Jens-Jensen-IonBeamMaterialAnalysis-2011 by stariya

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									Graduate course Ion Beam Analysis in Material Science, Autumn 2011                     1
Jens Jensen




     Ion Beam Analysis in Material Science (7.5 hp)

COURSE PERIOD: October - December 2011

TARGET GROUP: Graduate students in physics, engineering physics, material
chemistry, and material science.

AIM OF COURSE: Energetic ion beams are frequently used as a tool for material
characterization to investigate the atomic composition and distribution. The aim of
this course is to give students an awareness of different experimental methods and
measurement techniques for material analysis involving the use of energetic ion
beams. The students should obtain a basic understanding of the fundamental physics
behind the interaction between energetic ions and solid material involved in the
analytical techniques. This course prepares for practical use, and gives a theoretical
fundamental knowledge about modern ion beam based analytical techniques used in
material science.
After the course, the participant should:
 understand and explain:
   the basic principles of the interactions between energetic ions and solid
      material;
   the usefulness of ion beams for material analysis;
   the principles of different ion beam analytical techniques, such as advantages,
      limitations, performance, .....;
 be able to:
   apply the obtained knowledge and understanding to relevant situations, e.g.
     select the most suitable method(s) for a given problem;
   communicate this in own words orally and in writing;
   critically reflect on scientific communications presenting data obtained by ion
     beam analytical techniques;
   perform an ion beam analysis (RBS) and evaluation of obtained data.

COURSE CONTENT AND STUDY FORMAT: The course consists of lectures in
addition to practical work and theoretical /computer exercises. The characteristics of
different ion beam analytical techniques and their fundamental properties are covered.
Plenty of examples will be shown to illustrate advantages and drawbacks. The main
focus will be on describing the use of energetic ion beams for material analysis;
however, the modification of materials by ion beams will also be discussed. Ion beam
analysis covers areas such as solid state physics, atomic physics, nuclear physics,
chemistry, and materials science.
The following topics will be covered:
(a) Basic ion-surface interactions;
(b) Applications of ion beams in physics, chemistry, biology, materials science and
    nanoscience;
(c) Experimental methods and instrumentation (accelerators, detectors, electronics);
(d) RBS (Rutherford Backscattering Spectrometry) and Channeling;
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Graduate course Ion Beam Analysis in Material Science, Autumn 2011                    2
Jens Jensen



(e) ERDA (Elastic Recoil Detection Analysis);
(f) NRA (Nuclear Reaction Analysis);
(g) PIXE (Proton-Induced X-ray Emission);
(h) MEIS (Medium Energy Ion Scattering) and LEIS (Low Energy Ion Scattering);
(i) Techniques based on ion beam sputtering, such as elemental depth profiling with
    XPS/AES or SIMS (Secondary Ion Mass Spectrometry).

The course is given in the form of 12 lectures (2x45 min. each), which will give the
basic theoretical background and concepts behind the different ion beam analytical
techniques. However, it is expected that the student spend additional time for self-
studies. To check the understanding, a number of theoretical hand-in problems are
given. There will be a visit to the Tandem Laboratory at Uppsala University were the
student will obtain hand-on experience with RBS by analyzing research samples. A
report has to be written on the practical work. The course will end with a final seminar
where students present individual projects.

LITERATURE: The course literature will mainly consist of handouts, articles, and
notes.

EXAMINATION:
       Hand-in exercises and written report on practical work.
       Written report and oral presentation of individual projects

FURTHER INFORMATION and CONTACT PERSON:
 Jens Jensen, Department of Physics, Chemistry and Biology (IFM), Thin Film
 Physics Division, Linköping University, SE-58183 Linköping.
 E-mail: jejen@ifm.liu.se, Phone: 013- 288926, Room G406



   Interested students should send an application before 2011-10-07




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