine equivalent circuit model parameters based upon measured data. Note

any major differences between model values with measured data vs. published data.



DUE DATE: Device equivalent circuit schematics and plotted S11 and S22 (simulated &

data sheet values) are due Monday, June 30th, by midnight (late inputs will not be accepted;

you will receive no credit for this portion of the project if email is received late.)


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